Open Access Article
Quanyou Feng
a,
Aiyun Zhua,
Qiuhu Hana,
Kewei Guoa,
Yunfei Zhua,
Yue Caoa,
Jingyao Maa,
Hao Lia,
Hongjian Wang
a,
Yuyu Pan
*b,
Xinxin Ban
c,
Mengna Yua,
Man Xua,
Zilu Wang*a,
Guohua Xie
d,
Linghai Xie
*ae and
Wei Huang*aef
aCentre for Molecular Systems and Organic Devices (CMSOD), State Key Laboratory of Flexible Electronics, Institute of Advanced Materials (IAM), Nanjing University of Posts & Telecommunications, 9 Wenyuan Road, Nanjing 210023, P. R. China. E-mail: iamlhxie@njupt.edu.cn; iamzlwang@njupt.edu.cn
bSchool of Petrochemical Engineering, Shenyang University of Technology, 30 Guanghua Street, Liaoyang 111003, P. R. China. E-mail: panyu0422@sut.edu.cn
cSchool of Environmental and Chemical Engineering, Jiangsu Key Laboratory of Function Control Technology for Advanced Materials, Jiangsu Ocean University, 59 Cangwu Road, Lianyungang 222005, P. R. China
dThe Institute of Flexible Electronics (Future Technologies), Xiamen University, 422 Siming South Road, Xiamen 361005, P. R. China
eSchool of Flexible Electronics (SoFE), Henan Institute of Flexible Electronics (HIFE), Henan University, 379 Mingli Road, Zhengzhou 450046, P. R. China
fFrontiers Science Center for Flexible Electronics (FSCFE), State Key Laboratory of Flexible Electronics, Northwestern Polytechnical University, 127 West Youyi Road, Xi'an 710072, China. E-mail: vc@nwpu.edu.cn
First published on 4th February 2026
Nanoemitters play a pivotal role in advancing OLED technologies toward flexible, efficient, and sustainable display platforms. However, current quantum dots and perovskite LEDs suffer from structural instability and environmental sensitivity, limiting their scalability. Here, we introduce a post-synthetic gridization strategy to construct robust, solution-processable organic nanodots. The resulting A-shaped nanogrid (AG) framework provides a rigid and sterically protected donor scaffold that suppresses aggregation-caused quenching, promotes horizontal dipole orientation and ozone resistance, and minimizes reorganization energy. Based on this design, the thermally activated delayed fluorescence (TADF) emitter AG-PXZ-TRZ exhibits a 3.1-fold enhancement in the radiative decay rate and a 5.5-fold acceleration of reverse intersystem crossing relative to the parent emitter PXZ-TRZ, together with an improved horizontal molecular orientation of 83%. Solution-processed OLEDs based on AG-PXZ-TRZ achieve an external quantum efficiency of 28.9%, markedly surpassing the performance of both PXZ-TRZ and the arylmethylated analogue DPFPXZ-TRZ. This work establishes molecular gridization as an effective pathway toward stable and high-performance organic nanoemitters for next-generation optoelectronic displays.
One creative technique route was initiated with organic nanodots for next-generation emitters beyond all the past designs of exciton/photon-emissive materials.10,11 Organic nanostructures such as dendrimers, fused aromatics, and macrocycles have attracted considerable interest in optoelectronic applications owing to their diverse structural advantages.12–14 For example, as shown in Fig. 1a, dendrimers facilitate the self-encapsulation of emissive cores, effectively suppressing aggregation-caused quenching (ACQ) and enabling the realization of solution-processable, host-free emitters.15 In parallel, fused aromatic systems,16,17 particularly boron-nitrogen multi-resonance frameworks,18,19 afford exceptionally narrowband emission, opening new avenues toward high-color-purity light-emitting materials. Moreover, organic macrocycles serve as a versatile molecular platform,20–23 where strained cycloparaphenylenes enable tunable emission,24,25 donor–acceptor architectures regulate p/n polarity,22 and functionalized derivatives deliver fluorescence,26,27 phosphorescence,28,29 and TADF properties22,30,31 positioning them as high-performance, solution-processable materials. Optimizing molecular design to minimize reorganization energy is crucial for stabilizing charge-transfer (CT) states of emitters.32 Organic nanodots are emerging as promising candidates for next-generation quantum technologies, neuromorphic computing, and intelligent display systems.11,33 Integrating advanced molecular engineering with modern chemical approaches offers a transformative pathway toward low-cost fabrication and ultrahigh market potential.
