Open Access Article
Md. Harun-Or-Rashid
*a,
Hanane Etabtib,
Md. Tauki Tazwarc,
Md Amzad Sadik Abidd,
Md Farhan Shahriyar
e,
Nosir Khurramovf,
Hayitov Abdulla Nurmatovichg,
Sardor Sabirovh,
Lakhdar Benahmedi
i,
Md. Monirul Islam
a and
Md. Ferdous Rahman
a
aDepartment of Electrical and Electronic Engineering, Begum Rokeya University, Rangpur 5400, Bangladesh. E-mail: harunorrashid1816017@gmail.com
bLIMAS, Faculty of Sciences Dhar El Mahraz, Sidi Mohamed Ben Abdellah University, Fez 30000, Morocco
cDepartment of Electrical and Electronic Engineering, Bangladesh Army University of Science and Technology (BAUST), Saidpur 5311, Nilphamari, Bangladesh
dDepartment of Information Systems, Lamar University, Beaumont, Texas 77705, USA
eDepartment of Computer Science and Engineering, Hajee Mohammad Danesh Science and Technology University, Dinajpur-5200, Bangladesh
fDepartment of Information Technology and Exact Sciences, Termez University of Economics and Service, Termez 190100, Uzbekistan
gDepartment of Technical Science, Urgench State University, Urgench 220100, Uzbekistan
hDepartment of General Professional Sciences, Mamun University, Khiva 220900, Uzbekistan
iTechnology and Solids Properties Laboratory, Faculty of Science and Technology, Mostaganem University, Mostaganem 27000, Algeria
First published on 7th April 2026
The development of sustainable, cost-effective, and environmentally friendly photovoltaic absorbers is essential for advancing next-generation solar cell technologies. In this study, we investigate the thallium-based halide perovskite TlPbI3 through a synergistic combination of density functional theory (DFT), solar cell capacitance simulator in one dimension (SCAPS-1D) device simulation, and machine learning (ML). Structural optimization, tolerance factor, formation energy, and phonon dispersion curve confirmed the structural, dynamic, thermodynamic, and mechanical stability of cubic TlPbI3, with elastic constants fulfilling Born's stability criteria. The calculated direct band gap of 1.26 eV at the R point falls within the optimal range for single-junction photovoltaics. Charge density mapping indicated mixed ionic-covalent bonding, ensuring structural robustness. Mechanical analysis confirmed ductility and thermal stability, with an estimated melting temperature of ∼757 K. Optical results showed strong absorption in the visible region, a high static dielectric constant (ε0 ≈ 4.6), and low reflectivity, underlining the suitability of TlPbI3 for optoelectronic devices. SCAPS-1D simulations were performed on different heterojunction configurations, optimizing absorber thickness, doping density, defect density, and buffer layers. The best-performing device, fluorine-doped tin oxide (FTO)/cadmium sulfide (CdS)/thallium lead triiodide (TlPbI3)/copper (Cu), delivered a power conversion efficiency (PCE) of 22.20% with open-circuit voltage (VOC) = 0.7987 V, short-circuit current density (JSC) = 34.56 mA cm−2, and fill factor (FF) = 80.40%, confirming the strong photovoltaic potential of TlPbI3. Machine learning models, trained on simulation datasets, successfully identified absorber thickness and defect density as the most critical factors influencing device performance. This integrated computational framework demonstrates the potential of TlPbI3 as a viable absorber material for next-generation solar cells and provides valuable predictive insights to guide experimental development.
Within this context, metal halide perovskites have attracted considerable attention over the past decade as promising alternatives to traditional absorbers.5 Perovskites with the general formula ABX3, where A is a monovalent cation, B is a metal cation, and X is a halide anion, exhibit a unique combination of optoelectronic properties that make them highly suitable for solar cell applications.6,7 Their exceptional light-harvesting ability, tunable band gaps, defect tolerance, and long carrier diffusion lengths have enabled rapid progress in PCEs, which increased from 3.8% in 2009 to over 27% in recent years.8 Furthermore, their solution processability and compatibility with low-temperature fabrication methods point toward low production costs and large-scale manufacturability. For these reasons, halide perovskites are increasingly considered as strong candidates to complement or even replace traditional materials in photovoltaic applications.9,10
Numerous studies have explored the potential of perovskite compounds, and a significant body of literature has demonstrated their versatility. Kojima et al. first introduced organometal halide perovskites as sensitizers in dye-sensitized solar cells, marking the beginning of this field.11 Subsequent studies by Zhou et al., Parket et al., Snaithet et al., and Green et al. further documented their remarkable efficiency improvements and device stability challenges12–15 More recently, Jacob et al. employed DFT to screen several of the perovskite compositions, identifying stable and non-toxic candidates.16 Li et al. introduced ML models trained on experimental data points to guide material selection and device design.17 Additional works by Kulkarni et al., Noh et al., Yoo et al., and Duan et al. have examined the structural, optical, and electronic behavior of halide perovskites, revealing both their advantages and their persistent challenges in stability and toxicity. Together, these studies have laid the foundation for both computational and experimental advances in perovskite photovoltaics18–21 Among the many families of perovskite compounds, thallium-based perovskites have only recently begun to attract attention. In particular, TlPbI3 has been identified as a candidate absorber with unique optoelectronic features. Liu et al. performed a first-principles study of TlPbI3, reporting a band gap of approximately 1.33 eV, which is close to the optimal value for single-junction solar cells.22 They also highlighted its improved structural stability compared with other inorganic halide perovskites. Lin et al. demonstrated that TlPbI3 single crystals possess wide band gaps and high densities, making them suitable for ionizing radiation detection, though their optical properties remain promising for PV applications.23 More recently, Yan et al. investigated the layered form of TlPbI3 and showed how lattice contraction affects band dispersion and carrier effective masses, revealing the potential of structural engineering to tune its electronic performance.24 These results suggest that thallium-based perovskites, despite being less widely studied than lead or tin perovskites, could offer valuable opportunities in the search for efficient and stable absorber materials.
In the present study, we build on this growing body of research by adopting a combined approach that integrates first-principles density functional theory, SCAPS-1D device simulation, and machine learning techniques. DFT provides detailed insights into the fundamental structural, electronic, and optical properties of TlPbI3, while SCAPS-1D enables the evaluation of realistic device configurations, accounting for absorber thickness, defect densities, and interface properties. Machine learning, in turn, accelerates the screening and prediction of performance trends, helping to identify the most critical parameters and guiding further optimization. Similar strategies have recently been employed by researchers such as Moulebhar et al., Jacobs et al., and other groups that successfully combined computational materials design with ML models to predict stability and efficiency.16,25,26 Our approach follows this line of research but extends it to the case of thallium-based perovskites, where relatively little systematic work has been reported to date. The motivation for our work lies in addressing two main gaps. First, despite promising results from theoretical studies, TlPbI3 remains poorly understood in terms of its performance in solar cell devices. By combining DFT with SCAPS, we provide insights that directly link material properties to device-level behavior. Second, while machine learning has been applied to broader classes of perovskites, few studies have targeted Tl-based compounds specifically. By integrating ML into our investigation, we aim to accelerate the understanding of this material and provide predictions that can guide future experimental efforts.
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Gradient boosting adopts a boosting approach, constructing trees in a sequential manner such that each subsequent tree attempts to correct the residual errors of the preceding ensemble by minimizing a specific loss function through gradient descent optimization.43 The iterative model update can be represented as:
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A decision tree is a supervised machine learning algorithm that uses a hierarchical tree structure to classify or predict outcomes based on a set of rules. It works by recursively splitting data into subsets based on feature values until each subset belongs to the same class. The splitting criterion uses Information Gain, calculated as:44
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LightGBM is a high-performance gradient Boosting framework developed by Microsoft that builds upon decision tree algorithms. Unlike traditional level-wise tree growth, LightGBM uses leaf-wise growth, selecting the leaf with the maximum loss reduction to split next. Key innovations include Gradient-based One-Side Sampling (GOSS) and Exclusive Feature Bundling (EFB) for efficiency. The split gain is computed as:45
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The formation probability of a perovskite crystal structure is often assessed using two key geometric parameters – the Goldschmidt tolerance factor (t) and the octahedral factor (OF).46 These empirical parameters serve as predictive indicators of the structural stability of perovskites and can be calculated using the following relationships:47–52
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The formation energy (ΔEf) serves as an essential parameter for evaluating the chemical and thermodynamic stability of perovskite compounds, as outlined in:54,55
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| Material | rA | rB | rX | Goldschmidt tolerance factor, t | Octahedral factor, of | Bandgap (eV) | Lattice constant (Å) | Formation energy, ΔEf (eV per atom) | Ref. |
|---|---|---|---|---|---|---|---|---|---|
| TlPbI3 | 1.50 | 1.19 | 2.20 | 0.77 | 0.54 | 1.26 (PBE), 1.82 (HSE), 0.35 (SOC + PBE) | 6.29 | −2.466 | This work |
| TlPbI3 | — | — | — | — | — | 1.92 (HSE) | 6.33 | −0.584 | 59 |
| InPbI3 | — | — | — | — | — | 1.23 (PBE), 1.898 (HSE) | 6.28 | −2.435 | 57 |
| GaPbI3 | — | — | — | — | — | 1.30 (PBE) | 6.35 | −1.600 | 60 |
| AlPbI3 | — | — | — | — | — | 1.784 (HSE) | 6.303 | −0.181 | 59 |
| CsPbI3 | — | — | — | 0.81 | — | 1.28 (PBE) | 6.336 | −0.028 | 61 |
| RbPbI3 | 1.63 | 1.17 | 2.20 | 0.803 | 0.53 | 1.50 (PBE) | 6.178 | −0.0155 | 61 |
To clarify the magnetic nature of TlPbI3, both non-spin-polarized and spin-polarized calculations were carried out. The total energy of the non-magnetic (NM) configuration was found to be −80.42968 Ry, while the ferromagnetic (FM) trial configuration gave −80.42957 Ry. The NM configuration is the most stable phase, since its total energy is slightly lower than that of the FM state. In the spin-polarized calculation, both the total and absolute magnetic moments converged to 0 Bohr magneton per cell, demonstrating that no stable local or long-range magnetic ordering is present. These results confirm that TlPbI3 has a nonmagnetic ground state within the present DFT calculations.
