Abstract

An investigation was conducted to determine the feasibility of analysing cement by introducing it as a slurry into an inductively coupled plasma optical emission spectrometer (ICP-OES). A complete analysis of cement for major (Ca, Si, Mg, Al, Fe) and minor and trace elements (S, K, Ti, Na, P, Mn and Sr) was accomplished. Calibration was performed either by using reference materials as slurries or by using simple aqueous standards. A combination of hydrochloric acid (1% v/v), glycerol (0.01% m/v) and agitation in an ultrasonic bath (10 min) was employed to ensure well dispersed and stable slurries. Measurements were made on a simultaneous ICP-OES instrument with both axial and radial plasma viewing. Values obtained for selected elements were compared to those measured on an X-ray fluorescence (XRF) instrument. It was found that ICP-OES gave an elegant and effective alternative to XRF for the analysis of cement. Accuracy of the technique, was checked by analysing a certified reference material. This proved that the method could be easily employed on a routine basis for analysis of cement. Cost effectiveness and simplicity of sample preparation contributed to this conclusion.