Compared with fused polycyclic aromatization, dendrimerization, and macrocyclization, molecular gridization enables the construction of zero-, one-, two-, and three-dimensional nanoscale architectures with distinct inorganic-like optoelectronic characteristics.34 Friedel–Crafts gridization (FCG) establishes the foundational principles of gridization, providing state-of-the-art structural models and efficient nanosynthesis methodologies. In this context, nanogrids incorporating aromatic amines could be used as unique electronic donors for constructing interesting and efficient emitters with advantages in the following aspects (Fig. 1b). (i) The inherent rigidity of nanogrid's molecular framework effectively minimizes structural relaxation, thereby reducing reorganization energy,35 while its robust architecture and effective blockade of the aromatic amine active sites significantly enhance thermal, chemical, and electrical stability.36,37 (ii) The multiple steric hindrances of the nanogrids are beneficial to suppress the molecular interactions and thus prevent the ACQ effect, which further increase the photoluminescence quantum yield (PLQY) for luminescent materials.38,39 (iii) Increased molecular weight and/or extended molecular backbones favour horizontal orientation of the emitters, thereby enhancing light outcoupling efficiency.36,40 (iv) The incorporation of alkyl and alkoxyl groups at the 9-positions of fluorene units offers a straightforward strategy to improve solution processability and film-forming properties.41,42
Here, we present a post-synthetic gridization strategy that enables the construction of A-shaped nanogrid (AG) with high-yield synthesis, opening new pathways toward the scalable commercialization of organic nanodots for flexible electronics. Based on this design principle, we develop the nanogrid emitter AG-PXZ-TRZ through post-synthetic gridization of the TADF emitter PXZ-TRZ. We select PXZ-TRZ as the representative TADF emitter because phenoxazine–triazine donor–acceptor architectures are extensively studied and consistently deliver intriguing photophysical behaviour.43–46 Building on the advantages mentioned above, AG-PXZ-TRZ, in comparison with its parent compound PXZ-TRZ47 and the arylmethylated analogue DSFPXZ-TRZ, exhibits suppressed aggregations, enhanced rates of reverse intersystem crossing (kRISC) and radiative decay (kr), an improved horizontal molecular orientation of up to 83%, greater ozone tolerance, and lower reorganization energy (Fig. 1b). When employed as a dopant in solution-processed OLEDs, AG-PXZ-TRZ consequently yields a substantial enhancement in electroluminescent performance, achieving an external quantum efficiency of 28.9%, which markedly exceeds that of devices based on PXZ-TRZ and DSFPXZ-TRZ.
Exceptional thermal properties contribute significantly to the long-term stability and sustainability of solution-processed devices when deployed in real-world environments. Then the thermal properties of the emitter were examined using thermogravimetric analysis (TGA) and differential scanning calorimetry (DSC). As shown in Fig. S8, the decomposition temperatures (Td, with 5% weight loss) of AG-PXZ-TRZ and DSFPXZ-TRZ are 236 °C and 305 °C, respectively. And the glass transition temperatures (Tg) of AG-PXZ-TRZ and DSFPXZ-TRZ are 183 °C and 202 °C, respectively. These thermal properties of AG-PXZ-TRZ enable it to undergo annealing treatment during solution processing, which is important for device fabrication and performance. In addition, the introduction of the nanogrid framework also enhances the solubility of the material, which guarantees efficient film forming through solution processing. The atomic force microscopy (AFM) measurement was employed to examine the film-forming capability and morphological characteristics of the solution-processed films. As shown in Fig. S10, the AFM images of parent emitter PXZ-TRZ reveal a significant surface roughness of 5.88 nm, marked by numerous cracks and crystalline structures. This observation suggests that PXZ-TRZ exhibits suboptimal film-forming properties. In contrast, AG-PXZ-TRZ and DSFPXZ-TRZ based films exhibit significantly reduced RMS values of 0.38 nm and 0.917 nm, respectively. The smooth and uniform morphology of the AG-PXZ-TRZ film, which is devoid of any pinholes, cracks, or crystalline inclusions, strongly indicates that high-quality films can be achieved via spin-coating using AG-PXZ-TRZ.