The charge density map shows important bonding details by showing electron charge patterns on different crystallographic planes. The (110) plane within TlPbI3 displays a specific charge arrangement as shown in Fig. 1(b). The color representation of electron density distribution shows red for high-density regions and blue for low-density areas within the crystal structure. The spherical charge distribution of Tl and I atoms fails to intersect along the (110) plane because this arrangement indicates that they form an ionic bond. The ionic nature becomes more evident because Tl and Pb atoms display noticeably different electron densities. The elliptical bonding areas between Pb and I demonstrate covalence because their mutual electron charge sharing happens within the same plane of the molecular structure. The I ions possess the highest electron concentration within specific regions of the crystals, while Tl ions demonstrate the lowest electron density according to charge density maps.
| C11 − C12 > 0, C11 + 2C12 > 0, and C44 > 0 | (13) |
The values of C11, C12, and C44 for TlPbI3 appear in Table 2. All stability conditions used to determine mechanical stability are met by these values, which show that TlPbI3 achieves mechanical stability during equilibrium conditions.
| Parameters | TlPbI3 | InPbI3 (ref. 57) | InGeCl3 (ref. 62) |
|---|---|---|---|
| C11 (GPa) | 34.5690 | 36.4715 | 46.02 |
| C12 (GPa) | 2.8775 | 2.4397 | 11.02 |
| C44 (GPa) | 2.8112 | 2.5414 | 10.50 |
| Cauchy pressure, CP (GPa) | 0.0663 | −0.1017 | 0.52 |
| Bulk modulus, B (GPa) | 13.4413 | 13.7836 | 22.69 |
| Shear modulus, Gs (GPa) | 6.1074 | 6.0916 | 12.90 |
| Young's modulus, Y (GPa) | 15.9123 | 15.9284 | 31.53 |
| Poisson's ratio, v | 0.3027 | 0.3073 | 0.261 |
| Pugh ratio, B/Gs | 2.2008 | 2.2627 | — |
| Anisotropy factor (A) | 0.1774 | 0.1493 | — |
| Melting temperature, Tm (K) | 757.3028 | 768.5468 | — |
A number of mechanical moduli, such as the bulk modulus, shear modulus, Pugh ratio, Young's modulus, and Poisson's ratio, were calculated from the elastic constants Cij, and are shown in Table 2. These moduli offer more detailed information about the material's mechanical response. They used the following equations in their computations, which were based on the Voigt–Reuss–Hill (V.R.H.) averaging method:63,64
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| CP = C12 − C44 | (18) |
The bulk modulus defines how much materials oppose uniform compression. A high B value indicates strong resistance of materials to volumetric changes that occur under pressure. Studies presented in Table 2 prove that TlPbI3 exhibits maximum resistance when compressed.
Eqn (15) provides the calculation method for determining the material's shear deformation resistance through the shear modulus. The material exhibits superior rigidity when its Gs value becomes higher. The material TlPbI3 demonstrates high resistance to shear forces because of its mechanical durability properties.
The relation between shear and bulk moduli exists in Young's modulus, which defines material stiffness according to eqn (16). The stiffness of a material increases when its Y value reaches higher levels.
The material's lateral deformation behavior during stretching and compression can be evaluated through Poisson's ratio, which is derived from eqn (17). A material exhibits strong interatomic bonding and shows elastic flexibility when its measured Poisson ratio falls between 0.25 and 0.50. The elastic properties of TlPbI3 demonstrate a proper balance according to the established range.
Ductility and malleability assessment requires evaluation through Cauchy pressure using eqn (18) combined with the Pugh ratio (with threshold 1.75).65 TlPbI3 behaves as a ductile material because its Pugh ratio of 1.75 and positive Cauchy pressure values present in Table 2 indicate so.
The elastic anisotropy factor, determined using eqn (19),66 highlights direction-dependent mechanical properties:
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The determination of thermal conductivity and bonding strength depends on the melting temperature measurement that closely correlates with the elastic properties of the material. The estimation of melting temperature for cubic materials uses eqn (20),68,69 as follows:
| Tm = 553 + 5.91C11 | (20) |
Based on this relation, the TlPbI3 crystal is anticipated to melt at 757.302 K, which makes it suitable for high-temperature optoelectronic functions. The substance demonstrates effective atomic bonds and outstanding thermal conductive properties through its high melting temperature.
The density of states (DOS) offers crucial insights into the distribution of electronic states and their roles in the valence and conduction bands. The density of states provides visible evidence about electron energy states that exist and are occupied inside solid materials. Scientific research utilizing DOS allows experts to identify electronic state quantities across numerous energy levels to study material properties better. Fig. 2(b) shows the complete and segmented DOS of TlPbI3. The vertical dotted line representing the Fermi level (EF) separates the material into the valence band on its left side and the conduction band on its right side. The analysis area stretches over −5 to +5 eV in the x-axis dimension, while the DOS scale reaches 25 states per eV in the y-axis range. In the density of states profile of TlPbI3, the most intense valence-band contribution is located between −2.0 and −2.5 eV, with a maximum magnitude of approximately 22.5 electrons eV−1 (equivalent to 1.423 × 1019 cm−3). On the conduction-band side, the DOS attains a peak value of about 10.587 electrons eV−1, corresponding to 6.701 × 1018 cm−3. The majority of valence band orbitals come from Iodine's I-5p orbitals, whereas the main composition of conduction band orbitals stems from Thallium's Tl-6p orbitals. The Pb-6p state functions as an important component that determines how TlPbI3 constructs its total electronic structure. Electron affinity refers to the energy change, expressed in electronvolts, associated with the attachment of an electron to a neutral atom or molecule, and it plays a key role in determining the energy-level alignment between the absorber layer and the electron transport layer, thereby governing the efficiency of electron extraction and transport.57 For the present material, the computed electron affinity is 3.75 eV, a value that is highly favorable for efficient operation in solar cell devices.
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In order to determine the effective masses of holes
and electrons
, the band structure data in the vicinity of the Brillouin zone R point were analyzed. The second-order derivatives of the valence band maximum and conduction band minimum with respect to the wave vector k were evaluated at the R point. For TlPbI3, the calculated electron and hole effective masses are 0.19 m0 (1.73 × 10−31 kg) and 0.23 m0 (2.10 × 10−31 kg), respectively. These effective masses correspond to relaxation times of 8.7 × 10−15 s for electrons and 7.9 × 10−15 s for holes, yielding carrier mobilities of approximately 91.9 cm2 V−1 s−1 for electrons and 75.9 cm2 V−1 s−1 for holes.
| ε(ω) = ε1(ω) + iε2(ω) | (22) |
The real part, ε1(ω), can be expressed using eqn (20):61
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The expression for the imaginary part of the dielectric function, ε2(ω), formulated in terms of the momentum operator, is presented as follows (24):75
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The unit cell volume is represented by the symbol V in this equation, and the wave functions for the valence and conduction bands are identified by the symbols φv and φc respectively. The energy of the conduction band is represented by Ec, the energy of the valence band by Ev, the momentum operator by p, the reduced Planck's constant by ℏ, and the Dirac delta function by δ.
Using ε1(ω) and ε2(ω), other optical properties such as the absorption coefficient α(ω), optical conductivity σ(ω), energy loss function L(ω), reflectivity R(ω), and refractive index N(ω) can be calculated using the following expressions (25)–(29):
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The optical parameters associated with perovskite materials demonstrate dependence on energy through their absorption coefficient α(ω), optical conductivity σ(ω), and dielectric function ε(ω), as well as energy loss function L(ω), reflectivity R(ω), and refractive index N(ω). This section explains the method for calculating optical properties to examine the TlPbI3 photon response. The Fig. 3a–f represent the parameter spectra from 0 to 18 eV energy levels in the study.
The absorption coefficient functions as a basic parameter for measuring the optical energy absorption rate through material length76–80. Intake of optical energy occurs through a matching interaction between atomic state differences and photon frequencies, allowing photon energy absorption. The dependency of the absorption coefficient on photon frequency allows materials to choose photons based on their energy levels within particular ranges. During this process, electrons in the upper valence band transition to vacant states in the lower conduction band. A semiconductor's operating band determines its range of light absorption onset. When photon energy reaches beyond a particular level, it will energize valence electrons to create absorption events. The optical absorption coefficient α(ω) of TlPbI3 material appears in Fig. 3(a). The absorption of light begins at 2 eV when analyzing TlPbI3, which leads to a wide optical band gap. The photon absorption behavior of TlPbI3 shows robust properties for high-energy radiation, which makes this material suitable for use in optoelectronic systems.
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| Fig. 3 The (a) absorption coefficient, (b) conductivity, (c) dielectric function, (d) electron loss function, (e) reflectivity, and (f) refractive index of TlPbI3 perovskites with photon energy. | ||
The density of induced current depends on the electric field strength at a specific frequency according to the optical conductivity theory. The concept of electrical transport in optical conductivity examines high-energy photon interactions through the induced electron conduction derived from the complex dielectric function. Fig. 3(b) depicts the real and imaginary spectra of optical conductivity for TlPbI3. The imaginary conductivity begins at zero energy before the appearance of real conductivity at 2 electron volts. The optical conductivity of TlPbI3 shows its highest value at a photon energy level of 4.10 eV when under illumination. The recorded data demonstrates TlPbI3 has desirable photoconductive features that make it suitable for optoelectronic applications.
