Open Access Article
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Optical anisotropy induced by ultra-strong interfacial coupling in CVD-grown WSe2/ReSe2 vertical heterostructures

Yong Guo a, Xiaofei Yue*ab, Jiajun Chenb, Qingqing Nieb, Chenxu Shengb, Haoyu Wanga, Yongsheng Qina, Xuechao Liuc, Siqi Lina, Le Fanga, Miaosen Yanga, Zhijun Qiub, Min Jin*a and Chunxiao Cong*b
aCollege of Materials, Shanghai Dianji University, Shanghai 201306, China. E-mail: xf-yue@sdju.edu.cn; jmaish@aliyun.com
bSchool of Information Science and Technology, Fudan University, Shanghai 200433, China. E-mail: cxcong@fudan.edu.cn
cState Key Laboratory of Functional Crystals and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China

Received 24th October 2025 , Accepted 10th December 2025

First published on 5th January 2026


Abstract

Integrating high-mobility isotropic transition metal dichalcogenides (TMDs) with anisotropic layered materials offers an ideal strategy to break through the application bottleneck of a single material. Van der Waals assembly has proven a direct route to realize anisotropic heterostructures for polarization-sensitive electronics and photoelectronics, yet conventional methods typically rely on artificial stacking of TMD materials with varying symmetries. This approach not only limits the efficiency of fabrication but also yields poor interfacial coupling, resulting in weak anisotropy in heterostructures. Here, we directly grow high-quality monolayer WSe2 on low-symmetry monolayer ReSe2 to fabricate WSe2/ReSe2 vertical heterostructures by NaCl-assisted chemical vapor deposition (CVD). Angle-resolved polarization Raman spectroscopy confirms that the isotropic WSe2 exhibits pronounced in-plane optical anisotropy upon combining with low-symmetry ReSe2, which is attributed to the intrinsic symmetry breaking of WSe2 induced by ultra-strong interlayer coupling between WSe2 and ReSe2. Notably, the pronounced photoluminescence (PL) quenching and shortened exciton lifetime of WSe2 provide direct evidence of ultra-strong interfacial coupling in the CVD-grown WSe2/ReSe2 vertical heterostructures. Consequently, this study demonstrates the pivotal role of interfacial coupling in achieving high-degree anisotropy in TMD heterostructures, offering a new design paradigm for polarization-sensitive electronics and optoelectronics.


1 Introduction

Two-dimensional (2D) van der Waals (vdW) transition metal dichalcogenides (TMDs) have attracted particular attention owing to their tunable bandgaps, excellent electronics and optoelectronic performance, and wafer-scale manufacturability.1–4 However, most reported TMDs are high-symmetry crystals that exhibit in-plane isotropy, which fundamentally limits their prospects in applications demanding polarization-sensitive electronic and photonic responses.5–7 At the same time, low-symmetry TMDs such as ReSe2 and ReS2 exhibit pronounced anisotropy, making them promising for polarization applications.8,9 Nevertheless, the intrinsically modest carrier mobility and the formidable challenge of wafer-scale synthesis of these anisotropic TMDs are currently limiting their transition from laboratory demonstrations to industrial applications.10,11

Recently, constructing TMDs with distinct properties into heterostructures has proven an effective means to extend and modulate the intrinsic properties of individual TMDs,12,13 advancing the development of multifunctional integrated devices. In light of this, symmetry engineering via vdW heterostructures is rapidly becoming a key strategy for tailoring the anisotropic properties of TMDs,14,15 offering a practical route toward polarization-sensitive light emission and detection.16,17 Particularly, assembling heterostructures of anisotropic and high-mobility isotropic TMDs is expected to fully exploit the performance advantage of each component.14,18 Previous studies have shown that the anisotropic characteristics in the isotropic/anisotropic TMDs heterostructures can be both tuned and transmitted through interlayer coupling.19,20 However, the fabrication of such isotropic/anisotropic heterostructures typically relies on the artificial stacking of different TMDs materials through dry or wet transfer methods.17,19,20 On the one hand, these approaches inevitably introduces contaminants at the interface and may even damage the materials.21 On the other hand, this transfer-assembled heterostructures usually exhibit poor interfacial coupling,19,22 leading to a weak anisotropy. Therefore, establishing isotropic/anisotropic TMD-based heterostructures with robust interfacial coupling is the critical first step toward unlocking TMDs for high-performance polarization-sensitive applications.

