Open Access Article
Ion Nesterovschiab,
Ameen Uddin Ammara,
Adriana Popaa,
Maria Stefan
a,
Dana Toloman
a,
Sergiu Gabriel Macaveia,
Cristina Leosteana,
Lucian Barbu Tudorana,
Maria Mihet
a,
Ana Varadiac,
Emre Erdem
ad and
Arpad Mihai Rostas
*a
aNational Institute for Isotopic and Molecular Technologies, Donat 67-103, Cluj-Napoca, Romania. E-mail: arpad.rostas@itim-cj.ro
bDoctoral School of Physics, Babes-Bolyai University, Mihai Kogalniceanu 1, Cluj-Napoca, Romania
cDoctoral School of Chemistry, Babes-Bolyai University, Mihai Kogalniceanu 1, Cluj-Napoca, Romania
dFaculty of Engineering and Natural Sciences, Sabanci University, Tuzla, Istanbul, Turkey
First published on 1st June 2026
This study examined the effect of tungsten doping on the structural and electrochemical performance of molybdenum disulfide (MoS2) in symmetric supercapacitor devices. MoS2 nanoflowers with different W contents (0–1%) were synthesized by a hydrothermal method and characterized using XRD, Raman, PL, EPR, SEM, and BET analysis. Tungsten incorporation induced lattice distortions, sulfur vacancies, and enhanced defect-assisted charge transport, while retaining the layered morphology. Electrochemical measurements revealed a combination of electric double-layer and pseudocapacitive behavior with the MoS2:W0.7 electrode material delivering the highest performance. This device achieved a specific capacitance of 848 F g−1 at 10 mV s−1, an energy density of 117.8 Wh kg−1, a power density of 2121 W kg−1, and excellent cycling stability, retaining 97% of its capacitance. The results demonstrate that W doping introduces additional electroactive sites and improves conductivity, highlighting a simple strategy to enhance the energy-storage capability of MoS2-based materials for supercapacitor applications.
Supercapacitors store energy through two primary mechanisms: ion adsorption at the electrode surface (electric double-layer capacitor, EDLC) and fast, reversible faradaic redox reactions at or near the electrode surface (pseudocapacitors).4 EDLCs, made from materials like activated carbon, graphene, and carbon nanotubes, excel in power density and longevity but suffer from lower energy density due to non-faradaic charge storage. Pseudocapacitors, by contrast, rely on transition-metal oxides and transition-metal dichalcogenides (TMDs) to achieve higher specific capacitance via faradaic reactions. Hybrid supercapacitors that combine EDLC and pseudocapacitive mechanisms have also been developed to bridge the gap between power and energy density, achieving improved performance.5
One of the critical factors influencing supercapacitor performance is the choice of electrode material. Among TMDs, molybdenum disulfide (MoS2) attracted significant interest due to its high surface area, tunable electronic properties, and narrow bandgap (1.2–1.9 eV).6 This bandgap allows MoS2 to function as a semiconductor with unique electrochemical properties appropriate for charge storage.7 While MoS2 exhibits promising electrochemical properties, its moderate electrical conductivity and limited active-site density limit its practical application in supercapacitors.7 To address these limitations, doping strategies can be explored. Transition metal doping has proven effective in modifying the electronic structure, enhancing conductivity, and introducing additional active sites. For example, tungsten (W) doping in various materials significantly improves their electrochemical performance. In W-doped Co(OH)2, tungsten facilitated the formation of dandelion-like structures, resulting in specific capacitance values of 1051 F g−1, along with excellent cyclic stability and charge retention (92% after 5000 cycles).8 Similarly, W-doped NiO nanosheets exhibited a high specific capacitance of 872.32 F g−1, with good charge–discharge retention and cyclic stability (87.5% after 3000 cycles).9 These results underscore the significant impact of W doping on the material's electrochemical properties.