The real and imaginary parts of TlPbI3 dielectric function appear in Fig. 3(c). The Kramers–Kronig relations help radiofrequency techniques derive the energy-frequency relationships between real and imaginary parts of the complex dielectric function, as demonstrated in ref. 81. The momentum matrix elements determine the computation of these functions through evaluations of electronic transitions within all permitted states between occupied and unoccupied states.82,83 The material's electrical polarization response appears in the real part, while dielectric loss from energy absorption appears in the imaginary part.84,85 The static dielectric constant evaluation for TlPbI3 reveals a value of 4.6 at zero energy level through Fig. 3(c). The ability of a material to protect against electric fields influences the recombination speed of charge carriers in optoelectronic devices, and this strength appears as the value of the static dielectric constant. Higher dielectric constants tend to slow down recombination processes to produce better device functionality. When the photon energy reaches UV levels, the real part of the dielectric function decreases until it reaches negative values. The material displays metallic reflective characteristics in the energy span between 8 and 13 eV when its value transitions to negative values. The observed multiple peaks in the visible and UV range support this behavior. As photon energy rises in Fig. 3(c), the real part shows distinct peak patterns representing energy losses which occur when electrons transition from valence band peaks to conduction band valleys. The optical behavior of the material becomes more pronounced through its prominent peak at 4.00 eV in the imaginary part. The semiconducting properties of TlPbI3 match those of metal materials according to its band structure and density of states analysis.84
The evaluation of photon energy dissipation from interactions between materials and electromagnetic waves depends on the energy loss function L(ω) whose graph shows energy variation as presented in Fig. 3(d). L(ω) reveals the loss of energy that occurs inside materials. The energy loss function L(ω) shows minimal change before photon energies begin to elevate the values. The energy loss curve advances towards the X-axis until it meets the band gap energy of TlPbI3 that measures about 2 eV. After the energy loss function reaches the band gap level of 3 eV, it achieves its peak at 16 eV.
The plasmon energy emerges as a specific trait of the substance that creates collective oscillations of charge carriers known as plasma oscillations. Strong coupling occurs between the material and the electromagnetic field when both the absorption coefficient and reflectivity decrease at this specific energy level. Laboratory experiment results indicate that Fig. 3(e) shows the reflectivity spectrum R(ω) for TlPbI3 material. The reflectance peaks emerge at 4.00 eV, while 11.5 eV stands as the second peak, and both peaks have reflectance values of 0.32 and 0.34. The material displays effective light absorption due to its low reflectance values according to these data.86
A graph in Fig. 3(f) shows the complex parameter of refractive index. It is also a frequency or energy-dependent function. It can also be expressed as:81
| N(ω) = n(ω) + ik(ω) | (30) |
The electromagnetic energy attenuation rate within materials is measured through k(ω), which represents the imaginary component of complex N(ω). The real part n(ω) controls the electromagnetic wave's phase velocity and establishes the amount of light refraction when the substance is traversed.87 The visible spectrum shows that the real part of the refractive index achieves its maximum strength because photon energies remain low during this time. The refractive index value for TlPbI3 reaches 2.9 at the photon energy of 2.10 eV. Due to its favorable light spectrum response, TlPbI3 demonstrates great promise to be used as an optoelectronic device material.88
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| Fig. 4 Diagram depicting the band diagram of (a) FTO/CdS/TlPbI3, (b) FTO/In2S3/TlPbI3, and (c) FTO/SnS2/TlPbI3 structure. | ||
| Parameters | Terms | TlPbI3 | CdS8,90,91 | In2S3 (ref. 8, 92 and 93) | SnS2 (ref. 94–96) | FTO57,60,97 |
|---|---|---|---|---|---|---|
| t (nm) | Thickness | 1250 | 75 | 75 | 75 | 50 |
| Eg (eV) | Band gap | 1.26 | 2.4 | 2.1 | 2.24 | 3.6 |
| χ (eV) | Electron affinity | 3.75 | 4.2 | 4.65 | 4.24 | 4.5 |
| εr | Dielectric (relative) permittivity | 4.66 | 10 | 13.5 | 10 | 10 |
| NC (1 cm−3) | CB effective density of states | 6.701 ×1018 | 2.2× 1018 | 1.8× 1019 | 2.2 × 1018 | 2 ×1018 |
| NV (1 cm−3) | VB effective density of states | 1.424 ×1019 | 1.8× 1019 | 4 × 1013 | 1.8 × 1019 | 1.8 ×1019 |
| µh (cm2 V−1 s −1) | Hole mobility | 75.90 | 25 | 210 | 50 | 20 |
| µn (cm2 V−1 s −1) | Electron mobility | 91.90 | 100 | 400 | 50 | 100 |
| ND (1 cm−3) | Hallow uniform donor density | 0 | 1 ×1016 | 1 ×1016 | 1 × 1016 | 1 × 1017 |
| NA (1 cm−3) | Shallow uniform acceptor density | 1 ×1016 | 0 | 0 | 0 | 0 |
| Nt (1 cm−3) | Defect density | 1 × 1014 | 1 × 1014 | 1 × 1014 | 1 × 1014 | 1 ×1014 |
| Interface | Parameters | ||||||
|---|---|---|---|---|---|---|---|
| Energy with respect to reference Er (eV) | Working temperature (K) | Capture cross-section holes σh (cm2) | Capture cross-section electrons σe (cm2) | Total defect density | Energetic distribution | Type of defect | |
| TlPbI3/CdS | 0.6 | 300 | 1 × 10−19 | 1 × 10−19 | 1010 | Single | Neutral |
| TlPbI3/In2S3 | 0.6 | 300 | 1 × 10−19 | 1 × 10−19 | 1011 | Single | Neutral |
| TlPbI3/SnS2 | 0.6 | 300 | 1 × 10−19 | 1 × 10−19 | 1010 | Single | Neutral |
In PSC architecture, the absorber layer is interfaced with ETL, which often possesses differing band gaps and electron affinities. These disparities can result in unfavorable band alignments at the interfaces, such as spike-type offsets that hinder carrier extraction or cliff-type offsets that enhance interfacial recombination. Both scenarios compromise carrier dynamics and significantly limit device performance.98 In the FTO/CdS/TlPbI3 configuration, Fig. 4(b), the conduction band offset (CBO) between TlPbI3 and CdS is nearly flat, minimizing band discontinuity and enabling efficient electron transport with negligible recombination losses. The large valence band offset (VBO) acts as an effective hole-blocking barrier, enhancing charge separation. The TlPbI3 absorber (1.26 eV bandgap) ensures strong light absorption, CdS (2.40 eV bandgap) facilitates electron extraction, and the FTO layer (3.60 eV bandgap) offers excellent transparency and conductivity. For the FTO/In2S3/TlPbI3 structure, Fig. 4(c), a large negative CBO forms a “cliff” at the interface, impeding electron transport and increasing recombination, though the significant VBO effectively prevents hole leakage. Despite this limitation, proper Fermi level alignment maintains charge separation. In contrast, the FTO/SnS2/TlPbI3 system, Fig. 4(d), exhibits a moderately negative CBO and strong VBO, balancing charge transport and recombination suppression. SnS2 (2.24 eV bandgap) provides superior transparency and electron mobility, emerging as a promising ETL alternative. Overall, all configurations display favorable band bending and charge transfer characteristics, with CdS and SnS2 offering optimal alignment for efficient and stable device performance.
Fig. 5(a) illustrates the variation of VOC as a function of absorber layer thickness (0.25–2.0 µm) for TlPbI3-based perovskite solar cells employing three different ETLs: CdS (Device 1), In2S3 (Device 2), and SnS2 (Device 3). Across all absorber thicknesses, Device 1 demonstrates the highest VOC values, ranging from 0.786 V at 0.25 µm to a nearly constant 0.799 V for absorber thicknesses ≥ 2.0 µm. This indicates stable performance with minimal dependence on absorber thickness. Device 3 also exhibits comparably high VOC values, starting from 0.781 V at 0.25 µm and stabilizing at 0.794 V beyond 1.0 µm. In contrast, Device 2 consistently shows the lowest VOC, with values confined to the range of 0.559–0.563 V across all thicknesses. Overall, CdS delivers the best performance in terms of VOC stability and magnitude, while SnS2 emerges as a promising alternative to replace CdS due to its comparable performance. In contrast, In2S3 exhibits clear limitations as an ETL for TlPbI3-based perovskite solar cells.
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| Fig. 5 Effects of absorber layer thickness on PV characteristics: (a) VOC, (b) JSC, (c) FF, and (d) PCE. | ||
Fig. 5(b) presents the variation of JSC as a function of absorber layer thickness (0.25–2.0 µm) for TlPbI3-based perovskite solar cells using three different ETLs. All three devices exhibit a similar increasing trend in JSC with absorber thickness, which is expected since thicker absorbers enhance light absorption and photo generation until saturation is reached. At 0.25 µm, Device 1 produces a JSC of 20.59 mA cm−2, while Device 2 and Device 3 achieve slightly higher values of 21.01 and 20.82 mA cm−2, respectively. With increasing absorber thickness, JSC steadily improves, reaching 28.32–28.39 mA cm−2 at 0.50 µm and 31.79–31.87 mA cm−2 at 0.75 µm for all devices. At absorber thicknesses of 1.0 µm and beyond, JSC shows diminishing improvements, indicating the onset of optical absorption saturation. Specifically, JSC stabilizes at about 35.5–35.7 mA cm−2 for thicknesses above 1.75 µm across all devices. Overall, the results confirm that absorber thickness plays a critical role in maximizing JSC up to 1.25 µm, beyond which current density saturates. The near-identical performance of CdS, In2S3, and SnS2 with respect to JSC implies that all three ETLs are capable of facilitating efficient electron extraction once sufficient photo generation is achieved.
