A GaN/HfZrCO2 heterojunction with excellent photoresponse and superior hydrogen evolution reaction performance
Abstract
In this work, first-principles calculations are employed to investigate GaN/HfZrCO2 heterostructures in terms of structural stability, electronic properties, optoelectronic behavior, and mechanical characteristics. Monolayer GaN and HfZrCO2 are indirect semiconductors with bandgaps of 3.20 eV and 1.73 eV, respectively, while their heterostructure exhibits a reduced type-II indirect bandgap of 1.673 eV, enabling an extended spectral response and efficient separation of photogenerated carriers. Work-function and charge-distribution analyses reveal an intrinsic interfacial electric field directed from GaN to HfZrCO2. Under biaxial strain from −8% to +8%, the heterostructure shows pronounced bandgap modulation under compression but remains strain-insensitive under tension. For the hydrogen evolution reaction, hydrogen adsorption on the N site yields the most favorable configuration with a low overpotential of 0.27 V, indicating excellent catalytic activity. The heterostructure also exhibits strong broadband light absorption with a maximum absorption coefficient of 5.89 × 105 cm−1. Overall, GaN/HfZrCO2 demonstrates significant potential for future energy applications and next-generation optoelectronic devices.

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