Open Access Article
Hemalatha M. Sivaprakasam,
Rajasekar Parasuraman
* and
Arun Anand Prabu
*
Department of Chemistry, School of Advanced Sciences, Vellore Institute of Technology, Vellore, Tamil Nadu 632 014, India. E-mail: rajasekar.mgac@gmail.com; anandprabu@vit.ac.in
First published on 8th June 2026
β-FeSi2 has emerged as a promising, low-cost, and eco-friendly semiconducting material with strong potential for energy-related applications. However, conventional synthesis methods typically require high temperatures and controlled environments such as vacuum or inert atmospheres, which increase manufacturing costs and limit scalability. In this work, we report an economical and scalable molten salt shielded synthesis method for producing semiconducting Mn-doped β-FeSi2 with minor Si and oxide secondary phases, which was confirmed by X-ray diffraction. Morphology and nominal elemental composition were examined using field-emission scanning electron microscopy and energy-dispersive X-ray spectroscopy. Furthermore, X-ray photoelectron spectroscopy was employed to investigate the surface chemical composition of the synthesized material. Temperature-dependent resistivity measurements of the as-synthesized pellet confirm its semiconducting behavior. Overall, the results demonstrate that MS3 is a simple, scalable, and cost-effective approach for preparing semiconducting β-FeSi2 in powder form. The obtained powder can be utilized for fabricating composite or flexible devices for energy-related applications.
From the literature, intrinsic β-FeSi2 shows room-temperature resistivity values in the range of 101–103 Ω cm with carrier concentrations of ∼1014–1016 cm−3 and mobility values of 10–200 cm2 V−1 s−1. This reflects its low intrinsic carrier density and semiconducting nature.3,4 Upon n-type β-FeSi2 doping, the carrier concentration increases significantly to about 1017–1018 cm−3. The mobility falls in the range of 5–100 cm2 V−1 s−1, due to doping, and the resistivity decreases to the range of 1–10−3 Ω cm. Similarly, p-type β-FeSi2 exhibits a resistivity of 10–10−2 Ω cm with carrier concentrations of approximately 1017–1019 cm−3 and mobilities in the range of 2–50 cm2 V−1 s−1, depending on dopant type and concentration.5–9 Recent studies have shown that improved thermoelectric performance in β-FeSi2 is achieved through densification, microstructural optimization and doping, which enhance grain connectivity and reduce interfacial resistance.10–13 The excellent high-temperature stability, environmental friendliness, tuneable carrier type and carrier concentration make β-FeSi2 a potential material for photovoltaic, thermoelectric, and optoelectronic applications.
The Fe–Si binary phase diagram exhibits complex interactions between metallic phases (Fe, α-Fe2Si5, and ε-FeSi) and semiconducting phases (β-FeSi2 and Si). β-FeSi2 does not form directly from the melt. During the initial solidification of arc-melted Fe and Si, α-Fe2Si5 and ε-FeSi are formed, which are subsequently heat-treated (at 873–1073 K for 12–100 h) to produce β-FeSi2. However, this peritectoid reaction between the metallic α and ε phases proceeds very slowly and shows sluggish kinetics (α-Fe2Si5 + ε-FeSi → β-FeSi2).14,15 As an alternative approach, arc melting with excess Si leads to the formation of α-Fe2Si5 along with residual silicon. Subsequent heat treatment facilitates the eutectoid reaction below 1138 K (α-Fe2Si5 → β-FeSi2 + Si). This eutectoid-based route significantly reduces the reaction time and results in the formation of a Si-dispersed β-FeSi2 composite.16–20
As another approach, a direct solid-state reaction between Fe and Si is carried out by ball milling or reactive sintering below 973 K to achieve the formation of β-FeSi2. Ur et al. synthesized Co-doped n-type FeSi2 using mechanical alloying followed by heat treatment at ∼1073 K, which promotes the formation of β-FeSi2 with improved electrical transport properties. These studies demonstrate that mechanical alloying enables controlled phase formation and improved microstructural characteristics in FeSi2-based thermoelectric materials.21 Yamada et al. reported the low-temperature synthesis of β-FeSi2 powder using a sodium melt method, where sodium melt was used as the reaction medium and elemental Fe and Si were reacted in a ratio of 1