Fig. 5(c) illustrates the dependence of FF on absorber thickness (0.25–2.0 µm) for TlPbI3-based perovskite solar cells using all three different ETLs. Across the entire range of absorber thicknesses, Device 1 exhibits the highest FF, remaining remarkably stable around 80.3–80.9%. Device 3 also shows consistently high FF values, though slightly lower than CdS, with values ranging from 77.6–78.4%. By contrast, Device 2 performs significantly worse, with FF values between 48.5–50.4%, nearly 30% lower than the CdS-based device. Overall, CdS remains the most effective ETL in terms of FF optimization, while SnS2 demonstrates competitive performance as a potential non-toxic alternative. However, In2S3 shows severe limitations as an ETL due to its inability to sustain a high fill factor, regardless of absorber thickness.
Fig. 5(d) illustrates the variation in PCE (η) of TlPbI3-based perovskite solar cells as a function of absorber thickness (0.25–2.0 µm) when employing three different ETLs. At a thin absorber thickness of 0.25 µm, the CdS and SnS2-based devices exhibit relatively high efficiencies of 13.08% and 12.74%, respectively, whereas the In2S3-based device shows a much lower efficiency of 5.92%. As the absorber thickness increases, the PCE improves significantly for all devices due to enhanced light absorption and photocurrent generation. At 0.50 µm thickness, CdS reaches 18.14%, SnS2 achieves 17.49%, and In2S3 only reaches 7.89%. Beyond 0.75 µm, the efficiency growth begins to saturate, indicating that most of the incident light is already absorbed. At 1.0 µm thickness, CdS, SnS2, and In2S3 devices achieve PCE values of 21.58%, 20.75%, and 9.24%, respectively. A further increase to 2.0 µm results in near-saturation efficiencies of 22.90% (CdS), 22.01% (SnS2), and 9.72% (In2S3). Overall, Device 1 demonstrates the highest efficiency across all absorber thicknesses, maintaining a consistent advantage over SnS2 and a clear superiority over In2S3. Device 3 follows closely, with only ∼0.5–1% lower efficiency compared to CdS, making it a competitive non-toxic alternative. Device 2, however, consistently underperforms due to its poor VOC and FF, achieving less than half the efficiency of CdS and SnS2-based devices. This analysis highlights that CdS remains the most optimized ETL for TlPbI3-based perovskite solar cells, while SnS2 emerges as a strong replacement candidate. In2S3, despite being non-toxic, exhibits severe limitations in performance and requires further optimization to be viable.
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| Fig. 6 Effects of absorber layer doping density on PV characteristics: (a) VOC, (b) JSC, (c) FF, and (d) PCE. | ||
Fig. 6(b) illustrates the effect of absorber doping concentration (1012–1018 cm−3) on the JSC of TlPbI3-based solar cells with CdS (Device 1), In2S3 (Device 2), and SnS2 (Device 3) as ETLs. At low to moderate doping concentrations (1012–1015 cm−3), all devices maintain nearly constant JSC values, with Device 1 and Device 3 showing ∼34.9 mA cm−2 and Device 2 slightly lower at ∼34.6–34.8 mA cm−2. This indicates efficient carrier generation and transport with minimal recombination losses in the absorber layer within this doping range. As the doping concentration increases beyond 1016 cm−3, JSC begins to decline significantly for all devices. At 1017 cm−3, JSC reduces to 32.3 mA cm−2 for all devices, and further decreases to 28.3–28.6 mA cm−2 at 1018 cm−3. The reduction in JSC at high doping levels can be attributed to enhanced Auger recombination and reduced carrier diffusion lengths, which limit charge extraction. Comparatively, all three ETLs exhibit similar JSC behavior, with only minor variations across the doping range. CdS and SnS2 show nearly identical performance, while In2S3 remains marginally lower at lower doping levels but converges at higher doping concentrations.
Fig. 6(c) shows the variation of the FF of solar cell devices employing CdS, In2S3, and SnS2 as ETLs with absorber doping concentrations ranging from 1012 to 1018 cm−3. For the CdS-based device, FF starts at 76.2% between 1012 and 1013 cm−3 and remains nearly unchanged up to 1014 cm−3, after which it gradually increases to 78.5% at 1015 cm−3, 80.4% at 1016 cm−3, and reaches a peak of 82.7% at 1018 cm−3, indicating consistently high FF values with moderate improvement at higher doping levels. In contrast, the In2S3-based device exhibits the lowest FF, beginning at 43.6% up to 1014 cm−3 and then rising progressively to 45.0% at 1015 cm−3, 48.9% at 1016 cm−3, 52.6% at 1017 cm−3, and 63.4% at 1018 cm−3; although it shows significant improvement with higher doping, it still underperforms compared to CdS and SnS2 devices. Meanwhile, the SnS2-based device records an FF of 73.5% at low doping (1012 cm−3), which remains stable up to 1014 cm−3 before gradually increasing to 75.8% at 1015 cm−3, 77.7% at 1016 cm−3, 78.5% at 1017 cm−3, and 80.4% at 1018 cm−3, thereby demonstrating performance comparable to CdS, particularly at higher doping levels.
Fig. 6(d) illustrates the dependence of PCE on absorber doping concentration for perovskite solar cells using CdS, In2S3, and SnS2 as ETLs, with doping varied from 1012 to 1018 cm−3. The CdS-based device consistently achieves the highest efficiency, starting at 21.0% at low doping (1012–1013 cm−3), peaking at 22.2% at 1016 cm−3, and then declining to 21.1% at 1017 cm−3 and 19.6% at 1018 cm−3, indicating an optimum performance around 1016 cm−3. In contrast, the In2S3-based device shows the lowest efficiency throughout, beginning at 8.47% at 1012 cm−3 and gradually increasing to 9.47% at 1016 cm−3 before reaching a maximum of 10.5% at 1018 cm−3; although it improves steadily with doping, its overall performance remains significantly lower. The SnS2-based device starts at 20.2% efficiency at low doping, close to CdS but slightly lower, increases to a maximum of 21.3% at 1016 cm−3, and then decreases to 20.4% at 1017 cm−3 and 18.9% at 1018 cm−3, showing a similar trend to CdS where excessive doping reduces efficiency. This highlights the crucial importance of controlling and minimizing defect concentrations to maintain superior device performance and ensure long-term operational efficiency.101
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| Fig. 7 Effects of absorber layer defect density on PV characteristics: (a) VOC, (b) JSC, (c) FF, and (d) PCE. | ||
Fig. 7(b) shows the dependence of the JSC on bulk defect concentration (1010–1016 cm−3) for three perovskite solar cell architectures employing CdS (Device 1), In2S3 (Device 2), and SnS2 (Device 3) as ETLs. In the low-to-moderate defect regime (1010–1014 cm−3), all three devices exhibit highly stable JSC values, with minimal variation. Specifically, Device 1 and Device 3 consistently deliver 34.6 mAcm−2, while Device 2 records a slightly lower but comparable value of 34.5 mAcm−2. These results indicate that carrier extraction efficiency and photo generation remain largely unaffected by moderate increases in defect density for all ETL configurations. A noticeable reduction in JSC is observed only at very high defect concentrations (≥1015 cm−3). At 1015 cm−3, JSC decreases slightly to 34.15 mAcm−2 (CdS), 34.25 mAcm−2 (In2S3), and 34.35 mAcm−2 (SnS2). The degradation becomes more significant at 1016 cm−3, where Device 1 drops to 32.5 mAcm−2, Device 2 to 31.6 mAcm−2, and Device 3 to 32.6 mAcm−2. The decline in JSC at these extreme defect densities can be attributed to enhanced bulk recombination pathways, which suppress charge collection and reduce photocurrent output. Comparative analysis reveals that CdS and SnS2 maintain slightly higher JSC values compared to In2S3, both under low-defect and high-defect conditions. This suggests that CdS and SnS2 facilitate more efficient electron transport and mitigate recombination losses more effectively than In2S3.
Fig. 7(c) presents the dependence of the FF on bulk defect concentration in the range of 1010–1016 cm−3 for perovskite solar cells employing three different ETLs. At low defect densities (1010–1013 cm−3), Devices 1 and 3 exhibit consistently high FF values above 78%, with CdS maintaining 80.6% and SnS2 sustaining 78.0%. In2S3, however, shows a significantly lower FF (49.7%) across this defect regime, indicating less efficient charge extraction and higher series or recombination losses compared to CdS and SnS2. As defect concentration increases beyond 1014 cm−3, all devices experience a gradual decline in FF. For Device 1, FF decreases from 80.4% at 1014 cm−3 to 78.4% at 1015 cm−3, followed by a sharper drop to 68.8% at 1016 cm−3. Device 3 follows a similar trend, falling from 77.7% at 1014 cm−3 to 75.6% at 1015 cm−3, and further to 66.0% at 1016 cm−3. In contrast, Device 2 shows a more dramatic degradation: FF falls from 48.9% at 1014 cm−3 to 43.7% at 1015 cm−3, and finally collapses to just 30.5% at 1016 cm−3. Overall, CdS emerges as the most robust ETL in terms of FF stability, followed closely by SnS2, while In2S3 shows poor performance across all defect levels.
