In situ X-ray-based spectroscopy techniques for the characterization of solid–gas interfaces in nanostructures: what is next?

Abstract

In situ spectroscopy measurements have changed the way scientists analyze nanostructures in different fields like catalysis, electrochemistry, and energy production and storage, among others. The exciting and impactful results from in situ spectroscopy measurements over the years have demonstrated new atomic phenomena, shedding light on the complex events existing in the nanoworld. This method is already well stablished and used in a variety of interfaces like solid–gas, solid–liquid, and liquid–gas, but it continues to evolve toward more sophisticated experiments that are needed to address the current scientific challenges. In this perspective, a brief overview of the evolution of in situ measurements of solid–gas interfaces is given, followed by modern experiments and procedures currently coupled with in situ methods and some important challenges. At the end, future targets of in situ measurements are presented and discussed.