| Emitter | λema [nm] | ES1b [eV] | ET1b [eV] | ΔEST [eV] | ΦPLc [%] | τpd [ns] | τdd [µs] | kre [107 s−1] | kISCe [107 s−1] | kRISCe [106 s−1] |
|---|---|---|---|---|---|---|---|---|---|---|
| a Measured in neat films.b Estimated from fluorescent and phosphorescent spectra in neat films.c Obtained from integrating sphere measurements for the 30 wt% doped CBP films.d Lifetime of prompt and delayed fluorescence.e Radiative decay rate (kr) from S1 to S0 states, the intersystem crossing rate (kISC), and the reverse intersystem crossing rate (kRISC). | ||||||||||
| PXZ-TRZ | 527 | 2.17 | 1.90 | 0.27 | 68 | 11.8 | 1.14 | 1.46 | 7.02 | 0.36 |
| DSFPXZ-TRZ | 550 | 2.07 | 1.90 | 0.17 | 60 | 35.2 | 0.99 | 0.81 | 2.05 | 1.26 |
| AG-PXZ-TRZ | 538 | 2.10 | 1.94 | 0.16 | 77 | 9.19 | 1.03 | 4.55 | 6.33 | 2.00 |
The fluorescence decays of AG-PXZ-TRZ in the film state at room temperature were also monitored to explore their emissive characteristics. As illustrated in Fig. 2b, similar to the parent emitter PXZ-TRZ, the arylmethylated DSFPXZ-TRZ also clearly exhibits two component emission decays, consisting of a prompt component of 35.2 ns and delayed component of 0.99 µs. Following gridization, the emitter AG-PXZ-TRZ displays a delayed lifetime similar to that of its precursor, while demonstrating a significantly shorter prompt lifetime of 9.19 ns. The reduced delayed lifetime of AG-PXZ-TRZ can be attributed to its smaller ΔEST, which effectively enhances the RISC process while suppressing non-radiative decay from the triplet state. To further demonstrate the TADF properties, the oxygen sensitivity test was performed. As shown in Fig. S10b, the fluorescence is markedly quenched in the presence of oxygen, whereas a pronounced enhancement in delayed emission is observed upon N2 bubbling, providing compelling evidence for the involvement of triplet states in the emissive process. It can be seen from Table 1 that arylmethylation leads to a notable increase in the kRISC, from 0.36 × 106 s−1 for PXZ-TRZ to 1.26 × 106 s−1 for DSFPXZ-TRZ. Following gridization, the AG-PXZ-TRZ molecule displays a further reduced ΔEST, which consequently facilitates faster reverse intersystem crossing with a kRISC of 2.00 × 106 s−1. This enhancement likely correlates with spin–orbit coupling (SOC) between S1 and the triplet states (as explored in the following Theoretical calculations section) and markedly improves the utilization of triplet excitons during electroluminescence. The radiative decay rate constants (kr) are determined to be 4.55 × 107 s−1, 0.81 × 107 s−1 and 1.46 × 107 s−1 for AG-PXZ-TRZ, DSFPXZ-TRZ and PXZ-TRZ, respectively. The substantially increased kRISC and kr of AG-PXZ-TRZ effectively suppress non-radiative losses and curtail repeated spin-flip processes, which is critical in limiting the accumulation of triplet excitons. Consequently, these favourable exciton dynamics in AG-PXZ-TRZ are anticipated to enhance the EL device performance.