Fig. 7(d) illustrates the variation of PCE with defect concentration (1010–1016 cm−3) for perovskite solar cells using three different ETLs. At low to moderate defect densities (1010–1013 cm−3), both CdS and SnS2 devices demonstrate high and stable PCEs, with Device 1 maintaining 22.3–22.4% and Device 3 achieving 21.5%. In contrast, Device 2 records a significantly lower efficiency of 9.6%, reflecting its weaker electronic compatibility and higher recombination losses compared to the other ETLs. As the defect density increases, all devices exhibit a decline in PCE due to enhanced non-radiative recombination within the perovskite bulk. For CdS-based devices, PCE decreases gradually from 22.2% at 1014 cm−3 to 21.1% at 1015 cm−3, before dropping sharply to 16.6% at 1016 cm−3. SnS2 devices show a similar trend, decreasing from 21.3% at 1014 cm−3 to 20.2% at 1015 cm−3, and reaching 15.9% at 1016 cm−3. In2S3 devices experience the steepest efficiency degradation, falling from 9.5% at 1014 cm−3 to 8.3% at 1015 cm−3, and collapsing to only 5.3% at 1016 cm−3. In summary, CdS and SnS2 provide robust efficiency outcomes under varying defect conditions, with CdS slightly superior in both stability and overall PCE.
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| Fig. 8 Effects on PV performance parameters (VOC, JSC, FF, and PCE) for changing the ETL layers (a) thickness, (b) doping density, (c) defect density. | ||
Fig. 8(b) illustrates the effect of ETL doping concentration (1012–1018 cm−3) on the photovoltaic performance parameters of TlPbI3-based perovskite solar cells employing three different ETLs in three devices. Across all devices, the JSC remains essentially constant at 34.5–34.6 mAcm−2, indicating that carrier generation and collection are unaffected by ETL doping concentration within the studied range. Instead, variations in performance are predominantly governed by changes in FF and, consequently, PCE. For Device 1, VOC remains stable at 0.799 V throughout the entire doping range, while FF gradually increases from 80.2% at 1012 cm−3 to 83.1% at 1018 cm−3. This enhancement in FF leads to a corresponding improvement in PCE from 22.1% to 23.0%. In contrast, Device 2 remains the weakest performer across all doping concentrations. VOC is significantly lower (0.563 V) and does not change with doping. While FF improves modestly from 48.8% at 1012 cm−3 to 50.4% at 1018 cm−3, the maximum PCE achieved is only 9.8%. Device 3 shows a similar trend, with VOC stable around 0.794 V and FF improving from 77.6% at 1012 cm−3 to 80.6% at 1018 cm−3. As a result, the PCE increases from 21.3% to 22.2%. Although slightly lower than CdS, SnS2 demonstrates robust and consistent performance, confirming its suitability as an alternative ETL. Overall, both CdS and SnS2 devices benefit from increased doping, achieving stable PCE values above 22%, whereas In2S3 remains unsuitable despite slight improvements.
Fig. 8(c) depicts the influence of ETL defect concentration (1010–1016 cm−3) on the photovoltaic characteristics of TlPbI3-based perovskite solar cells using three different ETLs. For Device 1, performance remains largely stable at lower defect densities (≤1013 cm−3), with VOC maintained at 0.799 V, JSC at 34.6 mAcm−2, FF at 80.4%, and PCE 22.2%. However, as defect concentration increases to 1015–1016 cm−3, a gradual decline is observed. At 1016 cm−3, FF drops to 78.8%, and PCE decreases slightly to 21.7%, although VOC and JSC are still relatively stable. In contrast, Device 2 consistently exhibits the lowest performance across all defect levels. At low defect density (1010 cm−3), VOC is limited to 0.563 V, JSC to 34.5 mAcm−2, FF 49.7%, and PCE 9.7%. With increasing defect concentration, the deterioration becomes significant: at 1015 cm−3, FF falls to 43.7%, and PCE drops to 8.3%; at 1016 cm−3, VOC decreases to 0.552 V, JSC falls sharply to 31.6 mAcm−2, FF reduces to 30.5%, and PCE plummets to only 5.3%. Device 3 follows a similar pattern. At low-to-moderate defect concentrations (≤1013 cm−3), performance is stable with VOC 0.796 V, JSC 34.6 mAcm−2, FF 77.8–78.0%, and PCE 21.5%. As defects increase beyond 1014 cm−3, VOC drops to 0.779 V, JSC reduces slightly to 34.4 mAcm−2, and FF decreases to 75.6%, resulting in a PCE decline to 20.2%. At the highest defect density (1016 cm−3), more severe degradation occurs, with VOC reduced to 0.740 V, JSC down to 32.6 mAcm−2, FF falling to 66.0%, and PCE dropping to 15.9%. This demonstrates that SnS2 is more sensitive to ETL defect density than CdS, particularly at very high defect concentrations. In summary, both CdS and SnS2 are relatively defect-tolerant ETLs for TlPbI3 solar cells, maintaining stable performance at low-to-moderate defect densities, with CdS showing the highest robustness. However, SnS2 becomes increasingly sensitive at defect concentrations beyond 1014 cm−3, while In2S3 exhibits poor tolerance to ETL defects across the entire range, resulting in severe efficiency degradation.
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| Fig. 9 Effects on PV performance parameters for changing the interface defect density between (a) absorber/device 1(CdS), (b) absorber/device 2(In2S3), and (c) absorber/device 3(SnS2). | ||
Fig. 9(b) illustrates the effect of interface defect concentration on the photovoltaic parameters-PCE, VOC, JSC, and FF-for Device 2 employing In2S3 as the ETL. The defect density was varied from 1010 to 1016 cm−3. At the lowest defect density (1010cm−3), the device achieves a PCE of 9.47%, with a VOC of 0.563 V, JSC of 34.5 mAcm−2, and a relatively low FF of 48.9%. Interestingly, as the defect concentration increases up to 1014 cm−3, the FF exhibits a steady improvement, rising from 48.9% to 68.7%. In contrast, VOC consistently decreases across the entire range, from 0.563 V to 0.251 V. The JSC remains essentially constant at 34.5 mAcm−2. The overall PCE follows a declining trend beyond 1012 cm−3, dropping from 9.47% to 5.84% at the highest defect density. The initial stability in PCE despite the drop in VOC is due to the compensatory effect of the increasing FF; however, once defect densities exceed 1014 cm−3, the decline in VOC dominates, leading to significant performance deterioration. These results emphasize that In2S3-based ETLs exhibit a different defect response compared to conventional ETLs: while moderate defect levels can improve FF, excessive defect concentrations critically reduce VOC and overall PCE.
Fig. 9(c) illustrates the variation of photovoltaic parameters of the TlPbI3-based perovskite solar cell employing SnS2 as the ETL, with respect to the interface defect concentration at the ETL/perovskite junction, from 1010 cm−3 to 1016 cm−3, and its impact on PCE, VOC, JSC, and FF was systematically analyzed. At a low defect concentration of 1010 cm−3, the device achieved its optimal performance with a PCE of 21.3%, accompanied by a VOC of 0.794 V, JSC of 34.6 mAcm−2, and FF of 77.7%. As the defect concentration increased, a pronounced decline in device performance was observed, primarily driven by reductions in both VOC and PCE. For instance, when the defect density increased to 1013 cm−3, the PCE decreased to 14.0%, with VOC reduced to 0.538 V, while JSC remained unaffected at 34.6 mAcm−2 and FF slightly decreased to 75.1%. At the highest defect density of 1016 cm−3, the degradation was most severe: the PCE dropped to 6.25%, VOC diminished drastically to 0.281 V, and FF reduced to 64.2%, whereas JSC was almost unchanged. Overall, the figure demonstrates that the photovoltaic performance of the SnS2-based device is highly sensitive to interfacial defect density. Maintaining a low interface defect concentration is therefore essential to preserving high VOC and FF, thereby ensuring efficient device operation.
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| Fig. 10 (a) Current density–voltage (J–V) characteristic and (b) quantum efficiency (QE) spectrum of the CdS, In2S3, and SnS2 ETL-based solar cell under standard illumination conditions. | ||
Fig. 10(b) presents the External Quantum Efficiency (EQE) spectra of TlPbI3-based perovskite solar cells incorporating three distinct ETLs: CdS (Device 1), In2S3 (Device 2), and SnS2 (Device 3), across the 300–1000 nm range. The EQE spectra provide direct insight into the wavelength-dependent photo response of the devices and the effectiveness of ETL selection in facilitating photo-generated carrier collection. All devices exhibit high photo response in the UV-visible region (300–800 nm), with EQE values nearing unity (95–100%), indicating efficient photon-to-electron conversion by the TlPbI3 absorber and effective carrier extraction by the ETLs. Among them, Device 1 demonstrates the highest EQE across the spectrum, maintaining nearly flat, near 100% efficiency between 350–800 nm, reflecting superior electron mobility and minimal recombination at the CdS/perovskite interface. Device 2 shows slightly lower EQE, particularly beyond 700 nm, suggesting moderate recombination losses due to imperfect band alignment. Device 3 exhibits the weakest response, with EQE dropping sharply past 700 nm, indicating higher interfacial recombination and reduced charge transport efficiency. All spectra decline beyond 850 nm, reaching zero near 1000 nm, consistent with the TlPbI3 bandgap (1.26 eV). The stronger spectral response of CdS devices corresponds to higher JSC and overall power conversion efficiency. These results confirm that ETL choice critically impacts carrier collection, with CdS offering optimal band alignment and minimal recombination losses for superior device performance.