In this study, we prepare high-quality WSe2/ReSe2 vertical heterostructures in a one-step chemical vapor deposition (CVD) process, and further reveal their ultra-strong interfacial coupling through temperature-dependent and time-resolved photoluminescence (PL) spectroscopy. Angle-resolved polarization Raman spectroscopy confirms the inherent in-plane optical anisotropy of as-grown monolayer ReSe2. As expected, the CVD-grown WSe2/ReSe2 vertical heterostructures exhibit pronounced optical anisotropy manifested through WSe2 Raman modes, which stems from the symmetry breaking of WSe2 induced by ultra-strong interfacial coupling with low-symmetry ReSe2. Meanwhile, the absence of such anisotropy in the mechanically-assembled WSe2/ReSe2 heterostructure further confirms that the robust interfacial coupling is essential for symmetry engineering. Consequently, one-step-grown isotropic/anisotropic TMD-based heterostructures offer an effective strategy to polarization-sensitive optoelectronic devices. Furthermore, our findings also provide valuable insights of interfacial coupling on anisotropy engineering.

2 Experimentals

2.1 Sample fabrication and structure characterization

Monolayer ReSe2 and WSe2/ReSe2 vertical heterostructures were grown through NaCl-assisted CVD method. Specifically, WO3 power was first thermally evaporated onto a sacrificial SiO2/Si substrate to form a uniform film of 9 nm. 50 mg Re power was dispersed in 20 ml ethanol solution, and the upper suspension was dripped onto the WO3 film surface, followed by drying at 80 °C for 5 min. Subsequently, a single NaCl crystal (∼0.01 mg) was placed on the sacrificial substrate, while a clean SiO2/Si growth substrate was mounted face-to-face on the sacrificial substrate. This entire stack was loaded into the central heating zone of tube furnace, while Se power (200 mg) was arranged in the edge heating zone of the quartz tube. Argon (100 sccm) was continuously supplied as the carrier gas throughout the entire growth process. The central zone was heated to 935 °C and the edge zone to 240 °C over 60 min, subsequently both zones were held at their maximum temperatures for 10 min. After reaching the set temperatures, a brief 2 min H2 (5 sccm) was introduced, and the furnace was then allowed to cool naturally to room temperature.

The surface morphology and thickness of prepared WSe2/ReSe2 vertical heterostructures were characterized using an NX10 atomic force microscope (AFM) (Park, Korea). No-contact AFM imaging was performed with an AC160TS probe (resonance frequency 270.8 kHz) in tapping mode, using an automated step-scan at 1.0 Hz with 512 × 512 pixel resolution.

2.2 Optical measurements

Raman and PL measurements were conducted using a confocal Raman microscopy system (WITec Alpha 300R) under a 532 nm laser excitation. The 1800 lines per mm and 150 lines per mm gratings were used to collect Raman and PL spectra, respectively. A 100× objective lens (Zeiss, N.A. = 0.9) was employed for room-temperature measurements. For low temperature in situ PL measurements, samples were mounted inside the chamber of a multifunctional system with liquid helium refrigeration (CRYO Industries of America, Inc), enabling cooling from 300 K to 10 K. Particularly, the lens was switched to a 50× long-focus objective (Zeiss, N.A. = 0.55), while the sample chamber was maintained at a high vacuum level of 10−3 Pa. For angle-resolved polarization Raman measurements, samples were installed at the center of a rotating platform and tuned from 0° to 180°, with a spectrum acquisition every 15° under both parallel and crossed polarization configurations.

