Application of internal reflection spectroscopy to the study of adsorbed layers at interfaces

Abstract

The application of the technique of internal reflection spectroscopy (IRS) has certain inherent properties which allow the direct observation of the spectra of adsorbed layers at interfaces. Several representative examples of specific research problems related to the study of adsorbed films which have been investigated by IRS are discussed. Included are discussions of adsorbed films on both optically transparent and opaque adsorbents, surface functional groups and adsorption on thin metal film electrodes. Also discussed are the principles involved, the advantages and limitations of the method, and the instrumental, experimental, and optical problems peculiar to IRS measurements.