Issue 6, 2002

Abstract

We have employed several techniques, including cyclic voltammetry, UV–Vis spectrometry, small-angle X-ray diffraction, X-ray photoelectron spectroscopy and electrochemical impedance spectroscopy, to characterize the formation processes and interfacial features of ultrathin multilayer films of silicotungstate and a cationic redox polymer on cysteamine-coated Au electrodes self-assembled monolayers. All of these techniques confirm that the multilayer films are built up stepwise as well as uniformly in a layer-by-layer fashion. In particular, the electrochemical impedance spectroscopy is successfully used to monitor the multilayer deposition processes. It has been proved that the electrochemical impedance spectroscopy is a very useful technique in characterization of multilayer films because it provides valuable information about the interfacial impedance features.

Graphical abstract: Characterization of organic–inorganic multilayer films by cyclic voltammetry, UV–Vis spectrometry, X-ray photoelectron spectroscopy, small-angle X-ray diffraction and electrochemical impedance spectroscopy

Article information

Article type
Paper
Submitted
02 Jan 2002
Accepted
20 Mar 2002
First published
18 Apr 2002

J. Mater. Chem., 2002,12, 1724-1729

Characterization of organic–inorganic multilayer films by cyclic voltammetry, UV–Vis spectrometry, X-ray photoelectron spectroscopy, small-angle X-ray diffraction and electrochemical impedance spectroscopy

Z. Cheng, L. Cheng, Q. Gao, S. Dong and X. Yang, J. Mater. Chem., 2002, 12, 1724 DOI: 10.1039/B200035K

To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.

If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.

If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.

Read more about how to correctly acknowledge RSC content.

Spotlight

Advertisements