Issue 2, 1995

Secondary ion mass spectrometry and X-ray photoelectron spectroscopy of Na2MoO4/SiO2 catalysts for methane oxidative coupling

Abstract

A series of Na2MoO4/SiO2 catalysts with various loadings of Na2MoO4 have been characterized using secondary ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS), FTIR and X-ray diffraction (XRD). Their catalytic activity for methane oxidative coupling (MOC) has been tested. The results revealed some type of interaction between Na2MoO4 and SiO2, which leads to a high dispersion of NaMoO4 at the support surface. The highly dispersed species covering the catalyst surface favour the formation of surface sites of low coordination. The relationship between catalytic performance and the amount of surface sites of low coordination was discussed.

Article information

Article type
Paper

J. Chem. Soc., Faraday Trans., 1995,91, 381-384

Secondary ion mass spectrometry and X-ray photoelectron spectroscopy of Na2MoO4/SiO2 catalysts for methane oxidative coupling

Y. S. Jin, Q. J. Yan, Z. R. Yin and Y. Chen, J. Chem. Soc., Faraday Trans., 1995, 91, 381 DOI: 10.1039/FT9959100381

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