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The crystal and molecular structure of dimethyl sulphone have been determined by X-ray diffraction techniques: the R-factor is 4% and bond lengths are given to ca. 0·005 Å.
D. A. Langs, J. V. Silverton and W. M. Bright, J. Chem. Soc. D, 1970, 1653 DOI: 10.1039/C29700001653
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