Recent studies on TMD-based hybrid materials have further demonstrated that tungsten doping enhances supercapacitor performance. For instance, a W-doped MoSe2 synthesized via the hydrothermal method showed good electrochemical properties with a capacitance of 444.4 mF cm−2 at 1 mV s−1.10 These findings highlight the importance of TMD doping with tungsten to enhance energy storage capabilities. Elemental doping has been shown to improve the electrochemical properties of MoS2. For example, Gd-doped MoS2 nanosheets demonstrated a specific capacitance of 357 F g−1 at 10 mV s−1 and retained 81.5% of their capacity after 5000 cycles.11 Similarly, Fe-doped MoS2 exhibited significantly enhanced performance, with 8% Fe-doped samples achieving a specific capacitance of 545 F g−1 at 1 A g−1 and 84.8% retention over 2000 cycles.12 Nickel-doped MoS2, at 10% Ni content, showed a specific capacitance of 156.8 mF cm−2 at 4 mA cm−2 with a moderate cycling stability of 77.83% after 5000 cycles.13
Despite the extensive literature on metal-doped MoS2, tungsten has not been explored as a substitutional dopant in the MoS2 lattice for supercapacitor applications. Existing W-containing MoS2 systems reported in the literature either use WS2/MoS2 heterostructures14 or incorporate W-substituted MoS2 within polymers such as PEDOT:PSS,15 all measured under three-electrode conditions in acidic electrolytes. The use of a low W doping concentration (<1%) in 2H-MoS2 nanoflowers, assembled into a symmetric alkaline supercapacitor device without conductive additives or polymer binders, has not been addressed. Additionally, comprehensive reviews of MoS2-based supercapacitor electrodes confirm that low electrical conductivity, layer restacking, and limited cycling stability remain the primary unresolved challenges in the field.7,16 The present work directly addresses this gap by synthesizing MoS2:W nanoflowers across a doping range of 0–1% via a simple one-step hydrothermal route and correlating the W-induced structural modifications characterized by XRD, Raman, EPR, XPS, and BET with electrochemical performance in a symmetric two-electrode configuration using 6 M KOH, without any auxiliary conductive additives.
Thus, this study investigates tungsten-doped molybdenum disulfide (MoS2:W) as a high-performance electrode material for supercapacitors. Incorporating tungsten is expected to enhance electronic conductivity, increase the density of active sites, and improve structural stability during charge–discharge cycling. A combination of advanced characterization techniques was employed to fully understand these effects. UV-Vis spectroscopy was used to examine the optical properties and potential bandgap shifts,17 while X-ray diffraction (XRD) provided insight into crystalline phase formation and lattice changes.18 Raman spectroscopy helps estimate defect sites and structural ordering at the vibrational level.19 X-ray photoelectron (XPS) and electron paramagnetic resonance (EPR) spectroscopy were applied to study the elemental composition, oxidation states, and the presence of vacancies.20,21 Finally, comprehensive electrochemical characterization using cyclic voltammetry (CV), electrochemical impedance spectroscopy (EIS), and galvanostatic charge–discharge (GCPL) allowed for the evaluation of charge storage behavior and cycling stability.22 These complementary methods provide a comprehensive understanding of how tungsten doping modifies the physical and electrochemical properties of MoS2, thereby enhancing energy-storage performance.
:
1 v
:
v). The produced powder was then dried at 65 °C for 12 h. Five samples were synthesized for this study, denoted with MoS2:Wx, where x = 0, 0.3, 0.5, 0.7, and 1 represent the W doping concentration.
![]() | ||
| Scheme 1 Schematic illustration of the synthesis procedure employed to synthesize the undoped and W-doped MoS2 compounds. | ||
The techniques included cyclic voltammetry (CV), potentiostatic electrochemical impedance spectroscopy (PEIS), and galvanostatic cycling with potential limitation (GCPL). CV measurements were performed over a voltage window of 0–1 V, with scan rates ranging from 2 to 200 mV s−1. PEIS measurements were performed with an AC signal amplitude of 10 mV over a frequency range from 10 mHz to 1 MHz. GCPL tests were conducted at a current density of 0.8 A g−1, and the energy and power densities were determined from CV and GCPL data. Because the supercapacitor design was symmetric, specific capacitance, energy, and power density were calculated using the mass of a single electrode to quantify each electrode's contribution. The specific capacitance value can be calculated using the area under the CV curve using the following equation:
, where Cs is the specific capacitance,
represents the area under the CV curve, m is the mass of the active electrode material, K is the scan rate at which the CV was acquired and ΔV is the voltage window. Using the specific capacitance value, the energy density was calculated with:
, where ED is the energy density, Cs is the specific capacitance, and V is the potential window, while the power density was calculated with the following equation:
, where PD is the power density, and t is the discharge time obtained from the GCPL measurements. This approach ensures that both the electrode series configuration and the electrode mass are properly accounted for, thereby avoiding overestimation of energy and power densities.