3 Results and discussions

Fig. 1 presents the fabrication process of the WSe2/ReSe2 vertical heterostructures by space-confined CVD technique. Fig. 1a shows the schematic diagram of the CVD tube furnace, where Se precursor is placed in the left heating zone, while WO3 and Re precursors are placed in the right heating zone. Considering the ultra-high melting point of Re (>3000 °C), a NaCl-assisted strategy was employed to achieve monolayer ReSe2 growth. Fig. S1 provides the comparative optical images of WSe2/ReSe2 heterostructures grown with and without NaCl assistance. Specifically, during the CVD growth process, the introduction of NaCl auxiliaries not only lowers the reaction temperature, but also simultaneously increases the precursor supersaturation and the density of nucleation points.23,24 Fig. 1b and c depict the growth mechanism of the WSe2/ReSe2 vertical heterostructure. When the Se and Re precursors are heated to their target temperatures, the ReSe2 molecular clusters first nucleate and grow into irregular shapes on the SiO2/Si substrate surface. Subsequently, as the WO3 precursor reaches its set temperature, the WSe2 molecular clusters further nucleate on the surface of the existing ReSe2 and gradually grow into triangular shapes. Fig. 1d and e show the optical images of the as-grown ReSe2 film and WSe2/ReSe2 heterostructures, respectively. Particularly, the successful preparation of the heterostructures combining isotropic WSe2 with anisotropic ReSe2, offering an idea platform to investigate the intrinsic anisotropic properties in vertically stacked heterostructures.
image file: d5ra08161k-f1.tif
Fig. 1 Fabrication process of the WSe2/ReSe2 vertical heterostructures by NaCl-assisted CVD method. (a) The schematic diagram of the CVD tube furnace for WSe2/ReSe2 heterostructures growth. (b) and (c) The growth mechanism of the WSe2/ReSe2 vertical heterostructure. (d) Optical image of the as-grown monolayer ReSe2 film. (e) Optical image of the as-grown WSe2/ReSe2 vertical heterostructures.

We first conducted structural and optical characterization for the vertical WSe2/ReSe2 heterostructures. Fig. S2 provides the AFM scanning images and corresponding height profiles. Here, the boundary between the underlying ReSe2 and the substrate is clearly visible, while the triangular shape of the top-layer WSe2 can also be observed. The ReSe2 flake shows a thickness of approximately 1.3 nm, consistent with a monolayer characteristics on SiO2/Si substrates. The top WSe2 layer was scanned more precisely, exhibiting a height of approximately 0.8 nm, which is highly close to the theoretical thickness of monolayer WSe2. These results confirm the successful formation of WSe2/ReSe2 bilayer vertical heterostructures. Furthermore, we also extracted the RMS roughness from the high-solution AFM image of the as-grown WSe2/ReSe2 heterostructure, obtaining Sq = 0.0007 µm and Sa = 0.0006 µm. Such sub-nanometer roughness suggests an exceptionally flat interface. Fig. 2a shows the Raman spectrum of the monolayer ReSe2 under a 532 nm laser excitation. Due to the low-symmetry crystal structure, theory predicts that there are 18 Raman modes in monolayer ReSe2,25 which is rarely observed in most transition metal dichalcogenides.26 To obtain the accurate vibration frequency of each Raman mode, we performed detailed Lorentzian fitting for all Raman peaks, as shown by the colored dotted lines in Fig. 2a. According to the fitted results, 17 Raman modes can be successfully identified in the as-grown monolayer ReSe2. Table S1 summarizes the fitted frequencies of the 17 Raman modes and compares them with the calculated values. The minute differences between experiment and theory confirm the excellent crystal quality of the as-grown monolayer ReSe2. On the other hand, we also notice that only 16 Raman modes were experimentally observed in the ref. 25. This suggests that the finite spectral resolution may limit the extraction of all 18 Raman modes. Fig. 2b further compares the Raman spectra of as-grown monolayer ReSe2, monolayer WSe2, and WSe2/ReSe2 vertical heterostructure. Two prominent Raman modes E12g (247.8 cm−1) and A1g (256.7 cm−1) of WSe2 are observed in the heterostructure region, which are individually assigned to the in-plane and out-of-plane vibration of W and Se atoms.26 The inset shows a uniform Raman image of the heterostructure obtained by integrating the intensity of E12g mode, indicating that the top-layer WSe2 retains a pristine lattice quality. Compared with standalone monolayer WSe2, the E12g mode exhibits a slight redshift, whereas the A1g mode undergoes a pronounced redshift in the heterostructure region. Particularly, in TMDs heterostructures, the in-plane vibration (E12g) is known to be relatively insensitive to the interfacial interaction, while A1g mode is highly sensitive to interlayer coupling due to its out-of-plane vibrational characteristic. Consequently, the marked shift of the A1g peak provides compelling evidence for effective interfacial coupling within the WSe2/ReSe2 heterostructure. In addition, these weak Raman peaks originating from underlying ReSe2 are observed as well, which further confirms the formation of hetero-stacked structure.