:
2.25–2.5 under an argon atmosphere.22,23 The reported reaction time ranged from 1.5 to 24 h at temperatures between 673 and 1073 K. This sodium flux method has also been used to synthesize other silicides such as MnSi1.7, CrSi2, and CoSi. The conventional sodium flux method used for silicide synthesis requires inert or vacuum conditions due to the high reactivity of sodium toward moisture and oxygen. Although semiconducting β-FeSi2 can be synthesized by methods such as arc melting, induction melting, ball milling, spark plasma sintering (SPS), hot pressing, mechanical alloying, and chemical synthesis in both bulk and thin-film forms, most of these approaches require an argon atmosphere or vacuum and prolonged heat treatment to stabilize the semiconducting β-FeSi2. β-FeSi2 is known as a potential candidate for next-generation low-cost thin-film solar cells and has been widely studied for high-temperature thermoelectric applications.24–28
Despite containing abundant and low-cost constituent elements, the prolonged, multiple processing steps with vacuum requirements involved in synthesizing and stabilizing the phase increase the cost. This makes it important to develop a simple, low-cost method to synthesize β-FeSi2. Dash et al. introduced molten salt shielded synthesis (MS3 or MS3) to facilitate the synthesis of MAX phase Ti3AlC2, without requiring a vacuum or inert gas atmosphere.29 In this method, the molten salt acts as a barrier to prevent oxidation at elevated temperatures. Furthermore, in the MXene literature, the synthesis of the MAX phase using different molten salts and tuning the properties has been widely studied. In this work, we demonstrate a molten salt shielded synthesis approach for the preparation of Mn-doped β-FeSi2 powders under ambient air conditions using KBr encapsulation. In this work, KBr encapsulation is employed as a halide-based barrier to limit oxygen interaction during high-temperature processing. This approach suppresses oxidation and enables the synthesis of β-FeSi2 under ambient conditions without the need for a vacuum or an inert atmosphere. This strategy provides a simpler and more scalable alternative to conventional molten salt and sodium flux methods. The optimized synthesis protocol enabled the formation of semiconducting Mn-doped β-FeSi2 with minor Si and oxide secondary phases. This work aims to adopt the molten salt shielded synthesis method to produce oxidation-prone semiconducting materials in powder form under ambient air conditions.
The encapsulated pellet was positioned at the center of a salt bed in an alumina crucible and subjected to heat treatment under different temperature–time profiles, and each sample was named based on its heat-treatment conditions followed by the prefix “FS”. The sample encapsulated and heat-treated at 1073 K for 24 h was named “FS-1073K/24h”. The sample treated at 1273 K for 1 h followed by 1073 K for 4 h was named “FS-1273K/1h-1073K/4h”. The sample treated at 1273 K for 15 minutes and then at 1073 K for 24 h was denoted as FS-1273K/15min-1073K/12h. After heat treatment, the samples were cooled to room temperature and washed with water to completely dissolve the KBr salt. The reacted compacted pellet was filtered. The dissolved salt solution was dried, and the recovered KBr salt was reused. A schematic of the synthesis process is shown in Fig. 1.
Room-temperature and temperature-dependent electrical resistivity were measured using a home-built four-probe apparatus based on the van der Pauw method. The room-temperature Seebeck coefficient was measured on the as-synthesized pellet using a home-built setup. In this setup, the sample was placed between two copper blocks, with one block heated using a micro-heater. The temperature difference between the blocks was monitored using a K-type thermocouple connected in differential mode. The voltage was measured using copper wires soldered onto the blocks, and the Seebeck coefficient was calculated as ΔV/ΔT under steady-state conditions.
