AFM and STM characterization of thiol and thiophene functionalized SWNTs: pitfalls in the use of chemical markers to determine the extent of sidewall functionalization in SWNTs†
Abstract
* Corresponding authors
a
Department of Chemistry, Rice University, Houston, Texas 77005, USA
E-mail:
arb@rice.edu
Web: www.rice.edu/barron
Fax: (713) 348-5619
Tel: (713) 348-5610
b Department of Electrical and Computer Engineering, Rice University, Houston, Texas 77005, USA
c Center for Nanoscale Science and Technology, Rice University, Houston, Texas 77005, USA
L. Zhang, J. Zhang, N. Schmandt, J. Cratty, V. N. Khabashesku, K. F. Kelly and A. R. Barron, Chem. Commun., 2005, 5429 DOI: 10.1039/B509257D
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