Relative calibration mode for compositional depth profiling in GD-OES
Abstract
A calibration procedure for content depth profile analysis by
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* Corresponding authors
a
Swiss Federal Laboratories for Materials Testing and Research (EMPA), Feuerwerkerstrasse 39, CH-3602 Thun, Switzerland
E-mail:
thonelis@aol.com.
b Atout & Progrès, 10 rue de la paix, F-75002 Paris, France
c Department of Physics, University of Newcastle, NSW 2308, Australia
d Jobin-Yvon Emission, 16-18 rue du Canal, F-91165 Longjumeau, France
A calibration procedure for content depth profile analysis by
T. Nelis, M. Aeberhard, R. Payling, J. Michler and P. Chapon, J. Anal. At. Spectrom., 2004, 19, 1354 DOI: 10.1039/B406187J
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