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| Fig. 2 (a) X-ray diffraction pattern of Mn-doped β-FeSi2 samples synthesized under various heat treatment conditions. (b) Rietveld refinement of the sample FS-1273K/15min-1073K/24h. | ||
Rietveld analysis of the diffraction pattern of the sample FS-1273K/15min-1073K/24h was carried out, and the results are shown in Fig. 2b. The refinement confirms that the pellet is X-ray pure and the phase fractions along with the calculated lattice parameters are given in Table 1. These results confirm that the two-step heat treatment is essential for achieving the formation of the β-FeSi2 phase.
| Sample | Density (g cm−3) | Phases present | wt% | Lattice parameters (Å) | GOF | wR |
|---|---|---|---|---|---|---|
| FS-1273/15min-1073K/24h | 2.92 | β-FeSi2 | 97.5 | a = 9.8763(2), b = 7.7900(5), c = 7.8368 (4) | 1.43 | 3.16 |
| Si | 2.5 | a = 5.4291 |
The refined lattice parameters agree well with the orthorhombic crystal structure of β-FeSi2, matching the reference pattern (ICSD #9119). Silicon (Si) was detected as a secondary phase, which is expected from eutectoid decomposition. The intentional excess of Si promoted the formation of β-FeSi2 while suppressing the formation of other iron-rich silicide phases.
Fig. 3a and b show the secondary electron micrographs of the sample heat-treated at 1273 K for 15 minutes followed by 1073 K for 24 h. The microstructure appears rough and porous, consisting of irregularly shaped particles. Some regions display partially sintered material, indicating incomplete densification resulting from the low-temperature eutectoid decomposition treatment. This porous morphology is anticipated to increase interfacial resistance, thereby affecting transport properties. Furthermore, elemental analysis of the sample surface was performed using energy dispersive spectroscopy (EDS), and the results are shown in Fig. 3c–f. The EDS mapping confirms a uniform distribution of Fe and Si, indicating good chemical homogeneity in the synthesized sample. The EDS spectrum shows major peaks for Fe and Si, with a low-intensity peak corresponding to Mn. The elemental mapping (Fig. 3d–f) shows the weight percentages of Fe and Si to be 52.9 wt% and 46.2 wt%, respectively. Elemental distribution mapping of Mn from EDS reveals a homogeneous dopant distribution. EDS mapping confirms the presence and uniform distribution of Mn and the absence of any nanoscale secondary phases. Also, no secondary Mn-containing phases were detected within the detection limit of XRD. Considering the low Mn concentration used in this study, which is well within the reported solubility limits in β-FeSi2, Mn incorporation into β-FeSi2 is possible.
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| Fig. 3 Secondary electron micrographs of FS-1273K/15min-1073K/24h at (a) a 10 µm scale and (b) a 1 µm scale; (c) EDS spectrum; elemental mapping of (d) Fe, (e) Si and (f) Mn. | ||
X-ray photoelectron spectroscopy (XPS) was performed to understand the chemical environment and oxidation states of the elements present on the sample surface. Fig. 4a shows the XPS survey spectrum of Mn-doped β-FeSi2, which confirms the presence of elements Fe, Si and Mn. Fig. 4b shows the Fe 2p spectrum, in which the peaks at 707.5 eV and 720.2 eV are assigned to the spin–orbit doublet corresponding to Fe 2p3/2 and Fe 2p1/2 of the Fe–Si bond.30,31 The area ratio between the peaks was 2
:
1 and the splitting energy was 12.7 eV. The peaks at 711–713 eV and 723–730 eV in the Fe 2p spectrum were deconvoluted into two peaks, which are associated with the oxidized Fe and satellite components, suggesting a possible surface oxide with a core silicide. The Si 2p spectrum (Fig. 4c) shows a broad peak between 101 and 103 eV, indicating the presence of Si in SiO2, suggesting surface oxidation. The peak at 98.8 eV corresponds to the Si present in the FeSi2 lattice and in elemental form. The O 1s peak at 531.2 eV indicates lattice oxygen arising from Fe–O and Si–O environments due to surface oxidation. The XPS peaks corresponding to oxidized species show the thin oxide layer formed on the surface of the material. The presence of a dominant Fe–Si peak at 102–103 eV and metallic components in the surface sensitive XPS spectra suggests the presence of the β-FeSi2 phase with a native oxide layer. The Mn 2p spectrum (Fig. 4d) shows distinct spin–orbit splitting, with Mn 2p3/2 and Mn 2p1/2 peaks at 641.4 eV and 653.5 eV, respectively. The binding energies confirm the presence of Mn in the intermetallic or semiconducting matrix.
