Issue 4, 2005
From the journal:

Analyst

Surface enhanced resonance Raman scattering detection by fluorimeter

Dale Cunningham,a   Rachael E. Littleford,a   W. Ewen Smith,*a   Duncan Graham,a   Mike Towrieb  and  Pavel Matousekb  

* Corresponding authors

a Department of Pure and Applied Chemistry, University of Strathclyde, Glasgow, UK
E-mail: dale.cunningham@strath.ac.uk
Fax: 0141 552 0876
Tel: 0141 5482021

b Central Laser Facility, CCLRC Rutherford Appleton Laboratory, Chilton, Didcot, Oxfordshire, UK

Abstract

A commercially available fluorimeter with a white light source is used to detect surface enhanced resonance Raman scattering (SERRS). This approach allows facile tunability of the excitation source for SERRS.

Graphical abstract: Surface enhanced resonance Raman scattering detection by fluorimeter

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Article information

DOI
https://doi.org/10.1039/B418989B
Article type
Communication
Submitted
17 Dec 2004
Accepted
15 Feb 2005
First published
22 Feb 2005

Analyst, 2005,130, 472-473

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Surface enhanced resonance Raman scattering detection by fluorimeter

D. Cunningham, R. E. Littleford, W. E. Smith, D. Graham, M. Towrie and P. Matousek, Analyst, 2005, 130, 472 DOI: 10.1039/B418989B

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