Open Access Article
Matteo R. S.
Poma
a,
Yadong
Zhang
b,
Muzhi(Charles)
Li
c,
Kaitian
Mao
b,
Ryan A.
DeCrescent
b,
Stephen
Barlow
b,
Nicholas
Rolston
cd,
Seth R.
Marder
*abef and
Michael D.
McGehee
*abe
aMaterials Science and Engineering Program, University of Colorado Boulder, Boulder, Colorado 80303, USA. E-mail: michael.mcgehee@colorado.edu
bRenewable and Sustainable Energy Institute, University of Colorado, Boulder, Colorado 80309, USA
cMaterials Science and Engineering, Fulton Schools of Engineering, Arizona State University, Tempe, Arizona 85287, USA
dSchool of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, Arizona 85281, USA
eDepartment of Chemical and Biological Engineering, University of Colorado Boulder, Boulder, Colorado 80303, USA
fDepartment of Chemistry, University of Colorado Boulder, Boulder, Colorado 80303, USA
First published on 10th February 2026
By blending a naphthalene diimide polymer into C60, we made a solution-processed electron-transport layer (ETL) for perovskite solar cells with fracture energies of 1.25 J m−2, over 3× higher than that of thermally evaporated C60. Fracture energies were measured in a double cantilever beam configuration, and fracture surface images showed a fracture location near the ETL/perovskite interface, indicating a toughening of the interface between the ETL and Ag. We show that this modification to the ETL has no adverse effect on solar cell performance, and highlight the additional benefit of reduced parasitic absorption; a finding relevant for tandem solar cells.
Broader contextPerovskite solar cells (PSCs) exceed efficiencies of 26% at the lab scale and are a promising technology to assist in the global effort to reduce greenhouse gas emissions from energy production. In the past decade, devices have been tuned to have high phase stability, thermal stability, and are steadily seeing longer lifetimes. However, at least one significant hurdle to commercialization still exists: the mechanical weakness and low fracture energy of individual layers and interfaces within the device. C60, a common electron transport layer (ETL) in p-i-n PSCs, is known to have a very low fracture energy (Gc), yet there have not been significant efforts to find a cost-effective solution that maintains the desirable electronic properties of C60 while improving the mechanical toughness of the material. Although fullerene polymerization would boost the fracture energy, chemical modification of C60 is likely too expensive to be a viable option for industry. We demonstrate that blending C60 with an electron-transporting polymer increases fracture energy by over 3× compared to pure C60, while preserving device performance. Our optimized ETLs have an average Gc of 1.25 J m−2, making this a safe option to bring mechanically robust PSCs to commercialization without adversely affecting device efficiency. |
Every layer and interface in a solar cell must be mechanically tough because, under real-world, outdoor conditions, panels may experience stresses during thermal cycling that arise from mismatches in thermal expansion coefficients of the various components in the panel or from applied mechanical loads.9 The mechanical bonding of a thin layer or material stack can be quantified by its fracture energy (Gc), a quantitative measure of the energy required to propagate a crack in the bulk material or at the interface. C60 and many of its derivatives have low fracture energies of approximately 0.3 J m−2 because the molecules are quite large, spherical, and held together only by weak van der Waals forces.5 This low Gc often leads to mechanical failure in the form of cracking in the ETL and delamination at interfaces.4–6 Researchers have also observed the failure of photovoltaic modules during outdoor testing due to C60 delamination, highlighting the need for a solution.10 Some Gc improvements have been made in C60-based ETLs. For example, You et al. modified C60 into an ionic salt with enhanced molecular packing that improved the fracture energy to 1.43 J m−2.4,11 However, a potentially more economical alternative to modifying the C60 directly is to make a composite material comprising C60 and a separate molecular or polymeric species. For example, an electron-transporting polymer has been used as an additive at low concentrations to improve the solution processability of C60 by inhibiting the aggregation of C60 molecules in solution.12 However, changes in mechanical properties of the ETL were not reported, and the complex structure of the specific polymer used, which requires a 12-step synthesis, may make it too costly to use at scale.
Unmodified C60 is already one of the most expensive materials in a perovskite solar cell, comprising 7% of the total material cost (∼4.7% of overall manufacturing cost) despite making up only 3% of the overall thickness of the active materials.8 Toughening strategies that require further chemical modification of the base C60 molecule are thus unlikely to be adopted by photovoltaic manufacturers as the costs of C60 derivatives are often substantially higher than that of the parent fullerene.
