Theory of the critical thickness of rupture of thin liquid films

Abstract

On the basis of Navier-Stokes equations, the theory of the spontaneous rupture of thin liquid films is generalized by taking into account the influence of the surfactant on the hydrodynamics of the film. Our measurements of the critical thicknesses of rupture of aniline films, stabilized with C₁₂H₂₅OH, confirm the theory at low surfactant concentrations. The discussion of the discrepancy between theory and experiment at higher surfactant concentrations shows that the surfactant influences the properties of the thin liquid films in a specific manner.