Issue 2, 2000

CeNixOy and CeAlzNixOy solids studied by electron microscopy, XRD, XPS and depth sputtering techniques

Abstract

Mixed oxides based on nickel, cerium and aluminum, effective in the catalytic hydrogenation of unsaturated compounds, were prepared by a coprecipitation route and studied by XRD, TEM, XPS and ion sputtering techniques. The CeNixOy mixed oxides (0⩽x⩽1) can be described as a mixture of nickel oxide and ceria modified by the insertion of nickel cations in its lattice. Ion sputtering followed by XPS analysis has been very useful for estimating the size of NiO clusters present in the compounds, too small to be detected by XRD and TEM. Among the different CeNixOy catalysts studied, the CeNi0.5Oy solid presents the highest number of interactions between Ce4+ cations and Ni2+ cations, located either in the solid solution of cerium–nickel and/or at the NiO/CeO2 interface. In the CeAlzNixOy series (0<x⩽5 and 0⩽z⩽1), the addition of aluminum leads to a disorganization of the previous structure with favored interactions between Al3+ cations and Ni2+ cations.

Article information

Article type
Paper
Submitted
15 Oct 1999
Accepted
19 Nov 1999
First published
07 Jan 2000

Phys. Chem. Chem. Phys., 2000,2, 303-312

CeNixOy and CeAlzNixOy solids studied by electron microscopy, XRD, XPS and depth sputtering techniques

A. Ponchel, A. D'Huysser, C. Lamonier and L. Jalowiecki-Duhamel, Phys. Chem. Chem. Phys., 2000, 2, 303 DOI: 10.1039/A908283B

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