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| Fig. 4 X-ray photoelectron spectroscopy of the sample FS-1273K/15min-1073K/24h: (a) survey spectrum, (b) Fe 2p spectrum, (c) Si 2p spectrum and (d) Mn 2p spectrum. | ||
X-ray diffraction and X-ray photoelectron spectroscopy confirm the formation of the β-FeSi2 phase with a minor Si secondary phase. Scanning electron microscopy and EDS analysis show a porous morphology with homogeneous elemental distribution, and the low density of the pellet (2.93 g cm−3) is also verified using Archimedes' method, further confirming the porous nature of the sample. To investigate the semiconducting behavior of the synthesized pellets, temperature-dependent resistivity measurements were performed (Fig. 5). The resistivity is ∼11 Ω cm at room temperature and decreases to ∼0.82 Ω cm at 773 K. This reduction in resistivity with increasing temperature confirms the semiconducting nature of the β-FeSi2 sample. The resistivity of β-FeSi2 reported in the literature typically varies between ∼10−2 and 1 Ω cm. The present sample exhibits significantly higher resistivity. This is attributed to the low density and porous microstructure, which leads to poor inter-particle electrical contact, increased grain boundary scattering and minor additional contribution from the surface oxides. The measured transport properties are dominated by extrinsic microstructural effects rather than intrinsic behavior.11,12,30
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Fig. 5 Temperature-dependent electrical resistivity of the sample FS-1273K/15min-1073K/24h (inset showing a plot of 1000/T vs. ln ρ). | ||
The temperature-dependent resistivity data were further used to plot 1000/T versus ln
ρ, from which the activation energy was estimated to be ∼0.63 eV from the slope of the intrinsic region. Considering the reported intrinsic band gap of β-FeSi2 (∼0.8–0.9 eV), the lower activation energy can be attributed to Mn-induced impurity states and grain boundary effects arising from the porous microstructure. Therefore, the extracted value represents an effective activation energy. The room-temperature Seebeck coefficient (S) of the as-synthesized pellet, measured using a home-built apparatus, is +102 ± 4 µV K−1 for the sample FS-1273K/15min-1073K/24h. The positive Seebeck coefficient confirms that the sample is p-type. The power factor, calculated using the equation PF = S2/ρ, is 0.095 µW m−1 K−2. These values are lower than those reported in the literature for β-FeSi2, which can be attributed to the low density of the synthesized pellets. The presence of the Si secondary phase, which is a semiconductor with relatively high electrical resistivity compared to β-FeSi2 could suppress electrical conduction. However, at this low concentration, it is expected to be present as a secondary dispersed phase rather than forming a continuous network. Therefore, its contribution is likely limited to a minor increase in overall resistivity and possible grain boundary scattering effects, without dominating the transport behavior. The temperature-dependent resistivity trend and room-temperature resistivity observed suggest that bulk β-FeSi2 conduction remains the primary transport mechanism. Although the thermoelectric properties are modest, this method is effective for synthesizing β-FeSi2 powder, which can be useful for composite thermoelectric and photovoltaic applications.
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