image file: d5ra08161k-f2.tif
Fig. 2 Optical characterization of the CVD-grown monolayer ReSe2, monolayer WSe2, and WSe2/ReSe2 vertical heterostructures. (a) Raman spectrum of the as-grown monolayer ReSe2 with detailed Lorentzian fitted peaks (colored dotted lines). (b) Comparison of Raman spectra between the monolayer ReSe2, monolayer WSe2, and WSe2/ReSe2 vertical heterostructure, the inset shows a spatial intensity map generated by integrating the E12g peak of WSe2. (c) PL spectra of the WSe2/ReSe2 vertical heterostructure measured at 300 K and 10 K, together with the spectrum (300 K) obtained after 1064 nm laser irradiation treatment (The red star marks the laser-irradiated region). (d) Time-resolved PL measurements of the standalone monolayer WSe2 and WSe2/ReSe2 heterostructure. (e) The schematic diagram of interfacial charge transfer in the WSe2/ReSe2 vertical heterostructures.

In typical bilayer TMDs heterostructures, the interaction between two components mainly depends on the interfacial coupling,22,27 for which strong interlayer coupling is highly desired. Therefore, we further conducted PL spectroscopy measurements for the as-grown WSe2/ReSe2 heterostructures to evaluate the interlayer coupling strength, as shown in Fig. 2c. It is well known that monolayer WSe2 exhibits strong PL emission at room temperature due to its direct bandgap feature (∼1.6 eV).28 In stark contrast, the PL emission of WSe2 is completely quenched in the as-grown WSe2/ReSe2 heterostructures at both 300 K and 10 K, as indicated by the black and pink lines in Fig. 2c. We preliminarily attribute this pronounced quenching to two possibilities: (i) in as-grown monolayer WSe2, a high density of defects (such as vacancies and dislocations) may act as non-radiative recombination centers, significantly reducing the radiative recombination efficiency of photo-generated carriers; (ii) ultrafast interlayer charge transfer occurs due to the type-II band alignment formed between WSe2 and ReSe2, causing significant PL quenching.29 To verify the above deduction, we employed a 1064 nm infrared laser to perform localized heating for the CVD-grown WSe2/ReSe2 heterostructure. Through high-power irradiation, the underlying ReSe2 was effectively removed (see the inset in Fig. 2c), which enables in situ monitoring of the WSe2 PL emission before and after ReSe2 removal. Interestingly, once the ReSe2 layer is removed, the isolated monolayer WSe2 recovers strong PL emission even at room temperature, as depicted by the purple trace. This finding strongly indicates that the as-grown monolayer WSe2 possesses excellent lattice quality, thus ruling out the possibility that high density defects are responsible for the observed PL quenching in WSe2/ReSe2 heterostructures. Furthermore, we also provided more direct experimental evidence, as depicted in Fig. 2d. We conducted time-resolved PL measurements to compare the A-exciton lifetime of WSe2 in the heterostructure with that of the standalone monolayer WSe2. According to the fitting results, the A-exciton of monolayer WSe2 exhibits a lifetime of ∼313 ps, whereas the lifetime is reduced to ∼160 ps in the heterostructure region. This pronounced shortening provides direct evidence of efficient interlayer charge transfer at the WSe2/ReSe2 interface.

Consequently, we can reasonably conclude that the PL quenching behavior occurred in WSe2/ReSe2 heterostructures originates from high-efficiency interlayer charge transfer.29,30 As illustrated in Fig. 2e, upon 532 nm laser excitation, the photo-generated electrons are first excited to the conduction band minimum (CBM) of WSe2, and subsequently transfer to the CBM of ReSe2 in an extremely short time scale. Simultaneously, the photo-generated holes transfer from the valence band maximum (VBM) of ReSe2 to that of WSe2, leading to electron–hole separation across the two layers. Notably, such efficient interfacial charge transfer usually necessitates strong interlayer coupling between the constituent layers of heterostructures.22,31 The experimental findings collectively support the conclusion that the as-grown WSe2/ReSe2 heterostructures possess robust interfacial coupling strength.

