Combination of impurity pre-concentration in compound semiconductors with different methods of analysis

Abstract

The possibility of developing a unified technique of extraction-chromatographic pre-concentration of micro-impurities in semiconductor compounds based on the elements of Groups II, IV and VI has been studied for a large number of matrices using various methods of analysis. The composition of a stationary phase (trioctylamine-tributyl phosphate mixture) suitable for a single-stage separation of all the matrix elements in compound semiconductors (CdTe, PbTe, SnTe, ZnSe, ZnO, Cd_xHg_1–xTe, etc.) is suggested, together with the conditions for the quantitative elution of 24 micro-impurities with HCl of different concentrations.

The metrological characteristics of various (activation and non-activation) methods of concentrate analysis are compared.