To evaluate whether gridization, akin to arylmethylation, can enhance the horizontal dipole orientation ratio (Θ//) of the emitters and thereby improve light outcoupling efficiency in electroluminescent devices, angle-dependent p-polarized photoluminescence spectra were measured for the three emitters embedded in a common CBP host. As shown in Fig. 2c, PXZ-TRZ exhibits a Θ// of 74%. As expected, arylmethylation increases this value to 77% in DSFPXZ-TRZ, consistent with our previous findings.36 Upon gridization, the Θ// further increases to 83% for AG-PXZ-TRZ, likely due to the increased aspect ratio of the emissive molecule conferred by the rigidified grid-like structure.40 As the solvent polarity increases from apolar toluene to polar THF, the emission peaks of these emitters red-shift by 53–73 nm, indicating a pronounced bathochromic effect (Fig. S12). Moreover, both compounds of AG-PXZ-TRZ and DSFPXZ-TRZ exhibit a progressive enhancement in PL intensity with increasing water content, consistent with aggregation-induced emission (AIE) behaviour (Fig. S13). These results indicate that the gridization, akin to arylmethylation, preserves the AIE characteristics of the emitter.36
Furthermore, organic semiconductors are highly susceptible to degradation by reactive oxygen species (ROS) such as superoxide anions (O2−), singlet oxygen (1O2), and hydroxyl radicals (OH˙).49 This oxidative process introduces carrier traps and quenching centers, which adversely impact the electrical performance and operational stability of the resulting devices. To impose more rigorous aging conditions, ozone is introduced as an external oxidative stressor. Amorphous spin-coated films are aged in a fully dark, enclosed environment by exposure to ozone generated at 200 mg h−1 with an air flow rate of 1 L min−1 for durations ranging from 0 to 210 min.50 With increasing exposure time, the PL spectra (Fig. 2d) of PXZ-TRZ exhibit a pronounced decrease in emission intensity accompanied by a gradual blue shift of the maximum emission wavelength, resulting in a marked displacement of the CIE coordinates (Fig. S14b). In contrast, DSFPXZ-TRZ (Fig. S14a) and AG-PXZ-TRZ (Fig. 2e) display significantly lower photoluminescence attenuation under identical conditions. Unlike PXZ-TRZ, DSFPXZ-TRZ shows an initial blue shift followed by a red shift after 150 min, which likely arises from conjugation chain scission and low-energy defect states induced by ozone and other reactive oxygen species. Remarkably, AG-PXZ-TRZ retains stable emission intensity and color purity even after 210 min of exposure (Fig. S14d), as evidenced by its persistent yellow luminescence under UV illumination (Fig. 2f). Ozone, as a strong oxidant, readily reacts with carbon–carbon double bonds and electron-rich motifs in organic semiconductors, disrupting conjugation and impairing optoelectronic performance. Introducing bulky steric units adjacent to the reactive sites creates a steric shielding effect that hinders the approach of ozone to the reaction centers. This strategy preserves the highly delocalized π-conjugated framework of AG-PXZ-TRZ and retains its optoelectronic properties with minimal ozone-induced degradation, thereby imparting excellent ozone-aging resistance.