To address the shortcomings of C60, researchers have investigated a broad range of both organic and inorganic non-fullerene acceptors (NFAs).13–15 Amongst these NFAs, the naphthalene-diimide (NDI) functional group has attracted interest due to its tuneable energy levels and low absorbance in the visible light range. NDI-based small molecules and NDI polymers have been used in both normal (n-i-p) and inverted (p-i-n) perovskite solar cells as NFAs, but as with many other NFAs, NDI-based ETLs have struggled to reach the same efficiency and reproducibility as devices containing C60-based ETLs, often due to insufficient charge-carrier mobility and high series resistance.16–21 As mentioned above, researchers have mixed polymers with fullerenes in the past, however, most polymer-fullerene mixtures have been optimized at a very low polymer mass fraction. Studies have shown that polystyrene (PS) mixed with PC60BM (a common C60 derivative developed for improved solution processability over C60) at a composition of 1.5 wt% is shown to reduce fullerene dimerization, and an ultra-thin passivation layer comprised of PC60BM
:
polymethylmethacrylate (PMMA) (2
:
1) has been used to decrease hysteresis.22,23
Rather than try to synthesize a new NDI molecule with improved electronic and mechanical properties to serve as an improved ETL, here we combine the electronic properties of C60 with the mechanical properties of a NDI-based polymer that blends well with C60 in solution and the solid state, allowing us to develop a fullerene-based ETL with polymer mass fractions up to 70%. We employed a side-chain NDI polymer, poly[N-(2-ethylhexyl)-N'-(2-(methacryloyloxy)ethyl)-naphthalene-1,8:4,5-bis(dicarboximide)] (pNDI, Fig. 1A), which is synthesized in five simple steps (Scheme S1), to create a solution-processable, mixed-polymer-C60 ETL with over 3× greater fracture energies than pure C60 for all tested polymer concentrations. Optimized devices with this ETL achieved a champion PCE of 26.1% and the optimized ETL exhibited an average fracture energy of 1.27 J m−2. The similar reduction potential of pNDI to that of C60 (Ered,pNDI = −1.08 V vs. FeCp2+/0, Fig. S6, vs. Ered,C60 = −0.98 V) allows for a pNDI mass fraction of 50% without any negative effects on device PCE.24 By partially substituting C60 ($625 g−1 at the research scale) with pNDI, this composite ETL approach introduces a potential avenue for cost reduction, contingent on further cost optimization of large-scale pNDI synthesis.
We found that an overall solution concentration of 25 mg ml−1 is optimal for spin-coating thin, smooth, mixed-polymer/fullerene ETL films. Optimal film thicknesses range from 25 nm to 40 nm depending on the polymer concentration (Table S1). Fig. 2A shows the PCE of cells fabricated with an architecture of tin-doped indium oxide (ITO)//4-[(3,6-dimethyl-9H-carbazol-9-yl)butyl]phosphonic acid (Me-4 PACz): 1,6-hexylenediphosphonic acid (6dPa)//perovskite (PVK)//1,3-diaminopropane dihydroiodide (PDADI)//ETL//bathocuproine (BCP)//Ag, where the ETL is either thermally evaporated C60 or pNDI-C60 ETLs with a range of pNDI mass fractions between 20% and 70%. The highest PCEs (25.1 ± 1.19%) for cells using blends were for those using 50% mass fraction pNDI, denoted 50-pNDI-C60, virtually identical to the PCE of devices fabricated with pure evaporated C60 (25.1 ± 1.04%). Current density–voltage (JV) curves of pure C60 and 50-pNDI-C60 solar cells are shown in Fig. 2B. While the inclusion of 50 wt% pNDI preserves a stabilized PCE of >25%, it comes at the expense of a marginally increased spread of device performance compared to the thermally evaporated C60—an expected finding for solution-processed films compared to the highly controlled, homogenous, and automated nature of thermal evaporation. In the 50-pNDI-C60 device JV curve, as seen in Fig. 2B, a “bump” is observed between 0.5 and 1 V. This can be attributed to polarization effects due to mobile ions and charge accumulation at the perovskite/ETL interface, but does not have a notable effect on PCE as seen by the maximum power point tracking (MPPT) curves in Fig. S17.25 At the PCE-optimized pNDI concentration of 50%, the device's JV behaviour and performance is not compromised, despite only 50% of the ETL volume being occupied by C60. Cells fabricated with 50-pNDI-C60 and separately with evaporated C60 showed similar stability over 160 hours of accelerated aging using maximum-power point tracking in an aggressive 85 °C, 1-sun illumination environment (Fig. S18). Stability improvements may be expected since polymers have been seen to protect C60 from photo-induced dimerization and resulting degradation in electron mobilities.26
