In situ neutron reflectivity studies of polybithiophene

Abstract

In situ neutron reflection experiments have been used to obtain the thickness and density profile of polybithiophene films perpendicular to the surface of a Pd electrode. Undoped films are dense and contain little solvent or electrolyte. The scattering length density of the neutral (undoped) polymer allows estimation of the amount of polymer and hence the charge density per thiophene ring on the oxidised (doped) form of the polymer.