![]() | ||
| Fig. 1 STEM micrographs at different magnifications (a) and EDS mapping (b) results of the MoS2:W1 sample. XRD (c) and Raman spectra (d) of the undoped and W-doped MoS2 samples. | ||
Fig. 1(b) depicts the EDS images showing the distribution of the elements in the MoS2:W1 sample. The presence of the constituent Mo and S atoms and the uniform distribution of the dopant W ions in the MoS2 particles can be observed. The same morphological characteristics can be observed in all synthesized MoS2:W samples, regardless of the W doping degree (data not presented).
The structural properties of the MoS2 samples were analyzed by X-ray diffraction. The obtained diffractograms are presented in Fig. 1(c). The presence of three broad peaks located at 11, 34, and 58° can be observed, which correspond to reflections on the (002), (103), and (110) planes of MoS2 according to ICDD: 00-037-1492 supporting the formation of MoS2 with trigonal symmetry belonging to the P63/mmc space group.26,27 Molybdenum(IV) sulfide can exist in several polymorphic states: 2H, 1T, and 3R, all possessing a layered structure formed by MoS6 units.28 The 2H-MoS2 polymorphic state, belonging to the space group P63/mmc, is the most thermodynamically stable phase.29 To determine the lattice changes, the d-spacing value was calculated from the (110) peak of the diffractograms for the analyzed samples. A very slight variation in d spacing is observed for doping levels below 0.7%, followed by a more significant increase at 1% W-dopant level as depicted in Table 1.
| Sample | d/Å | Mo : S |
SBET/m2 g−1 | Vp/m3 g−1 | A1g(Γ)–E1g(Γ) | E2g1(Γ) | ||||
|---|---|---|---|---|---|---|---|---|---|---|
| Pos. | Int. | FWHM | Pos. | Int. | FWHM | |||||
| MoS2 | 1.5964 | 0.507 | 3.52 | 0.0075 | — | — | — | — | — | — |
| MoS2:W0.3 | 1.5967 | 0.539 | 3.28 | 0.0060 | 119.763 | 0.268 | 16.090 | 373.300 | 0.092 | 19.835 |
| MoS2:W0.5 | 1.5963 | 0.538 | 3.47 | 0.0060 | 119.139 | 0.287 | 12.205 | 372.873 | 0.106 | 23.190 |
| MoS2:W0.7 | 1.5959 | 0.533 | 3.58 | 0.0076 | 119.226 | 0.332 | 12.176 | 373.654 | 0.114 | 23.124 |
| MoS2:W1 | 1.5988 | 0.539 | 3.53 | 0.0068 | 119.272 | 0.297 | 11.846 | 372.894 | 0.110 | 21.170 |
The Raman spectra of W-doped MoS2 (Fig. 1(d)) exhibit 10 visible bands at 120 cm−1-[A1g(Γ)–E1g(Γ)], 144 cm−1-[E1g(M)–TA(M)], 191 cm−1-ZA(M), 233 cm−1-LA(M), 280 cm−1-E1g(Γ), 332 cm−1-E2u(M), 373 cm−1-E2g1(Γ), 659 cm−1-[E1g(Γ) + E2g1(Γ)], 816 cm−1-2 × A1g(Γ), 988 cm−1.30,31 No visible differences are observed; therefore, a Gaussian deconvolution is applied to enhance visualization of the changes. Table 1 presents the deconvolution results for two bands that are more likely to be affected by the dopant: 120 and 373 cm−1. The full width at half maximum (FWHM), peak position, and intensity of these bands were analyzed. In pristine MoS2, the A1g(Γ)–E1g(Γ) band has a FWHM of 16.09 cm−1 and for the E2g1(Γ) band, it was 19.835 cm−1. After doping, significant changes were observed for these parameters. In particular, the FWHM of the E2g1(Γ) mode increased significantly in MoS2:W0.3 (23.19 cm−1) and MoS2:W0.5 (23.124 cm−1) samples, suggesting increased disorder due to the replacement of Mo by W, which affects the concentration of sulfur vacancies. Sulfur vacancies are known to impact the E2g1(Γ) mode more prominently due to their effect on the in-plane vibrations of the lattice.32 However, the FWHM of the A1g(Γ)–E1g(Γ) mode, associated with out-of-plane vibrations,33 decreased until 0.7% W dopant concentration. This observation implies that W doping introduces an order along the out-of-plane axis.
