Determination of stability constants from linear-scan or cyclic-voltammetric data using a non-linear least-squares method
Abstract
Stability constants of binary complexes can be determined using linear-scan or cyclic-voltammetric data. In contrast to a recently applied graphical method, numerical treatment based on a non-linear least-squares refinement allows one to make optimal use of the information contained in the data set. This is illustrated by re-evaluating recent literature data.
Please wait while we load your content...