On the origin of the lattice constant anomaly in nanocrystalline ceria
Abstract
The lattice parameter of nanocrystalline ceria films prepared by sputtering was monitored as a function of
* Corresponding authors
a
Dept. of Materials Interfaces Weizmann Institute of Science, Rehovot, Israel
E-mail:
Igor.Lubomirsky@weizmann.ac.il.
b Chemical Research Support Unit, Weizmann Institute of Science, Rehovot, Israel
c Max-Planck Institute for Solid State Research, Stuttgart, Germany
The lattice parameter of nanocrystalline ceria films prepared by sputtering was monitored as a function of
A. Kossoy, Y. Feldman, E. Wachtel, K. Gartsman, I. Lubomirsky, J. Fleig and J. Maier, Phys. Chem. Chem. Phys., 2006, 8, 1111 DOI: 10.1039/B513764K
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