Issue 7, 1992

High-temperature oxidation technique by in situ characterization of oxide growth

Abstract

A new experimental technique is proposed that should allow the joint study of kinetics and oxide structure during high-temperature oxidation of metal surfaces. X-Ray Absorption Spectroscopy (XAS) measurements were carried out in the fluorescence mode at the cation or anion K-edges. Oxygen is allowed to pass over the sample surface through a solid-state electrochemical pump allowing low and tunable values of oxygen flux. Preliminary data on K-edge measurements are presented after in situ oxidation at ca. 700 °C and 10Pa oxygen partial pressure of nickel and cobalt microfoils (6 µm). Preliminary results provide information on the thickness detection limit at the cation K-edge. These results show the technique to be a powerful tool for studying basic and technological aspects of the hot corrosion of oxide films too thick for common surface Spectroscopy (Auger, ESCA) and too thin for the thermogravimetric technique.

Article information

Article type
Paper

J. Mater. Chem., 1992,2, 745-750

High-temperature oxidation technique by in situ characterization of oxide growth

M. Tomellini, D. Gozzi and I. Davoli, J. Mater. Chem., 1992, 2, 745 DOI: 10.1039/JM9920200745

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