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| Fig. 11 The effect of temperature on the photovoltaic performance of the (a) Device 1(CdS), (b) Device 2(In2S3), and (c) Device 3(SnS2). | ||
Fig. 11(a) illustrates the influence of temperature on the photovoltaic parameters of the TlPbI3-based perovskite solar cell employing CdS as the ETL (Device 1). The results reveal a clear temperature-dependent trend in device performance. The PCE exhibits a maximum value of 22.4% at 280 K and decreases steadily with rising temperature, reaching 17.8% at 400 K, primarily due to reductions in the VOC and FF. The VOC shows a nearly linear decline from 0.826 V at 280 K to 0.648 V at 400 K, consistent with enhanced non-radiative recombination and increased saturation current density at elevated temperatures. In contrast, the JSC demonstrates a slight upward trend, increasing from 34.4 to 34.8 mA cm−2 across the same temperature range, which can be attributed to improved charge carrier mobility and reduced resistive losses at higher thermal energies. The FF initially rises from 78.6% at 280 K to a peak of 81.3% around 330–340 K, suggesting improved carrier extraction at moderate temperatures, but subsequently declines to 79.0% at 400 K due to recombination and resistive effects. Overall, the analysis indicates that Device 1 achieves optimal performance in the low-temperature region (280–300 K), where high VOC and stable FF values sustain efficiencies above 22%. However, at elevated temperatures, efficiency degradation becomes evident, emphasizing the thermal sensitivity of CdS-based TlPbI3 perovskite solar cells and the need for strategies to enhance stability under operational conditions.
Fig. 11(b) presents the temperature-dependent photovoltaic characteristics of the TlPbI3-based perovskite solar cell using In2S3 as the ETL (Device 2). Unlike Device 1, this device shows an improvement in overall performance with increasing temperature. The PCE gradually rises from 9.17% at 280 K to 10.7% at 400 K, primarily driven by enhancements in the FF and JSC. The FF exhibits a significant and nearly linear increase from 47.3% at 280 K to 55.4% at 400 K, indicating better charge extraction and reduced series resistance at elevated temperatures. Similarly, JSC increases slightly from 34.3 to 34.7 mA cm−2, reflecting improved carrier mobility. In contrast, the VOC shows a slow but consistent decline, decreasing from 0.565 V at 280 K to 0.555 V at 400 K, which is consistent with enhanced recombination at higher temperatures. Despite this reduction in VOC, the positive contributions from FF and JSC dominate, leading to the observed rise in efficiency.
Fig. 11(c) illustrates the variation of photovoltaic parameters of the TlPbI3-based perovskite solar cell employing SnS2 as the ETL (Device 3) under different operating temperatures. The PCE starts at 21.3% at 280 K, reaching a maximum of 21.4% near 290 K, before showing a gradual decline with increasing temperature, dropping to 17.7% at 400 K. This reduction is primarily attributed to the continuous decrease in VOC, which decreases monotonically from 0.816 V at 280 K to 0.648 V at 400 K, reflecting increased non-radiative recombination losses at elevated temperatures. The JSC, on the other hand, shows a slight but steady increase with temperature, rising from 34.4 mA cm−2 at 280 K to 34.8 mA cm−2 at 400 K, which indicates enhanced carrier mobility and photo generation under thermal excitation. The FF improves initially from 75.9% at 280 K to around 79.9% at 340–360 K, before stabilizing and exhibiting a minor decline at higher temperatures, finishing at 78.5% at 400 K. Despite the modest improvement in JSC and FF, the sharp decline in VOC dominates the device behavior, resulting in the observed drop in PCE at elevated temperatures. These results highlight that while SnS2-based devices exhibit strong efficiency at low to moderate temperatures, their thermal stability is limited by voltage losses, suggesting the necessity of further optimization for stable operation under high-temperature conditions.
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| Fig. 12 Effects on PV performance parameters for changing the series and shunt resistance (a) VOC, (b) JSC, (c) FF, and (d) PCE of device 1(CdS) for the best-optimized framework. | ||
Fig. 12(b) shows the dependence of the JSC of the TlPbI3-based perovskite solar cell with CdS as the ETL (Device 1) on Rs and Rsh. The 3D bar chart indicates that JSC is highly sensitive to shunt resistance at very low values but remains remarkably stable once Rsh exceeds 200 Ω cm2. At Rsh = 0 Ω cm2 and Rs = 0 Ω cm2, the JSC is at its maximum (34.6 mA cm−2). However, when Rs is introduced under the same low Rsh condition, JSC drops drastically to negligible values (10−9–10−6 mA cm−2), reflecting severe recombination and leakage current pathways. In contrast, as Rsh increases to 200 Ω cm2 and beyond, JSC recovers significantly, maintaining values in the range of 33.3–34.6 mA cm−2 across the Rs sweep (0–7 Ω cm2). Further increments in Rsh (400–1400 Ω cm2) stabilize JSC around 34.2–34.6 mA cm−2, showing only minor dependence on Rs. This behavior highlights that shunt resistance primarily governs JSC in Device 1, with minimal sensitivity to series resistance at practical operating conditions. The results demonstrate the robustness of CdS-based devices in preserving photocurrent density, provided shunt leakage is minimized, which is crucial for achieving high PCE.
Fig. 12(c) illustrates the variation of the FF of the TlPbI3-based perovskite solar cell employing CdS as the ETL (Device 1) with respect to both Rs and Rsh. The results reveal that FF is strongly dependent on both parameters, unlike VOC, which was relatively stable. At very low shunt resistance (Rsh = 0 Ω cm2), the FF is completely suppressed (0%), reflecting severe leakage current losses. As Rsh increases to 200 Ω cm2, the FF recovers significantly, reaching values between 53.7% and 72.2%, depending on the corresponding Rs. Further increases in Rsh lead to a steady improvement in FF, with the values reaching 79.2% at Rsh = 1400 Ω cm2 and Rs = 0 Ω cm2. However, the influence of Rs becomes apparent across all Rsh values: at higher Rs, FF decreases gradually due to resistive losses, dropping from 79.2% at Rs = 0 Ω cm2 to 55.5% at Rs = 7 Ω cm2 (when Rsh = 1400 Ω cm2). This behavior indicates that minimizing both series resistance and shunt leakage is crucial for maintaining a high FF. Overall, Device 1 shows strong resilience at moderate to high Rsh values, with FF saturating near 78–79% when Rs is minimized, underscoring the importance of contact quality and resistance optimization in achieving high device performance.
Fig. 12(d) illustrates the effect of varying Rs and Rsh on the PCE of Device 1. The 3D bar chart clearly shows that PCE is highly sensitive to both resistive parameters. At very low shunt resistance (Rsh = 0 Ω cm2), the PCE is essentially zero regardless of the series resistance, reflecting strong leakage pathways that dominate device performance. As Rsh increases to 200 Ω cm2, the PCE improves significantly, reaching values between 14.2% and 19.8%, depending on the Rs value. With further increases in Rsh up to 1400 Ω cm2, the PCE continues to improve, stabilizing in the range of 15.2% to 21.9%. The series resistance also influences the efficiency trend. At low Rs (0–1 Ω cm2), the PCE reaches its maximum values, peaking around 21.9% for Rsh = 1400 Ω cm2. However, as Rs increases to 7 Ω cm2, the PCE declines notably, dropping to 15.2% even at high Rsh. This indicates that higher series resistance limits charge transport and reduces overall device performance. In summary, the figure demonstrates that Device 1 achieves optimal efficiency under conditions of low series resistance and high shunt resistance, where charge extraction is maximized, and leakage losses are minimized. The highest PCE (21.9%) is achieved at Rs = 0 Ω cm2 and Rsh ≥ 1200 Ω cm2, while efficiency steadily decreases with increasing Rs or decreasing Rsh.
Fig. 13(a) for Device 2 employing In2S3 ETL illustrates the variation of VOC as a function of both Rs and Rsh. The data show that at very low shunt resistance (Rsh = 0 Ω cm2), VOC is almost negligible (3.45 × 10−8 V), which reflects strong leakage current suppressing voltage generation. However, as Rsh increases to 200 Ω cm2, VOC sharply improves to around 0.548–0.549 V, and further rises with increasing Rsh. At higher values of Rsh (≥400 Ω cm2), VOC stabilizes in the range of 0.556–0.561 V, showing only minimal changes with further increases in resistance. Interestingly, series resistance has almost no significant effect on VOC across the entire range; the bars remain nearly constant for each Rsh level, indicating that VOC is mainly governed by Rsh rather than Rs. The maximum VOC observed is approximately 0.561 V, achieved at Rs = 0–7 Ω cm2 and Rsh ≥ 1200 Ω cm2. In summary, this figure demonstrates that VOC in Device 2 is strongly dependent on shunt resistance, with higher Rsh values suppressing leakage currents and thereby allowing VOC to reach its maximum stable value (0.56 V). Conversely, series resistance does not play a major role in VOC performance for this device.
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| Fig. 13 Effects on PV performance parameters for changing the series and shunt resistance (a) VOC, (b) JSC, (c) FF, and (d) PCE of device 2(In2S3) for the best-optimized framework. | ||
Fig. 13(b) for Device 2 demonstrates the variation of the JSC as a function of both Rs and Rsh. The results indicate that JSC is relatively less sensitive to Rs and Rsh compared to other photovoltaic parameters like VOC and FF, but noticeable trends are still observed. At very low Rsh = 0 Ω cm2, JSC drops drastically, with values collapsing from 34.5 mA cm−2 (at Rs = 0 Ω cm2) to almost negligible levels (4.9 × 10−6 mA cm−2 at Rs = 7 Ω cm2). This sharp decline highlights that low shunt resistance causes severe leakage current, leading to significant current loss. As Rsh increases to 200 Ω cm2, JSC improves substantially, ranging from 34.5 mA cm−2 at Rs = 0 Ω cm2 to 32.1 mA cm−2 at Rs = 7 Ω cm2. This demonstrates that higher series resistance slightly reduces current extraction efficiency, but the effect is moderate compared to the shunt resistance influence. For higher Rsh values (400–1400 Ω cm2), JSC remains relatively stable, ranging between 34.5 and 32.9 mA cm−2 across the Rs range. The maximum JSC (34.5 mA cm−2) is observed at low Rs (0 Ω cm2) and high Rsh (≥400 Ω cm2), while the lowest values (32.9 mA cm−2) occur at high Rs (7 Ω cm2), even when Rsh is large. In summary, Fig. 13(b) shows that JSC in Device 2 is strongly suppressed by very low shunt resistance due to leakage pathways. Once Rsh exceeds 200 Ω cm2, JSC becomes more stable and only slightly decreases with increasing Rs.