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| Fig. 3 HOMO/LUMO distribution, oscillator strengths, state levels, and SOC constants of (a) PXZ-TRZ, (b) DSFPXZ-TRZ and (c) AG-PXZ-TRZ. | ||
The natural transition orbital (NTO) analysis reveals that, akin to PXZ-TRZ, the electronic transitions in both DSFPXZ-TRZ and AG-PXZ-TRZ predominantly occur between the donor and acceptor moieties (Fig. S16–S18). The S1, S2, and T1 states of AG-PXZ-TRZ exhibit pronounced charge-transfer (CT) character, exceeding 85%, consistent with the typical CT nature of TADF molecules. Calculated excitation energies further reveal that PXZ-TRZ exhibits minimal variation in energy levels between the solution and film, yet displays an elevated S1 state in the solid-state, thereby inducing an enhanced ΔEST in the film. In contrast, AG-PXZ-TRZ consistently displays a smaller ΔEST, which can be attributed to its increased torsional distortion. Additionally, it can be seen from Fig. S19 that the excitation energies of the molecules exhibit marked environmental dependence. Specifically, upon arylmethylation, the S1 state excitation energy of the molecule decreases, while the T1 state energy remains largely unaffected in the film state, culminating in a reduced ΔEST of DSFPXZ-TRZ.52 This similar trend is also observed in gridization for AG-PXZ-TRZ, underscoring a similar modulation of excited-state energetics. Such small ΔEST would lead to an effective RISC process and benefit the utilizations of triplet excitons. Moreover, the A-shaped nanogrid-based emitter AG-PXZ-TRZ exhibits markedly enhanced spin–orbit coupling (SOC) between S1 and the triplet states (T1 and T2), relative to both PXZ-TRZ and DSFPXZ-TRZ, with SOC values increasing from 0.158 to 0.411 cm−1 (S1–T1) and from 0.051 to 0.100 cm−1 (S1–T2), respectively. Although T2 and T3 possess pronounced 3LE character, the magnitude of SOC is governed not only by the LE nature of the triplet states but also by the orbital composition and energetic proximity of the coupled singlet–triplet pair. The S1 and T1 states exhibit mixed HLCT character, combining sufficient orbital overlap with partial charge separation, which leads to enhanced spin–orbital interaction compared with pure LE or CT states. Moreover, the small S1–T1 energy gap increases wavefunction overlap and strengthens state-to-state coupling, resulting in a larger SOC matrix element for S1–T1 than for S–T2 or S1–T3. These features collectively account for the dominant SOC observed between S1 and T1. This pronounced improvement is anticipated to facilitate efficient RISC, consistent with the experimental observations above, thereby augmenting exciton utilization efficiency and advancing overall device performance.
To quantitatively characterize geometric changes in the overall molecule between excited states, the root mean square displacement (RMSD) of excited-state geometries in n-hexane was computed using Multiwfn 3.8. A large RMSD value indicates significant conformational differences between excited states, a larger structural modification required for molecular transitions, and greater energy dissipation. Conversely, a small RMSD value suggests the opposite. As shown in Fig. S20, AG-PXZ-TRZ exhibits increased geometric deviations between S0 and S1 relative to PXZ-TRZ and DSFPXZ-TRZ. Specifically, the RMSD between S0 and S1 is 0.4736 Å for PXZ-TRZ and 0.4196 Å for DSFPXZ-TRZ, whereas AG-PXZ-TRZ displays a slightly higher value of 0.6166 Å. Notably, Fig. S20 reveals that these larger deviations for AG-PXZ-TRZ predominantly originate from the flexible alkyl chains rather than the rigid molecular backbone. However, the AG-PXZ-TRZ molecule exhibits a smaller RMSD between the S1 and T1 states, indicating a smaller conformational change between these states. This suppression of structural relaxation likely arises from increased molecular rigidity and steric hindrance induced by gridization. This suggests that the reorganization energy changes during the exciton ISC and RSIC processes are relatively minor, and the non-radiative energy dissipation pathways are hindered, potentially leading to enhanced fluorescence efficiency.53
To further investigate the non-radiative energy dissipation processes associated with gridization, we calculated the reorganization energies of these emitters in their toluene solutions and films. The results reveal that vibrational modes within the intermediate frequency range (200–1500 cm−1) contribute significantly to the reorganization energy. As illustrated in Fig. 4, the reorganization energies of the emissive molecules in thin-film states are notably lower than those in solution states within this frequency range, indicating effective suppression of molecular vibrations in the solid state. Compared to PXZ-TRZ, incorporation of the 9-aryl-9-fluorenyl substituents in DSFPXZ-TRZ markedly enhances vibrational coupling, which is likely to facilitate non-radiative energy dissipation and result in an increased knr. Notably, the reorganization energy of AG-PXZ-TRZ remains consistently lower than that of PXZ-TRZ and DSFPXZ-TRZ, regardless of its state—whether in solutions or films. This observation underscores the role of gridization in suppressing vibration-induced non-radiative energy dissipation, consistent with prior analyses, and thus offers a compelling strategy for advancing OLED performance.
