Issue 10, 1992

Surface plasmon resonance characterization of spin-deposited phthalocyanine films

Abstract

The technique of surface plasmon resonance has been used to characterize films of phthalocyanine that have been deposited by spin-coating. Results indicate a near-linear relationship between the spin speed of the substrate and the inverse of the deposited thickness of phthalocyanine.

Article information

Article type
Paper

J. Mater. Chem., 1992,2, 1105-1106

Surface plasmon resonance characterization of spin-deposited phthalocyanine films

P. S. Vukusic, J. R. Sambles and J. D. Wright, J. Mater. Chem., 1992, 2, 1105 DOI: 10.1039/JM9920201105

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