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Issue 5, 1987
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Low-Z element analysis by soft X-ray line emission of a laser-produced plasma

Abstract

A method for the rapid detection of low-Z elements in solid samples is presented. The detection is performed by measuring the characteristic soft X-ray line emissions of these elements in a plasma, produced by laser irradiation of the samples. A description is given of the determination of the Na and B contents of various samples which also contain C, H and O atoms. The signals are linear with respect to concentration up to 1 at.-%. In the experimental arrangement used, with its limited resolution, the detection limit for Na and B has been determined to be 0.04 at.-%. Therefore, there is the potential for an improvement in the detection limit by a factor of 40. A major restriction on the use of this method is the interference of emission lines, which is most likely to occur when high-Z elements are present in the samples.

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Article type: Paper
DOI: 10.1039/JA9870200503
J. Anal. At. Spectrom., 1987,2, 503-507

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    Low-Z element analysis by soft X-ray line emission of a laser-produced plasma

    H. Van Brug, F. Bijkerk, M. J. van der Wiel and B. van Wingerden, J. Anal. At. Spectrom., 1987, 2, 503
    DOI: 10.1039/JA9870200503

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