To evaluate the potential of AG-PXZ-TRZ in solution-processed OLEDs, devices with the configuration ITO/PEDOT:PSS (30 nm)/EML/TPBI/Cs2CO3/Al were fabricated via spin-coating. The corresponding energy-level alignment of the device components is illustrated in Fig. 5a. In this architecture, ITO and Al function as the anode and cathode, respectively. PEDOT:PSS (poly(3,4-ethylenedioxy-thiophene):poly(styrene sulfonate)) and Cs2CO3 serve as hole- and electron-injection layers, while TPBI acts as the electron-transporting layer. First, to probe the intrinsic emissive properties of AG-PXZ-TRZ, non-doped OLEDs were fabricated using pure AG-PXZ-TRZ as the emission layer. The resulting devices exhibit a low turn-on voltage (Von) of 3.0 V and achieve a maximum luminance (Lmax) exceeding 5800 cd m−2 (Fig. 5c). Notably, the devices deliver a maximum current efficiency (CEmax) of 32.1 cd A−1 and an external quantum efficiency (EQEmax) of 10.4%. For comparison, OLEDs based on the acyclic analogue DSFPXZ-TRZ exhibit a CEmax of 20.8 cd A−1 and an EQEmax of 6.92%, while those incorporating the parent emitter PXZ-TRZ show markedly lower performance, with a CEmax of 1.84 cd A−1 and an EQEmax of 0.65%. The device incorporating nanogrid AG-PXZ-TRZ exhibits a markedly enhanced external quantum efficiency—more than tenfold higher than that of the control emitter—primarily due to its superior film-forming properties and suppressed exciton quenching. The EL spectrum of AG-PXZ-TRZ peaks at 552 nm, exhibiting a red shift of 13 nm relative to its PL in the solid state. Similarly, DSFPXZ-TRZ exhibits an EL peak at 556 nm, exhibiting a redshift of 6 nm compared to its PL spectrum. In contrast, PXZ-TRZ displays a more significant redshift of 23 nm, with PL and EL maxima observed at 532 nm and 555 nm, respectively. The relatively smaller shift observed for AG-PXZ-TRZ suggests that the nanogrid architecture effectively suppresses intermolecular interactions, thereby minimizing exciton energy loss during device operation.
For device optimization, these emitters were incorporated as dopants into the CBP host at concentrations of 20 wt%, 30 wt%, and 40 wt%, serving as the EML. The resulting OLEDs exhibit relatively low turn-on voltages, ranging from 3.0 to 4.5 V, with a clear downward trend as the dopant concentration increases (Fig. 5f, S21 and Table S1). Among these, devices incorporating AG-PXZ-TRZ consistently show lower turn-on voltages relative to their analogues. Notably, the device incorporating a 30 wt% nanogrid emitter AG-PXZ-TRZ achieves state-of-the-art performance for solution-processed yellow-green TADF OLEDs (Fig. 5h),54–67 with a maximum luminance of 12
000 cd m−2, an EQEmax of 28.9%, and a CEmax of 87.2 cd A−1. By contrast, the parent emitter PXZ-TRZ and its non-grid analogue DSFPXZ-TRZ exhibit significantly reduced device performance, with the sole exception of the emission brightness in the PXZ-TRZ-based device. Specifically, the EQEmax of PXZ-TRZ and DSFPXZ-TRZ reach 2.97% and 15.4%, respectively, while their corresponding CEmax values are 8.78 cd A−1 and 46.7 cd A−1. These results provide compelling evidence for the efficacy of our gridization strategy in the rational design of high-performance TADF emitters.
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