It should be noted that in most cases the PL quenching induced by interlayer charge transfer is incomplete, intralayer exciton emission from the constituent layers can still be detected at low temperatures.32,33 In this present study, however, no intralayer exciton signal from WSe2 is observed even at 10 K, providing further evidence for exceptionally strong interfacial coupling. In addition, the absence of interlayer exciton emission at low temperature is mainly ascribed to momentum mismatch.34 Specifically,in the WSe2/ReSe2 heterostructure, interlayer exciton emission originates from the recombination of electrons at CBM of ReSe2 and holes at VBM of WSe2. Theoretical studies show that the CBM of monolayer ReSe2 is located at the Γ point of the Brillouin zone,35 whereas the VBM of monolayer WSe2 lies at the K point.36 This momentum-space mismatch greatly suppresses the probability of radiative recombination between spatially separated electrons and holes.34

As is well known, monolayer WSe2 is intrinsically intralayer isotropic, whereas monolayer ReSe2 is a typical intralayer anisotropic material. The strong interlayer coupling demonstrated here in the CVD-grown WSe2/ReSe2 heterostructures therefore provides an ideal platform for probing how ReSe2 anisotropy modulates WSe2 properties. Fig. S3a presents the polarized Raman spectra of the monolayer ReSe2 collected in both parallel (XX) and crossed (XY) configurations. Notice that some Raman modes exhibit pronounced intensity difference in two configurations. This is due to the Raman intensity being determined by the Raman tensors of vibration modes and the incident and scattered light polarization vectors.37,38 Particularly, each ReSe2 vibration mode possesses a definite symmetry that dictates its Raman tensor non-zero elements, while the contribution of these elements to the scattered intensity is selectively weighted by the polarization configurations.37,38 Fig. S3b shows the polarized Raman spectra of the WSe2/ReSe2 heterostructure recorded in two configurations. Clearly, two vibration modes of WSe2 exhibit distinct polarization responses: the E12g intensity drops markedly in the crossed configuration, whereas A1g intensity remains almost unchanged.

Moreover, we performed the angle-resolved polarization Raman measurements of the monolayer ReSe2. The sample is rotated from 0° to 180°, with a spectrum acquisition every 15° in both parallel and crossed configurations. The evolution of the polarized Raman spectra (XX) of the monolayer ReSe2 is shown in Fig. 3a, while the corresponding intensity color map is provided in Fig. 3b for better visualization of the angle dependence of each phonon mode. For XX configuration, the frequencies of various Raman modes in monolayer ReSe2 exhibit little change with angles, whereas their intensities present pronounced angle dependence, demonstrating the high in-plane anisotropy of our as-grown monolayer ReSe2. To quantitatively characterize the anisotropy characteristic of ReSe2, we preformed detailed lorentzian fitting for the angle-resolved polarized Raman spectra to extract the intensity of each mode. Considering the 17 observed Raman-active modes are all first-order Ag symmetry, we primarily focused on two prominent peaks at 123 cm−1 and 173 cm−1. The normalized intensities of the two modes as a function of rotation angle are presented in the polar diagrams of Fig. 3c and d, respectively. Clearly, the intensities of the ReSe2 Raman modes at 123 cm−1 and 173 cm−1 vary periodically with rotation angle, with a period close to 90°. Owing to the different basis functions of the Ci point group, not all Raman modes exhibit a 90° period,39 for example, the 261 cm−1 mode shows a ∼180° periodicity (see Fig. 3b). In addition, Fig. S4 presents the angle-resolved Raman responses of the as-grown monolayer ReSe2 under XY polarization configuration. Similarly, the intensities of the 123 cm−1 and 173 cm−1 Raman modes exhibit significant angle dependence, which further indicates the strong in-plane anisotropy of monolayer ReSe2.


image file: d5ra08161k-f3.tif
Fig. 3 Polarization Raman measurements of the CVD-grown monolayer ReSe2, monolayer WSe2, and WSe2/ReSe2 vertical heterostructure. (a) Angle-resolved polarized Raman spectra of the as-grown monolayer ReSe2 under parallel configuration. (b) The Raman intensity color map corresponding to (a). (c) and (d) The normalized Raman intensities of ReSe2 123 cm−1 and 173 cm−1 modes as a function of rotation angle. (e) Angle-resolved polarized Raman spectra of the as-grown monolayer WSe2 under parallel configuration. (f) The Raman intensity color map corresponding to (e). (g) and (h) The normalized Raman intensities of WSe2 E12g and A1g modes as a function of rotation angle. (i) Angle-resolved polarized Raman spectra of the as-grown WSe2/ReSe2 vertical heterostructure under parallel configuration. (j) The Raman intensity color map corresponding to (i). (k) and (l) In WSe2/ReSe2 heterostructure, the normalized Raman intensities of WSe2 E12g and A1g modes as a function of rotation angle.