The textural characteristics of the undoped and W-doped MoS2 samples were analyzed using nitrogen adsorption–desorption measurements presented in Fig. 2a. The specific surface area (SBET) and total pore volume (Vp) of the samples are summarized in Table 1 and Fig. 2(b). Pristine MoS2 shows a specific surface area of 3.52 m2 g−1 and a total pore volume of 0.0075 cm3 g−1. Upon W doping, the surface area and pore volume vary slightly: SBET ranges from 3.28 to 3.58 m2 g−1, and Vp ranges from 0.0060 to 0.0076 cm3 g−1. The MoS2:W0.7 sample exhibits the highest values, indicating the largest interlayer spacing and highlighting the presence of additional accessible sites for the electrolyte. Beyond this concentration, the surface area and pore volume decrease slightly, as in the case of MoS2:W1. This effect can be explained by an excessive W content in the lattice, which increases structural disorder and promotes partial restacking or aggregation of the nanoflowers, thereby limiting pore accessibility.
![]() | ||
| Fig. 2 Nitrogen adsorption–desorption measurements results (a) and pore volume distribution of the undoped and W-doped MoS2 samples. | ||
EPR spectroscopy was used to further analyze the presence of defect centers in the materials and the oxidation states of the elements. Fig. 3(a) presents the X-band EPR spectra of pristine and W-doped MoS2 samples measured at room temperature. The vertical lines indicate two resonances at g = 1.93, characteristic of Mo4+ ions and at g = 2.007, representing sulfur defects.34 The intensity of these EPR signals is constant when the W-doping concentration is varied, and no additional W5+ EPR signals are observed, indicating that the dopant ions are EPR silent (W4+ with d2 or W6+ with d0 electron configurations) or not observable due to fast relaxation times. Heavy ions like Tungsten have very strong spin–orbit coupling, which, in high-symmetry sites, often results in closely spaced energy levels, allowing the electron spin to flip too quickly and leading to short relaxation times.35,36 Thus, the presence of W5+ cannot be ruled out at this point.
![]() | ||
| Fig. 3 X-band electron paramagnetic resonance spectra of pristine MoS2 and W-doped MoS2 samples recorded at room temperature. | ||
The surface composition for the MoS2:W0.7 sample was analyzed by XPS. Fig. 3(b) shows the deconvolution of the Mo 3d spectrum. Mo 3d5/2 positioned at 228.8 eV and 3d3/2 positioned at 232.0 eV are characteristic of the Mo4+ oxidation state. In comparison, at higher binding energies, another doublet is observed at 232.5 eV (3d5/2) and 235.6 eV (3d3/2), which are characteristic of the Mo6+. Also, at lower binding energies, the S 2s peak is observed at 225.9 eV. The S 2p spectrum deconvolution (Fig. 3(c)) reveals that besides the expected S–Mo lines, an additional SO4 is also present in the sample, which comes from the synthesis reagents. Fig. 3(d) shows the W 4f spectrum. In this case, the Mo 4p signal strongly overlaps with the W 4f signal, complicating deconvolution. Mo4+ is positioned at 36.3 eV (4p3/2) and 38.4 eV (4p1/2), while Mo6+ is positioned at 39.5 eV (4p3/2) and 41.6 eV (4p1/2). The W 4f line positioned at 33.0 eV has a broad HWHM of 2.5 eV, indicating that multiple oxidation states could be present: mostly W4+, W5+, and probably W6+ as compared to existing literature.37–39 The calculated atomic ratio W/Mo4+ is 0.0035, which is in good agreement with the nominal concentration of 0.7% W, given that XPS detects the surface of the materials and not the bulk. The sulfur vacancy concentration was estimated from the Mo
:
S ratio (see Table 1). At W doping levels below 1%, the Mo
:
S ratio remains near the stoichiometric value of the pristine sample, though it indicates a slight sulfur deficiency, in good agreement with the EPR results, where the EPR signal intensities remain constant with varying W-dopant concentration.
