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Issue 10, 2003
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Investigation of wavelength calibration for an echelle cross-dispersion spectrometer

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Abstract

The effects of ambient temperature and relative humidity on the positions of spectral lines on a two-dimensional focal plane were investigated. When environmental conditions change, a spectral line can move in both the horizontal (x) and vertical (y) directions. To characterize these changes, a position-shift vector for each spectral line was defined, and its magnitude in the horizontal Δλx and vertical Δλy directions determined as temperature (T) and relative humidity were systematically varied over a range of 24–34 °C and 31–51%, respectively. Spectral lines were examined that spanned a range from 250–570 nm. Overall, Δλx declines with increasing ambient temperature, whereas Δλy becomes larger. A change in relative humidity does not influence Δλx, but raises Δλy in an almost linear fashion. Both Δλx and Δλy were found to change with wavelength non-linearly. Position-shift equations involving Δλx and λ show they are related to the grating constants and the incident angle α of the echelle, and these involving Δλx and T are governed by the wavelength of a spectral line, the grating constant, the focal length of the spectrometer, thermal expansion coefficients of the grating and spectrometer, the ambient temperature and the diffraction angle of the echelle.

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Article information


Submitted
23 Jan 2003
Accepted
15 Apr 2003
First published
29 Jul 2003

J. Anal. At. Spectrom., 2003,18, 1177-1184
Article type
Paper

Investigation of wavelength calibration for an echelle cross-dispersion spectrometer

K. Liu and G. M. Hieftje, J. Anal. At. Spectrom., 2003, 18, 1177
DOI: 10.1039/B300981P

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