To determine whether the NDI moiety in the polymer helps retain the performance of the solar cell, we fabricated two other ETLs by using poly(methyl methacrylate) (PMMA) and polystyrene (PS) mixed with C60 at various concentrations (Fig. S20). A batch of these films on glass was first made and the film quality was assessed in a laser scanning confocal microscope (LSCM) in order to screen-out mixtures that did not deposit homogenous, pinhole-free films (Fig. S10). For all screened polymer concentrations of PMMA:C60 and PS:C60 mixed ETLs, the devices still worked as solar cells, but suffered from severe open-circuit voltage (Voc) loss and high series resistance (Fig. S20 and 21). The poor PCE of these blends demonstrates that the polymer blending approach is not completely general: the difference between the behavior of pNDI and these other polymers might reflect the ability of the NDI groups to transport charges and/or differences in film morphology, perhaps associated with better miscibility between pNDI and C60 (as suggested by UV-vis. data showing pNDI reduces C60 aggregation more effectively than PS or PMMA, see below).27
Interestingly, for pNDI-C60 mixed ETLs, we see a continuous decrease in PCE as the polymer mass concentration is either lower or higher than 50%. We also observed increased variability of the PCE across cells fabricated in the same batch as the weight fraction of pNDI deviates from the optimal 50%. This can be attributed to unfavorable phase separation of the polymer and C60 phases. When the pNDI fraction exceeds 50%, charges are likely being extracted by the polymer more than by C60, and the PCE loss as a result of low Voc may be due to high surface recombination. When the pNDI fraction is less than 50%, C60 may aggregate in solution, which may lead to pinholes and inhomogeneity in the ETL. Pinholes in the ETL lead to areas in the device where the metal electrode contacts the perovskite directly, leading to Voc losses and high recombination. The trends seen in the JV performance boxplots support these hypotheses (Fig. S16).
Because the critical stress for fracture in a thin-film sample is also dependent on fabrication quality and consistency (due to fabrication related defects such as pinholes, scratches, and impurity particles) two separate batches were made from different solutions and on different days. The aggregated, reproducible fracture energy results are shown in Fig. 2C. Aligning with values found in literature, our experimentation showed that the average fracture energy of samples fabricated with pure, thermally evaporated C60 ETL is 0.36 ± 0.07 J m−2.4–6 With as little as 20 wt% pNDI mixed into the ETL, the fracture energy increases to an average of 1.17 ± 0.11 J m−2, a greater than 3× improvement over thermally evaporated C60. As the weight fraction is gradually increased, an overall slow rise in fracture energy is observed. While the PCE-optimized ETL composition of 50-pNDI-C60 does not exhibit the highest fracture energy—an average of 1.27 ± 0.06 J m−2, compared to the average fracture energy seen in the 70-pNDI-C60 of 1.35 ± 0.07 J m−2—the difference is negligible when compared to the substantial increase in fracture energy from the control, thermally evaporated C60 films. Recently, Schutt, et al. discussed findings from outdoor testing of commercial modules, where encapsulated Si/perovskite tandems failed in outdoor testing due to delamination of the C60/tin oxide (SnOx) interface when pure, evaporated C60 is used. However, fracture was not observed with a proprietary ETL with a Gc of 0.74 J m−2.10 Our data shows that our optimized 50-pNDI-C60 ETL's Gc is 0.53 J m−2tougher than the proprietary ETL reported by Schutt, et al. that showed no delamination in indoor or outdoor aging tests.10 Our results indicate that the improved Gc in our ETL could provide a large safety buffer against the mechanical driving forces leading to failure at the ETL when employed outdoors.