The electrochemical behavior of pristine and W-doped MoS2 samples was investigated using cyclic voltammetry (CV), galvanostatic charge–discharge (GCPL), electrochemical impedance spectroscopy (EIS), and the Dunn method to evaluate charge storage mechanisms. All measurements were performed on a symmetric supercapacitor device with a two-electrode configuration, using a 6 M KOH electrolyte and glass fiber as the separator. The mass of the electrode material is 3 mg over an area of 1.13 cm2.
Fig. 4(a)–(e) shows the CV curves measured at different scan rates for the undoped and W-doped MoS2-based SC devices across the voltage window of 0–1 V. The CV curves for all SC devices exhibit non-ideal quasi-rectangular shapes as exemplified in Fig. 4(f) at a scan rate of 100 mV s−1, indicative of a combined electric double-layer and pseudocapacitive behavior.40 As reported in the literature, ideal supercapacitor behavior exhibits a rectangular shape associated with the EDLC charge-storage phenomenon.41 The CV curve changes as the W-dopant concentration increases; the undoped MoS2-based SC device exhibits a CV curve closest to EDLC-type behavior; however, W doping induces a significant shift in the CV curve, indicating an increased contribution of pseudocapacitance. W doping introduces defects, edge sites, and additional redox centers as described above, contributing to this deviation from the non-ideal shape. A high degree of retention of the curve shape at elevated scan rates, particularly for the MoS2:W0.7-based SC device, indicates good rate capability, arising from efficient charge transfer and rapid ion transport. Furthermore, the nearly symmetric anodic and cathodic profiles across the scan-rate range also indicate high electrochemical reversibility. The deviation from an ideal rectangular profile reflects the influence of faradaic surface redox reactions, which are particularly enhanced by W doping, as evidenced by the redox peaks that primarily occur at the electrode surface. Secondly, internal resistance among the device's components causes edge rounding, a common observation in practical supercapacitors.42
The trend of the CV curves suggests the positive influence of W doping on MoS2, as we observed the increased current response with increasing doping concentration (see Fig. 4(f)), with the highest current response obtained for the MoS2:W0.7-based SC device, and further increase of the doping concentration tends to decrease the current values. The MoS2:W0.7-based SC device also exhibits the largest CV area, which is directly related to its specific capacitance. The performance trend indicates that W doping improves electrical conductivity and produces more accessible active sites up to an optimal concentration for redox reaction to take place, after which excess dopant can cause agglomeration or structural distortion, which negatively affects the charge transport.43
Fig. 4(g) presents the specific capacitance (Cs) as a function of the scan rate, calculated from the CV curves as presented in section 2.3. The MoS2:W0.7-based SC device exhibited the highest capacitance at all scan rates, reaching a maximum of 848 F g−1 at 10 mV s−1. The undoped MoS2-based device exhibits the lowest specific capacitance.