Fig. 3e displays the evolution of the polarized Raman spectra (XX configuration) of the as-grown monolayer WSe2, while the corresponding intensity color map is provided in Fig. 3f. The normalized intensities of the E12g and A1g modes versus rotation angle are plotted in the polar diagrams of Fig. 3g and h. As expected, no obvious periodic variation is observed, consistent with the isotropic nature of monolayer WSe2. Based on the preceding evidence for ultra-strong interlayer coupling in our CVD-grown WSe2/ReSe2 heterostructures, we anticipate that the pronounced in-plane anisotropy of ReSe2 may induce a measurable anisotropy in the top-layer WSe2. To verify the deduction, we further conducted angle-resolved polarization Raman measurements of the as-grown WSe2/ReSe2 heterostructures. Fig. 3i presents the angle-resolved polarized Raman spectra of the WSe2/ReSe2 heterostructure under parallel configuration, with the corresponding intensity color map shown in Fig. 3j. The WSe2 E12g mode exhibits a pronounced period intensity modulation, whereas the A1g signal is too weak for its periodicity to be directly observed. Likewise, lorentzian fitting was employed to extract the angle-dependent intensities of E12g and A1g modes, whose normalized results are displayed in the polar diagrams of Fig. 3k and l, respectively. Interestingly, the two Raman modes of WSe2 exhibit a consistent ∼90° period, while the E12g mode demonstrates a stronger angle dependence relative to the A1g mode. Particularly, E12g mode typically involves in-plane vibrations of W and Se atoms, making it more sensitive to in-plane symmetry variations than A1g mode.26 These experimental findings clearly suggest that the Raman modes of top-layer WSe2 exhibit optical in-plane anisotropy in our CVD-grown WSe2/ReSe2 heterostructures, evidencing a lattice-symmetry perturbation induced within WSe2 layer. We attribute this transformation to the strong interfacial coupling between WSe2 and low-symmetry ReSe2 substrate, which induces a pronounced anisotropic phonon-photon coupling behavior in the WSe2 layer.

Specifically, monolayer WSe2 is intrinsically in-plane isotropic, whereas its phonon scattering exhibits pronounced angle dependence (XX) as bonding with ReSe2 via van der Waals forces. Such polarization-sensitive Raman scattering usually signals a modification of in-plane rotational symmetry.14,15 In other word, the ultra-strong interlayer coupling between monolayer WSe2 and low-symmetry ReSe2 breaks the intrinsic symmetry of WSe2. Meanwhile, such strong interlayer coupling allows ReSe2 to impose an anisotropic potential on WSe2, driving its phonon scattering to become in-plane anisotropic. Moreover, the charge redistribution and band renormalization induced by efficient interlayer charge transfer may further produce a contribution to the anisotropy of phonon–photon coupling behavior.40 Particularly, Fig. S5 presents the angle-resolved polarized Raman spectra of the WSe2/ReSe2 heterostructure under XY configuration. In contrast to XX configuration, both Raman modes of WSe2 exhibit weak angle dependence, with a period intensity modulation of ∼180°, which implies that the anisotropy induced by strong interlayer coupling also follows the Raman tensor selection rule.

