Issue 10, 1990

Muonated radicals formed from phenyl- and silyl-substituted acetylenes

Abstract

Implantation of positive muons into samples of PhC[triple bond, length half m-dash]CPh and PhC[triple bond, length half m-dash]CMe at 298 K led to the formation of the radicals PhĊ[double bond, length half m-dash]C(Mu)Ph and PhĊ[double bond, length half m-dash]C(Mu)Me; in the case of the latter compound, the alternative MeĊ[double bond, length half m-dash]C(Mu)Ph radical was not detected. Additionally, cyclohexadienyl radicals formed by muonium atom addition to the aromatic rings were observed, in lower yield, allowing spin-delocalisation parameters (Δx) to be determined for the –C[triple bond, length half m-dash]CR substituents. During irradiation of Me3SiC[triple bond, length half m-dash]CMe, the Me3SiĊ[double bond, length half m-dash]C(Mu)Me radical was observed.

Article information

Article type
Paper

J. Chem. Soc., Perkin Trans. 2, 1990, 1729-1733

Muonated radicals formed from phenyl- and silyl-substituted acetylenes

C. J. Rhodes and E. Roduner, J. Chem. Soc., Perkin Trans. 2, 1990, 1729 DOI: 10.1039/P29900001729

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