The determination of niobium and germanium in single-phase and crystalline radiofrequency sputtered “Nb3Ge” thin films by rapid colorimetric methods is described. The niobium to germanium molar ratios obtained are compared with those obtained by electron-microprobe analysis.
J. B. Bodkin and D. A. Rogowski, Analyst, 1977, 102, 110 DOI: 10.1039/AN9770200110
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