Beyond the magnitude of the fracture energy, the location of fracture also provides useful information. Fracture location was determined by visually inspecting the color of residual material on each fracture surface and confirmed with atomic depth sampling using a glow discharge optical emission spectrometer (Fig. S11 and 14). In samples prepared with pure C60, as seen in Fig. 2D, the fracture occurs close to the C60/Ag interface, indicating that the C60 is a “weak-link” in the device. For all of our tested pNDI:C60 compositions, fracture occurred closer to the pNDI-C60/perovskite interface as depicted in Fig. 2E for the 50-pNDI-C60 composition (Fig. S11). Shifting of the fracture surface from near the silver interface to the perovskite interface implies strengthening of the top of the ETL stack. This adhesive strengthening at the interface may be a result of electrostatic interactions between the dipoles associated with the imide or acrylate functional groups in pNDI and the metallic silver film, whereas C60 only interacts with itself and with Ag through weak van der Waals interactions.28,29 In some samples with pNDI concentrations of ≥60%, the fracture path crosses the interface and moves between the perovskite and the ETL (Fig. S12)—an indicator that at these concentrations, the Gc of our ETL is nearing that of the perovskite.
Besides the benefit of reduced parasitic absorption, the pNDI-C60 system also reduces C60 aggregation, a feature that can be analysed from the absorption peak at 450 nm (Fig. 3A, vertical red line).32 With increasing polymer concentration, a significant suppression of the absorption “shoulder” at 450 nm is observed, indicating that pNDI prevents micron-scale C60 aggregation in the solid ETL film, resulting in a homogenously mixed film. The absence of these aggregates in the ETL may also reduce the energetic disorder of C60 and thus support electron transport in the film.33,34
To assess the importance of the NDI group in suppressing C60 aggregation, further optical absorption spectra were taken on the PMMA:C60 and PS:C60 ETL systems discussed previously. Fig. 3B shows that for any of the tested concentrations of PMMA or PS, and in solution-processed pure C60, the absorption peak at 450 nm persists. This suggests that most of the aggregation suppression induced by pNDI is not simply due to the polymeric nature of this material, but favorable polar or dispersive interactions between the C60 and the pNDI.
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Current density vs. voltage scans and MPPT measurements were taken under illumination from a Pico G2V solar simulator in an N2 environment and using a Keithley 2400 Source Measure Unit.
Optical absorption spectra were derived from transmittance spectra measured using a PerkinElmer Lambda 35 UV-vis spectrometer.
X-ray diffraction was performed with a Rigaku Smartlab 9 kW diffractometer.
Accelerated long-term stability measurements were performed in a Fluxim LitosLite multi-channel stability tester. Samples were held at 85 °C while the system's maximum-power-point tracking (MPPT) protocol was continuously performed under the nominal 1-sun AM1.5G simulated solar spectrum. Cells were illuminated through a shadow mask with a nominal area of 0.058 cm2 (squares). Data recording point rate 0.5 1/min. A light-IV scan was run once every 2 hours to track JV parameters.
:
1 (v
:
v) solution of Me4PACz (1 mg mL−1 in EtOH, TCI America) and 1,6-hexylenediphosphonic acid (0.75 mg mL−1 in EtOH, TCI America) was sonicated before use and spin-coated onto the ITO glass then treated with an annealing step. The perovskite had a 1.55 eV bandgap and a composition of Cs0.03(MA0.3FA0.97)0.97Pb(I0.97Br0.03)3. The precursor solution was made by weighing precise amounts of the following salts in a 1 mL solvent system of 4
:
1 (v/v) DMF:DMSO to form a 1.5 M solution of Cs0.03(MA0.3FA0.97)0.97Pb(I0.97Br0.03)3: methylammonium bromide (Sigma-Aldrich), CsI (Sigma-Aldrich), PbBr2 (Sigma-Aldrich), formamidiniuim iodide (Great Cell Solar), and PbI2 (TCI America).
The perovskite film was passivated by spin-coating a 2 mg mL−1 solution of propane-1,3-diammonium diiodide (“PDADI”, Great Cell Solar) in IPA followed by annealing. Finally, 60 µL of the x-pNDI-C60 ETL was spin-coated as a 25 mg mL−1 solution in dichlorobenzene. For devices with thermally evaporated C60, the substrates were moved into an Angstrom Engineering thermal evaporator, and 25 nm of C60 was deposited on top of the PDADI passivation. A 6-nm-thick hole blocking layer of bathocuproine (“BCP”, TCI America) was then thermally evaporated. Lastly 150 nm of Ag (Kurt J. Lesker Company) was thermally evaporated to finish the devices.
All solutions and devices were made in gloveboxes with controlled nitrogen environments with O2 levels at <0.1 ppm and moisture content at <0.1 ppm.
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