Fig. 13(c) for Device 2 illustrates the effect of both Rs and Rsh on the FF. The data reveal that FF is highly sensitive to variations in both Rs and Rsh. At a very low shunt resistance (Rsh = 0 Ω cm2), the FF remains at 0%, indicating that strong leakage pathways prevent efficient power conversion. As Rsh increases to 200 Ω cm2, FF rises significantly, ranging from about 47.2% (at Rs = 0 Ω cm2) down to 28.8% (at Rs = 7 Ω cm2). This demonstrates that higher series resistance degrades FF even when shunt resistance is moderately high. Further increases in Rsh (400–1400 Ω cm2) lead to an improvement and stabilization of FF values. For low Rs (0–1 Ω cm2), FF achieves its highest values of 48.6%, reflecting efficient device performance. However, at higher Rs (6–7 Ω cm2), FF saturates at 28.7%, showing that excessive series resistance strongly limits fill factor regardless of Rsh improvements. In summary, Fig. 13(c) shows that FF in Device 2 improves with increasing shunt resistance, reaching maximum values above 48% for low series resistance. However, as series resistance increases, FF rapidly decreases, highlighting that while high shunt resistance suppresses leakage and improves efficiency, minimizing series resistance is critical for maintaining high FF.
Fig. 13(d) for Device 2 illustrates the variation of PCE with respect to both series resistance (Rs) and shunt resistance (Rsh). This 3D plot highlights the combined influence of parasitic resistances on overall device efficiency. At a very low shunt resistance (Rsh = 0 Ω cm2), the PCE collapses completely (0%), regardless of Rs. This indicates that leakage currents dominate, preventing any useful power generation. When Rsh increases to 200 Ω cm2, the PCE improves significantly, ranging from 8.92% at Rs = 0 Ω cm2 to 5.07% at Rs = 7 Ω cm2. This clearly shows that higher series resistance reduces efficiency due to resistive losses in current transport. For higher Rsh values (400–1400 Ω cm2), PCE continues to rise and eventually stabilizes. At low Rs (0 Ω cm2), maximum PCE values are obtained, reaching 9.39%. As Rs increases, PCE gradually decreases: for instance, at Rs = 7 Ω cm2, PCE drops to 5.3%, even when Rsh is high. Overall, the figure demonstrates that Device 2 achieves its best performance (PCE ≈ 9.39%) under the condition of high Rsh (≥800 Ω cm2) and very low Rs (0–1 Ω cm2). On the other hand, poor shunt resistance or excessive series resistance strongly reduces efficiency.
Fig. 14(a) for Device 3 employing SnS2 ETL illustrates the dependence of the VOC on both Rs and Rsh. At Rsh = 0 Ω cm2, the device VOC is practically zero (3.46 × 10−8 V), indicating complete leakage losses, which is expected in the absence of shunt resistance. However, once Rsh increases to 200 Ω cm2, VOC rises sharply to 0.789 V and remains nearly constant as Rs increases from 0 to 7 Ω cm2. As Rsh continues to increase (400–1400 Ω cm2), VOC further improves, reaching 0.794 V, with only a slight positive shift across higher Rsh values. Importantly, changes in Rs have almost no impact on VOC, as all bars across the Rs axis remain at nearly the same height. Overall, this figure demonstrates that shunt resistance rather than series resistance dominates VOC in Device 3. Once Rsh is sufficiently high (≥600 Ω cm2), VOC stabilizes around 0.794 V, reflecting efficient charge separation and minimal recombination. The consistently high VOC values also highlight the good intrinsic quality of Device 3 compared to other devices.
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| Fig. 14 Effects on PV performance parameters for changing the series and shunt resistance (a) VOC, (b) JSC, (c) FF, and (d) PCE of device 3(SnS2) for the best-optimized framework. | ||
Fig. 14(b) presents the variation of the JSC of Device 3 as a function of Rs and Rsh. At Rsh = 0 Ω cm2, JSC shows abnormal behavior: while the first data point at Rs = 0 Ω cm2 gives a value of 34.6 mA cm−2, subsequent values drop drastically to negligible levels (in the order of 10−5 to 10−6 mA cm−2). This indicates severe current leakage through the device at zero shunt resistance, which prevents efficient charge collection. With increasing Rsh (≥200 Ω cm2), JSC stabilizes at significantly higher values. For example, at Rsh = 200 Ω cm2, JSC ranges from 34.6 mA cm−2 (Rs = 0 Ω cm2) to 33.3 mA cm−2 (Rs = 7 Ω cm2). The general trend shows a gradual decrease in JSC with rising Rs, consistent with the expected effect of ohmic losses that hinder current extraction. As Rsh increases further, JSC approaches saturation. At Rsh = 600 Ω cm2, the JSC values remain in the range of 34.6–34.1 mA cm−2, while at the maximum studied Rsh of 1400 Ω cm2, JSC becomes nearly constant, varying only slightly between 34.6 mA cm−2 (Rs = 0 Ω cm2) and 34.3 mA cm−2 (Rs = 7 Ω cm2). This behavior indicates that once the shunt resistance is sufficiently high, leakage pathways are minimized, and JSC is mainly determined by intrinsic photo generation and carrier collection efficiency. Overall, Fig. 14(b) demonstrates that JSC is strongly dependent on Rsh at low values, but becomes nearly independent once Rsh exceeds 600 Ω cm2. In contrast, increasing Rs consistently reduces JSC, although the effect is relatively minor compared to that of Rsh.
Fig. 14(c) illustrates the variation of the FF of Device 3 as a function of both Rs and Rsh. At Rsh = 0 Ω cm2, the FF is zero across all values of Rs, indicating complete current leakage and the absence of diode functionality in the device under this condition. Once Rsh increases to 200 Ω cm2, the FF rises significantly, reaching values between 70.1% (at Rs = 0 Ω cm2) and 51.8% (at Rs = 7 Ω cm2). This strong dependence highlights the critical role of shunt resistance in suppressing leakage pathways and improving the device's rectifying behavior. As Rsh continues to increase, the FF improves further. For instance, at Rsh = 600 Ω cm2, FF values range from 75.2% (Rs = 0 Ω cm2) to 53.0% (Rs = 7 Ω cm2), while at the highest examined Rsh of 1400 Ω cm2, FF stabilizes around 76.6% (Rs = 0 Ω cm2) and 53.4% (Rs = 7 Ω cm2). These results clearly indicate that higher shunt resistance significantly enhances FF, though the positive effect diminishes once Rsh exceeds 800 Ω cm2. On the other hand, increasing Rs consistently reduces FF, with the decline being more pronounced at lower Rsh values. For example, at Rsh = 200 Ω cm2, the FF decreases from 70.1% at Rs = 0 Ω cm2 to only 51.8% at Rs = 7 Ω cm2. Even at higher Rsh values, this negative influence of Rs persists, reflecting its impact on series ohmic losses, which limit current extraction and PCE. In summary, Fig. 14(c) demonstrates that the FF of Device 3 is highly sensitive to both Rs and Rsh.
Fig. 14(d) illustrates the dependence of the PCE of Device 3 on variations in Rs and Rsh. The results demonstrate the strong sensitivity of PCE to both resistive parameters, highlighting their combined effect on device performance. At Rsh = 0 Ω cm2, the device shows complete suppression of efficiency (0%) across all Rs values, which is attributed to severe current leakage and the inability of the cell to sustain charge separation under these conditions. As Rsh increases to 200 Ω cm2, PCE improves significantly, ranging from 19.1% at Rs = 0 Ω cm2 to 13.6% at Rs = 7 Ω cm2. Further improvements are observed with increasing Rsh. At 600 Ω cm2, PCE rises to 20.6% (Rs = 0 Ω cm2) but gradually decreases with higher Rs, reaching 14.3% at Rs = 7 Ω cm2. This trend persists across higher Rsh values, with the highest efficiency obtained at Rsh = 1200–1400 Ω cm2, where PCE stabilizes at 21.0% (Rs = 0 Ω cm2). Even under these optimal conditions, PCE diminishes progressively with Rs, dropping to 14.5% at the maximum Rs of 7 Ω cm2. Overall, the figure reveals that Rsh plays a more dominant role than Rs in governing device efficiency. Increasing Rsh beyond 800 Ω cm2 leads to marginal improvements, suggesting that the device approaches saturation in suppressing leakage losses. In contrast, the negative influence of Rs remains consistent across all Rsh values, with higher Rs steadily degrading performance due to enhanced resistive losses. This analysis confirms that Device 3 achieves its maximum efficiency of 21.0% under conditions of low Rs (≤1 Ω cm2) and high Rsh (≥1200 Ω cm2). These results emphasize that optimizing both series and shunt resistances is essential to attaining high-performance TlPbI3-based perovskite solar cells.
