Issue 10, 2003

Investigation of wavelength calibration for an echelle cross-dispersion spectrometer

Abstract

The effects of ambient temperature and relative humidity on the positions of spectral lines on a two-dimensional focal plane were investigated. When environmental conditions change, a spectral line can move in both the horizontal (x) and vertical (y) directions. To characterize these changes, a position-shift vector for each spectral line was defined, and its magnitude in the horizontal Δλx and vertical Δλy directions determined as temperature (T) and relative humidity were systematically varied over a range of 24–34 °C and 31–51%, respectively. Spectral lines were examined that spanned a range from 250–570 nm. Overall, Δλx declines with increasing ambient temperature, whereas Δλy becomes larger. A change in relative humidity does not influence Δλx, but raises Δλy in an almost linear fashion. Both Δλx and Δλy were found to change with wavelength non-linearly. Position-shift equations involving Δλx and λ show they are related to the grating constants and the incident angle α of the echelle, and these involving Δλx and T are governed by the wavelength of a spectral line, the grating constant, the focal length of the spectrometer, thermal expansion coefficients of the grating and spectrometer, the ambient temperature and the diffraction angle of the echelle.

Article information

Article type
Paper
Submitted
23 Jan 2003
Accepted
15 Apr 2003
First published
29 Jul 2003

J. Anal. At. Spectrom., 2003,18, 1177-1184

Investigation of wavelength calibration for an echelle cross-dispersion spectrometer

K. Liu and G. M. Hieftje, J. Anal. At. Spectrom., 2003, 18, 1177 DOI: 10.1039/B300981P

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