To gain a deeper understanding of the operating mechanism of the best-performing MoS2:W07-based SC device, Dunn analysis was applied,44 and the results are presented in Fig. 4(h). The equation used to express the different contributions to the measured current is expressed as
, where k1·v represents the capacitive current,
shows the diffusive current, and v represents the scan rate. The relative contributions of each mechanism can be determined by examining the slope and intercept of a Dunn plot, corresponding to the constants k1 and k2.45
The inset of Fig. 4(h) shows that the diffusion-controlled mechanism dominates at all scan rates, contributing approximately 59% at 200 mV s−1. The diffusive and capacitive contributions calculated from the Dunn analysis for all other devices are presented in Fig. S2. Contributions from both mechanisms are visible across all devices, with a slightly higher capacitive contribution at high scan rates in the W-doped MoS2-based SC devices. For all devices, the diffusion contribution increased at lower scan rates, indicating that ions had sufficient time to diffuse in the material. This trend suggests that diffusion-limited pseudocapacitive processes primarily govern charge storage, rather than surface-controlled reactions. The persistence of a strong diffusion-controlled response at high scan rates implies that the W-doped MoS2 structure facilitates rapid ion intercalation and access to internal redox-active sites, likely due to expanded interlayer spacing and defect-assisted transport pathways.46 These characteristics reflect the favorable structural and electronic modifications introduced by W doping, as observed in other studies, in which W ions enhanced the charge-storage properties of Co(OH)2 by introducing redox-active sites. Hence, as a result, the specific capacitance is increased twice that of pristine Co(OH)2.8
Electrochemical impedance spectroscopy (EIS) probes the charge-transfer and ion-diffusion behavior of the MoS2:W-based SC devices. Nyquist plots of the tested devices are shown in Fig. 4(i)–(m), showing that all devices form an incomplete semicircle, contrary to the ideal EDLC-type behavior, which shows a near-vertical Nyquist plot in the low-frequency region. Similar to CV, this deviation can be explained by the internal resistance of components in real devices and by pseudocapacitance.47 The diameter of the semicircle is associated with the charge-transfer resistance, Rct, and we observed that the undoped MoS2 and MoS2:W1-based SC devices exhibit the largest diameter. In contrast, the other devices show a low-diameter semicircle. Consistent with the CV observation, the best-performing MoS2:W0.7-based SC device exhibits the smallest semicircle, indicating the lowest charge-transfer impedance. The x-intercept in the high-frequency region corresponds to the solution resistance Rs. Here, the MoS2:W0.7-based SC device exhibits the lowest Rs, whereas the undoped MoS2-based SC device exhibits the highest Rs. Moderate W doping significantly reduced both Rs and Rct, with MoS2:W0.3, W0.5, and W0.7 showing the lowest impedance values. This suggests enhanced electron/ion transport kinetics and reduced internal resistance, thereby improving electrochemical performance.11 The Nyquist plots of all devices do not exhibit a well-defined Warburg region in the mid-frequency range, typically associated with ion-diffusion limitation.48 This can probably be due to the layered morphology of MoS2, which provides short ion diffusion pathways as suggested in a previous study,49 and to the presence of W-induced defects that facilitate faster ion transport as shown by Muthukumar et al.,50 where doping-induced defects lead to faster diffusion of ions. Additionally, in a symmetric two-electrode configuration, the impedance contributions from both electrodes may mask or compress the Warburg region. To further analyze the Nyquist plots and obtain values for the physical parameters, equivalent-circuit fitting was performed; the fitted graphs are shown in Fig. 4(i)–(m), and the equivalent circuit used is shown in the inset of Fig. 4(i). Here, R1 represents the solution resistance (Rs), R2 is the charge transfer resistance (Rct), and Q denotes a constant phase element (CPE), which is a more generalized impedance element that accounts for non-idealities in the capacitor's behavior. Q2 in the circuit is analogous to Cdl, which is the double-layer capacitance, while Q3 represents a pseudo-capacitance. W3 shows the Warburg impedance from ion diffusion in the electrolyte at the low-frequency region. Table 2 shows the values of the most important parameters for ease of comparison. The MoS2:W0.7-based SC device exhibited low Rs and Rct values, along with a high Cdl, which together contribute to its superior performance relative to the other SC devices evaluated in this study. The devices that showed the lowest performance, MoS2 and the MoS2:W1-based SC devices, exhibited higher resistance and Warburg impedance.