Table 5 compares the photovoltaic performance of the proposed TlPbI3-based solar cells with reported perovskite devices. The FTO/CdS/TlPbI3/Cu structure shows the best performance, achieving a PCE of 22.20% with JSC = 34.56 mAcm−2, VOC = 0.7987 V, and FF = 80.40%. The FTO/SnS2/TlPbI3/Cu device also delivers a high efficiency of 21.34%, while the In2S3-based configuration exhibits a much lower PCE of 9.47% due to its reduced fill factor. Compared with reported CsPbI3, MAPbI3, and perovskite QD-based solar cells (PCE = 6.54–17.82%), the proposed TlPbI3 devices demonstrate superior current density and overall efficiency, underscoring the effectiveness of CdS and SnS2 as ETLs. It should be noted that the reported photovoltaic efficiencies are theoretical values predicted by the SCAPS-1D simulation under the assumed model parameters and optimized conditions, and therefore, they represent simulated device potential rather than experimentally demonstrated performance.
| Structure | VOC (V) | JSC (mA cm−2) | FF (%) | PCE (%) | Ref. |
|---|---|---|---|---|---|
| FTO/CdS/TlPbI3/Cu | 0.7987 | 34.56 | 80.40 | 22.20 | This work |
| FTO/In2S3/TlPbI3/Cu | 0.5626 | 34.46 | 48.86 | 9.47 | This work |
| FTO/SnS2/TlPbI3/Cu | 0.7941 | 34.57 | 77.74 | 21.34 | This work |
| ITO/WS2/CsPbI3/CBTS/Au | 0.997 | 20.98 | 85.22 | 17.82 | 103 |
| FTO/TiO2/CsPbI3/PTAA/Au | 1.084 | 19.72 | 75.70 | 16.07 | 103 |
| FTO/SnO2/MAPbI3/Spiro-OMeTAD/Au | 1.023 | 21.19 | 67.8 | 14.69 | 104 |
| Perovskite QDSSC (CH3NH3PbI3/TiO2) | 0.706 | 15.82 | 0.586 | 6.54 | 105 |
In practical applications, however, the actual device performance may be lower than the simulated values due to several non-ideal factors, including imperfect film quality, higher bulk and interface defect densities, trap-assisted recombination, contact resistance, unfavorable band alignment, and environmental or thermal instability during fabrication and operation. Moreover, achieving high-quality TlPbI3 absorber layers with controlled stoichiometry and low defect concentration may be experimentally challenging, which can further limit the photovoltaic performance of real devices.
200 samples in total, with 14
400 data points for each device architecture. Model accuracy was assessed using R2, RMSE, and MAE, which collectively reflect predictive precision and error magnitude. These metrics were computed using five-fold cross-validation, and the averaged values were reported to ensure a robust and unbiased evaluation of predictive performance. In addition, an 80
:
20 train-test split was employed to generate the actual-versus-predicted plots and related visual diagnostics, thereby providing a clear assessment of model generalization on unseen data. For transparency and reproducibility, the complete dataset has also been provided in the SI.
| Device | Model | R2 | RMSE | MAE |
|---|---|---|---|---|
| TlPbI3–CdS | Random forest | 0.99944128 | 0.09597836 | 0.0512535 |
| Gradient boosting | 0.90257883 | 1.26925004 | 0.99339494 | |
| Decision tree | 0.99965233 | 0.07503562 | 0.01707186 | |
| LightGBM | 0.99107396 | 0.38432883 | 0.28891486 | |
| TlPbI3–In2S3 | Random forest | 0.99970416 | 0.06408461 | 0.03248777 |
| Gradient boosting | 0.91537953 | 1.08466669 | 0.83863286 | |
| Decision tree | 0.99979735 | 0.05123015 | 0.00829792 | |
| LightGBM | 0.9920475 | 0.33272488 | 0.25447979 | |
| TlPbI3–SnS2 | Random forest | 0.99940735 | 0.0945991 | 0.05153306 |
| Gradient boosting | 0.90967126 | 1.16968848 | 0.90770556 | |
| Decision tree | 0.99930062 | 0.1010263 | 0.01988236 | |
| LightGBM | 0.99143124 | 0.36003949 | 0.27640629 |
Among the tested algorithms, the decision tree model consistently achieved the highest accuracy (R2 ≈ 0.9993–0.9998) with the lowest RMSE and MAE, indicating near-perfect prediction capability. Random Forest performed similarly well (R2 > 0.9994), demonstrating excellent generalization and stability across all devices. In contrast, Gradient Boosting showed markedly lower accuracy (R2 ≈ 0.90–0.91; RMSE ≈ 1.08–1.26; MAE ≈ 0.83–0.99), likely reflecting overfitting or inadequate hyperparameter optimization. LightGBM achieved intermediate results (R2 ≈ 0.991–0.992; RMSE ≈ 0.33–0.38; MAE ≈ 0.25–0.28), outperforming Gradient Boosting but lagging behind the top-performing tree-based models. Device-wise, the TlPbI3–In2S3 configuration demonstrated the greatest predictive consistency across all algorithms, while TlPbI3–SnS2 exhibited slightly higher LightGBM and Gradient Boosting errors, possibly due to greater data variability or complex feature interactions. Overall, the findings highlight the superior capability of Decision Tree and Random Forest models in capturing non-linear dependencies between material features and device efficiency, confirming their reliability for data-driven modeling of TlPbI3-based photovoltaic systems.
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| Fig. 15 Actual vs. predicted PCE using (a) random forest, (b) gradient boosting, (c) decision tree, and (d) lightGBM models for TlPbI3–CdS-based device. | ||
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| Fig. 16 Actual vs. predicted PCE using (a) random forest, (b) gradient boosting, (c) decision tree, and (d) lightGBM models for TlPbI3–In2S3-based device. | ||
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| Fig. 17 Actual vs. predicted pce using (a) random forest, (b) gradient boosting, (c) decision tree, and (d) lightGBM models for TlPbI3–SnS2-based device. | ||
In Fig. 15, the random forest and decision tree models (top-left and bottom-left) show nearly perfect alignment along the diagonal line, indicating very accurate predictions. In contrast, gradient boosting (top-right) and lightGBM (bottom-right) exhibit slight dispersion around the line, suggesting minor prediction errors.
For Fig. 16 showing the TlPbI3–In2S3-based device, similar trends appear. The random forest and decision tree again show almost ideal one-to-one relationships, while gradient boosting reveals noticeable deviations at lower PCE values. LightGBM performs better than gradient boosting but still shows a wider spread than the tree-based models.
Finally, in Fig. 17, both random forest and decision tree maintain excellent prediction accuracy with a clean diagonal fit. gradient boosting and lightGBM show improved alignment compared to the In2S3 device, but still deviate slightly from the ideal line, particularly at extreme PCE values.
Overall, across all devices, random forest and decision tree provide the most precise predictions with minimal error, while gradient boosting and lightGBM display moderate variability. These results suggest that simpler ensemble methods perform more consistently for predicting PCE in TlPbI3-based devices.
In Fig. 18, among the features, doping, defect, and bandgap show the strongest impact on the model outputs across all four methods. Their wide spread along the x-axis means that changes in these features cause larger shifts in predictions. On the other hand, features like hole mobility and thickness have smaller spreads, suggesting they have less influence. The decision tree and random forest plots look more scattered, showing that these models produce a wider range of feature effects. Gradient boosting and lightGBM appear more compact, reflecting their smoother and more stable learning process.
In Fig. 19, the random forest and decision tree models, SHAP values are symmetrically distributed around zero, reflecting stable and interpretable relationships between predictors and outcomes. Gradient boosting and lightGBM show broader SHAP dispersions, suggesting more complex, non-linear dependencies between variables. High doping and bandgap values typically contribute positively to PCE, whereas lower electron affinity and mobility values reduce model output.
For Fig. 20, across all models, doping, defect density, and bandgap exhibit the strongest and most consistent effects on PCE, followed by electron affinity and film thickness. Electron and hole mobility show smaller yet stable contributions. The Random Forest and Decision Tree plots demonstrate balanced distributions around zero, implying stable predictions and interpretability. Gradient Boosting and LightGBM reveal wider spreads in SHAP values, suggesting more complex non-linear effects. High doping and bandgap values positively affect predicted efficiency, while higher defect density and low mobility tend to reduce it.
Overall, these SHAP plots help us see which material properties are most important for predicting the device's behavior. They also show how different models learn and emphasize various aspects of the data, helping researchers understand and improve model performance for the TlPbI3–CdS, TlPbI3–In2S3, and TlPbI3–SnS2 systems.
Across all models and TlPbI3-based devices, doping concentration consistently emerges as the most influential feature, with importance values between 0.43 and 0.46, particularly in the TlPbI3–In2S3 system. The dominance underscores doping's critical role in tuning electronic structure and carrier density, directly affecting PCE. Bandgap and defect density follow as key parameters, influencing light absorption and recombination dynamics, while electron affinity, carrier mobilities, and thickness exhibit lower importance, suggesting a more indirect effect on device efficiency. Among the models, random forest and gradient boosting show the highest feature sensitivity and consistency, emphasizing doping, bandgap, and defect density with nearly identical weighting trends. LightGBM distributes feature importance more evenly, while decision tree highlights a narrower set of dominant variables. These variations reflect differences in model learning behavior—ensemble methods capture repetitive predictive features, whereas boosting models focus on cumulative refinement. Overall, the heatmap confirms that electronic properties—especially doping, bandgap, and defect density—govern PCE prediction accuracy more strongly than structural factors. These findings demonstrate the robustness of tree-based ensemble models in identifying physically meaningful parameters for optimizing TlPbI3-based perovskite solar devices and guiding efficient material design strategies.
In addition to achieving high predictive accuracy, the machine-learning analysis offers insight beyond that obtainable from conventional parameter sweeping. Unlike sweep-based analysis, which mainly reveals trends by varying one parameter at a time, the ML models learn the coupled and nonlinear relationships among multiple device parameters and their collective effect on PCE. The SHAP analysis further strengthens this interpretation by quantifying the relative contribution and directional influence of each feature, thereby highlighting the key physical factors controlling device performance in the investigated TlPbI3-based solar cells. Moreover, the trained models provide a fast predictive platform for estimating performance under new parameter combinations without repeated SCAPS calculations, making device optimization and design-space exploration more efficient.
Supplementary information (SI) is available. See DOI: https://doi.org/10.1039/d6ra01288d.
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