To further verify this conclusion, we fabricated an additional vertical WSe2/ReSe2 heterostructure through transferring a mechanically exfoliated (ME) monolayer WSe2 onto the as-grown monolayer ReSe2. Fig. 4a presents the optical image of the sample, where the yellow frame represents the heterostructure region. We respectively acquired the Raman spectra in the individual ReSe2, WSe2 and WSe2/ReSe2 heterostructure regions, as shown in Fig. 4b. In the heterostructure, both Raman peaks of WSe2 are clearly visible, whereas the ReSe2 peaks are too weak to be observed, consistent with the CVD-grown samples (see Fig. 2b). In contrast to the pronounced redshift observed in CVD-grown heterostructures, the unchanged peak position of WSe2 indicates a relatively weak interfacial coupling in the ME WSe2/ReSe2 heterostructure. Fig. 4c directly compares the PL spectrum of monolayer WSe2 on SiO2/Si substrate with that of the ME WSe2/ReSe2 heterostructure at room temperature. Note that, the mechanically-assembled heterostructure sample had been annealed at 300 °C for 4 hours to strengthen interfacial coupling before optical measurements. As expected, the WSe2 PL emission is incompletely quenched in the heterostructure, with a weak emission peak still visible (red curve). This incomplete PL quenching at room temperature suggests a relative weak interlayer coupling in the mechanically-assembled WSe2/ReSe2 heterostructure compared to that of the CVD-grown sample. Therefore, we further conducted angle-resolved polarization Raman measurements for the individual WSe2 and ME WSe2/ReSe2 heterostructure, respectively. Fig. 4d–g display the intensity color maps of the angle-resolved Raman spectra for the monolayer WSe2 and ME WSe2/ReSe2 heterostructure, recorded in both XX and XY polarization configurations. Intuitively, the WSe2 Raman modes in the ME WSe2/ReSe2 heterostructure remain angle-independent, and their intensity evolution almost keep completely consistent with that of monolayer WSe2 on SiO2/Si. These experimental results indicate that there is no in-plane anisotropy is induced in the WSe2 layer owing to the weak interlayer coupling in the mechanically-assembled WSe2/ReSe2 heterostructure. This finding further corroborates that the pronounced in-plane anisotropy of WSe2 in CVD-grown WSe2/ReSe2 heterostructures stems from robust interlayer coupling.


image file: d5ra08161k-f4.tif
Fig. 4 Optical anisotropy characterization of the mechanically-assembled WSe2/ReSe2 heterostructure. (a) Optical image of the mechanically-assembled WSe2/ReSe2 heterostructure. (b) Raman spectra measured in the individual ReSe2, WSe2 and WSe2/ReSe2 heterostructure regions. (c) Comparison of the PL spectra between the monolayer WSe2 and ME WSe2/ReSe2 heterostructure. (d) and (e) Raman intensity color maps of the monolayer WSe2 and ME WSe2/ReSe2 heterostructure under parallel configuration. (f) and (g) Raman intensity color maps of the monolayer WSe2 and ME WSe2/ReSe2 heterostructure under crossed configuration.

4 Conclusions

In summary, high-quality WSe2/ReSe2 vertical heterostructures are grown by one-step CVD technique and exhibit ultra-strong interfacial coupling, evidenced by complete WSe2 PL quenching. Angle-resolved polarized Raman spectroscopy reveals that the Raman modes of WSe2 exhibit obvious in-plane anisotropy in CVD-grown WSe2/ReSe2 vertical heterostructures. This is attributed to the intrinsic symmetry breaking of WSe2 induced by strong interlayer coupling between WSe2 and low-symmetry ReSe2. Our results clarify how interfacial coupling affects anisotropy across van der Waals interfaces and provide a foundation for designing polarization-sensitive optoelectronic devices based on anisotropic TMDs heterostructures.

Author contributions

Chunxiao Cong, Min Jin and Xiaofei Yue directed the research work. Yong Guo, Xiaofei Yue and Jiajun Chen conceived and designed the experiments. Jiajun Chen fabricated the samples. Yong Guo and Xiaofei Yue conducted the experiments and analyzed the data. Yong Guo and Xiaofei Yue co-wrote the manuscript. All authors discussed the results and commented on the manuscript.

Conflicts of interest

There are no conflicts to declare.

Data availability

The data supporting this article have been included as part of the supplementary information (SI). Supplementary information: growth situation with/without NaCl, AFM height profiles, and XY-polarization Raman results. See DOI: https://doi.org/10.1039/d5ra08161k.

Acknowledgements

This work is supported by the National Natural Science Foundation of China (62374037, 52371193, 52272006), the Chenguang Program supported by the Shanghai Education Development Foundation & Shanghai Municipal Education Commission, the Shanghai Shuguang Program, the Shanghai Academic Research Leader (23XD1421200), the Shanghai Rising-Star Program (23QA1403900), the Program for Professor of Special Appointment (Eastern Scholar) at Shanghai Institutions (TP2022122), the Shanghai Oriental Talented Youth Project, Space Application System of China Manned Space Program (KJZYY-NCL-0405), Zhejiang Provincial Natural Science Foundation of China (No. LD25E020001), Opening Project of State Key Laboratory of Functional Crystals and Devices (SKLFCD202505SIC).

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Footnote

These authors contribute equally to this study.

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