| Sample | R1/Ω | Cdl/μF | R2/Ω | W2/Ω s−0.5 | Csp/F g−1 | ED/Wh kg−1 | PD/W kg−1 |
|---|---|---|---|---|---|---|---|
| @10 mV s−1 | |||||||
| MoS2 | 2.45 | 12.03 | 1495 | 544 | 83.34 | 11.57 | 208.36 |
| MoS2:W 0.3% | 0.346 | 84.78 | 284 | 192 | 357.03 | 49.58 | 892.58 |
| MoS2:W 0.5% | 0.313 | 15.95 | 14.14 | 143 | 276.68 | 38.42 | 691.71 |
| MoS2:W 0.7% | 0.252 | 448 | 190 | 98 | 848.53 | 117.85 | 2121 |
| MoS2:W1% | 0.461 | 52.53 | 1668 | 789 | 99.73 | 13.85 | 249 |
GCPL measurements can provide vital information on the discharge time, specific capacity, cyclic stability, and rate capability of the studied SC devices by varying the current density. Fig. 5(a) shows the charge–discharge measurements for all the devices measured at a current density of 0.8 A g−1. Charge–discharge curves also indicate that charge storage in these devices results from a combination of EDLC and pseudocapacitive behavior. The EDLC-type charge–discharge curves normally have a triangle shape,51 suggesting symmetry in the charge and discharge cycles. However, non-linear features in the charge discharge curves suggest a dominant pseudocapacitive contribution as it was reported in the literature,51,52 consistent with faradaic redox processes at the Mo and W active sites, especially visible in the best-performing MoS2:W0.7-based SC device, which not only shows the longest discharge time but also shows a plateau region on maximum voltage in the charge curve, which is associated with the redox activity. The undoped MoS2-based device shows the shortest discharge time, while all other devices have discharge times that are more or less similar, but far shorter than that of the best-performing device, confirming its superior energy storage capability, in agreement with the CV and EIS results.
Fig. 5(b) shows the cyclic stability where capacitance retention is plotted as a function of the cycle number. All W-doped MoS2-based SC devices exhibit good capacitance retention, with the lowest retention observed in the MoS2:W0.5 device, which retains almost 80% after 2000 cycles. All other W-doped SC devices retained more than 90% of their initial capacitance, highlighting tungsten's role in stabilizing the electrode structure. MoS2:W0.7 again showed the best cycling durability, making it a good candidate for long-term applications. While the undoped MoS2-based SC device exhibits the lowest retention of about 60% after 2000 cycles, indicating that W doping improves the cyclic stability of MoS2 when used as an electrode material in symmetric SC devices. Cyclic performance measured over 10
000 cycles at 3 A g−1 is presented in Fig. S3 to further test the devices’ cyclic performance. The trend remains similar to that observed for 2000 cycles, in which the W-doped MoS2-based SC devices showed better retention than the undoped MoS2-based SC devices. The lowest retention for the MoS2-based SC device was almost 75% after 10
000 cycles.
The improved cycling stability of W-doped MoS2 can be attributed to several synergistic structural effects. W incorporation induces lattice distortion and defect formation, disrupting the strong van der Waals interactions between MoS2 layers and thereby preventing restacking during repeated charge–discharge cycles, helping to maintain a high electrochemically active surface area over prolonged cycling. Substituting Mo with W enhances the lattice's structural integrity, as W incorporation stabilizes the MoS2 framework against mechanical degradation during repeated ion insertion and extraction. Additionally, W doping alters the local electronic structure, potentially suppressing the dissolution or surface degradation of Mo species in the alkaline electrolyte. These combined effects ensure stable ion transport pathways and sustained accessibility of redox-active sites, resulting in the observed high capacitance retention over extended cycling.
The Ragone plot is a standard metric for comparing energy storage devices, plotting the power density of the SC devices as a function of their energy density. Table 2 presents the energy and power density values for all devices, and Fig. 5(c) plots these values in a standard Ragone plot to better visualize their position in a universal comparison. As expected, the MoS2:W0.7-based SC device exhibits the highest energy and power densities, whereas the undoped MoS2 devices show the lowest performance. The best-performing MoS2:W0.7 in the Ragone plot shows energy density values approaching the fuel cell zone, suggesting significant potential for this electrode material.
