Solution deposition of ultrathin zirconia films on YBa2Cu3O7−δ by molecular layering of tetra-n-propyl zirconate

Laura H. Greene; Patrick J. Hentges; Walter G. Klemperer; Jian-Guo Wen; Glenn Westwood

doi:10.1039/B410762B

Solution deposition of ultrathin zirconia films on YBa₂Cu₃O_7−δ by molecular layering of tetra-n-propyl zirconate†

Laura H. Greene,^a Patrick J. Hentges,^a Walter G. Klemperer,*^b Jian-Guo Wen^c and Glenn Westwood^b

* Corresponding authors

^a Department of Physics and the Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL, USA

^b Department of Chemistry and the Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL, USA

^c Center for Microanalysis of Materials and the Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL, USA

Abstract

Ultrathin (<10 nm) zirconia films were deposited on (001) and (103) YBa₂Cu₃O_7−δ (YBCO) films by alternating exposure of the YBCO film surfaces to methylcyclohexane solutions of ultrapure Zr(OPrⁿ)₄ and n-propanol solutions of H₂O. The electrical properties of silver/zirconia/YBCO sandwiches derived from such bilayers were studied using planar tunneling spectroscopy. These studies showed that ultrathin zirconia films can serve as viable tunnel barriers below the YBCO superconducting phase transition temperature. According to atomic force microscopy and transmission electron microscopy, the zirconia films were remarkably conformal, uniform, and pinhole-free.

This article is part of the themed collection: From Molecules to Materials: Materials Discussion 7

Article information

https://doi.org/10.1039/B410762B

Article type

Paper

Submitted

14 Jul 2004

Accepted

03 Sep 2004

First published

30 Sep 2004

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J. Mater. Chem., 2004,14, 3158-3166

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Solution deposition of ultrathin zirconia films on YBa₂Cu₃O_7−δ by molecular layering of tetra-n-propyl zirconate

L. H. Greene, P. J. Hentges, W. G. Klemperer, J. Wen and G. Westwood, J. Mater. Chem., 2004, 14, 3158 DOI: 10.1039/B410762B

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Journal of Materials Chemistry