Issue 10, 1996
From the journal:

Journal of Analytical Atomic Spectrometry

Conference report. 6th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF' 96). June 10–11, 1996, Eindhoven, Holland and June 13–14, 1996, Dortmund, Germany

Peter Beaven  

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Conference report. 6th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF' 96). June 10–11, 1996, Eindhoven, Holland and June 13–14, 1996, Dortmund, Germany

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Article information

DOI
https://doi.org/10.1039/JA996110041N
Article type
Other

J. Anal. At. Spectrom., 1996,11, 41N-42N

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Conference report. 6th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF' 96). June 10–11, 1996, Eindhoven, Holland and June 13–14, 1996, Dortmund, Germany

P. Beaven, J. Anal. At. Spectrom., 1996, 11, 41N DOI: 10.1039/JA996110041N

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