Compared with other doped MoS2-based electrodes listed in Table 3, the MoS2:W0.7 sample, developed in this study, exhibits superior electrochemical performance, delivering a specific capacitance of 848 F g−1 at 10 mV s−1 and an energy density of 117.85 Wh kg−1. These values exceed those reported for most dopants such as Gd, Fe, Ni, and Co, and are comparable to oxide-based composites like MoS2:MnO2 and MoS2:SnO2. This confirms the positive role of W incorporation, making the material a promising candidate for high-performance energy storage applications.
| Material | Csp/F g−1 | ED/Wh kg−1 | PD/W kg−1 | Cycling stability | Config. | Ref. |
|---|---|---|---|---|---|---|
| Abbreviations: 3E – three-electrode half-cell; 2E-S – two-electrode symmetric device; 2E-A – two-electrode asymmetric device; t.w. – this work. | ||||||
| MoS2:Gd | 357@10 mV s−1 | — | — | 81.5%/5000 cycles | 3E | 11 |
| MoS2:Fe | 545@1 A g−1 | — | — | 84.8%/2000 cycles | 3E | 12 |
| MoS2:Ni | 425@5 mV s−1 | 9 | 0.5 | — | 3E | 53 |
| MoS2:Co | 164@1 A gv | 3.67 | 3279.97 | — | 2E-S | 54 |
| MoS2:Sr | 489.75@1 A g−1 | 31 | 5760 | 62.5%/2000 cycles | 2E-A | 55 |
| MoS2:Cu | 402.7@1 A g−1 | 94.5 | 2880 | 88.77%/10 000 cycles |
2E-A | 56 |
| MoS2@FeS2 | 386@1 A g−1 | 53 | 699 | 90.3%/10 000 cycles |
2E-S | 57 |
| MoS2:MnO2 | 515@1 A g−1 | 15 | 10 000 |
— | — | 58 |
| MoS2:SnO2 | 826.5@1 mV s−1 | 14.4 | 4000 | — | — | 59 |
| W-MoS2/PEDOT:PSS | 845.14@1 A g−1 | — | — | 89%/10 000 cycles |
3E | 15 |
| MoS2:W | 848@10 mV s−1 | 117.85 | 2121 | 97%/2000 cycles | 2E-S | t.w. |
The structural and morphological characteristics of the W-doped MoS2 samples can be directly correlated with their electrochemical behavior. SEM and TEM images (Fig. 1(a)) reveal a flower-like structure composed of thin, curved MoS2 sheets. This 3D nanoflower morphology provides numerous exposed edges and open spaces, facilitating easier interaction with electrolyte ions. BET measurements support this observation, showing that the surface area increases with W doping up to 0.7%, indicating enhanced ion transport accessibility. Defect centers are also known to improve the electrochemical properties of materials.60–62 Raman and EPR spectroscopy evidence the presence of sulfur-defect centers induced by the dopant. The presence of multivalent Mo and W dopant ions was evidenced by XPS measurements, in which molybdenum appears in two oxidation states, +4 and +6, and tungsten appears in two oxidation states, +5 and +6. All these structural modifications are reflected in the CV curves, where the highest current responses are observed for the 0.5 and 0.7% W-doped samples. The presence of W in different oxidation states facilitates faradaic reactions within the electrode material, as evidenced by higher specific capacitance values for the two devices. Dunn's analysis of the best-performing MoS2:W0.7-based device reveals a prominent contribution from diffusive and capacitive mechanisms, further supporting our CV results. The Nyquist plots show that the MoS2:W0.7 sample exhibits the lowest imaginary impedance, as well as the lowest Rs and Rct, suggesting faster ion diffusion and more active sites, related to the sulfur vacancies and the presence of the multivalent Mo and W elements. Charge–discharge data reveal the longest discharge time and high cyclability for the best-performing MoS2:W0.7-based SC device.
Supplementary information (SI) is available. See DOI: https://doi.org/10.1039/d6nr00405a.
| This journal is © The Royal Society of Chemistry 2026 |