Ya
Wang‡
ab,
Min
Chen‡
ab,
Manning
Hu
a,
Anxin
Jiao
a,
Faxin
Wang
a,
Xiaolong
Zheng
b,
Wanqing
Li
a,
Xin
Tang
*ab and
Huicheng
Hu
*a
aYangtze Delta Region Academy of Beijing Institute of Technology, Jiaxing 314019, People's Republic of China. E-mail: huichenghu@bitjx.edu.cn
bSchool of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, People's Republic of China
First published on 19th June 2025
Lead selenide (PbSe) colloidal quantum dots (CQDs) are promising candidates for short-wave infrared (SWIR) photodetectors due to their low-cost fabrication and solution processability. However, conventional ligand exchange strategies, such as treatment with 1,2-ethanedithiol (EDT), usually lead to incomplete defect passivation and undesirable doping characteristics. Here, we developed a hybrid-ligand strategy by combining EDT and zinc iodide (ZnI2) to simultaneously passivate surface defects and modulate the doping type of PbSe CQD films. As a result, the photodetector responsivity improves from 0.04 A W−1 to 0.40 A W−1, and the specific detectivity increases from 3.4 × 1010 Jones to 2.8 × 1011 Jones at 500 Hz under zero bias. The optimized device exhibits a wide linear dynamic range exceeding 114 dB and a fast response time of 7.3 μs. Finally, the infrared imaging applications of PbSe CQD photodetectors were successfully demonstrated. This work highlights the importance of synergistic surface passivation and doping modulation in enhancing the performance of CQD photodetectors.
To fabricate conductive films suitable for optoelectronic applications, the long and insulating ligands used in CQD synthesis need be replaced with shorter organic linkers or halide anions. Various small ligands, including 1,2-ethanedithiol (EDT), benzenedithiol, mercaptopropionic acid, and tetrabutylammonium iodine, have been demonstrated to remove the insulating ligands and passivate the surface defects of CQDs.16–18 Nonetheless, conventional ligand exchange methods often lead to incomplete surface coverage or unintended defects. Recently, Zhang et al. developed a hybrid ligand co-passivation strategy that precisely positions halide anions at Pb sites and metal cations at Se sites, achieving targeted passivation of PbSe CQDs and further enhancing IR power conversion efficiency in the CQD solar cells.19 However, such multifunctional passivation strategies have been less extensively studied in PbSe CQD photodetectors, despite their potential to significantly reduce trap-assisted recombination and improve device performance.
Meanwhile, achieving high-performance photodetectors relies on optimizing the doping characteristics of the PbSe CQD active layer, as well as controlling the built-in field between the absorption and transport layers, which critically influences carrier separation and collection.20–22 Sargent et al. introduced a cascade surface modification strategy, providing control over doping and enabling n-type and p-type CQDs.23 Hence, ligands can offer a promising approach for controlling doping characteristics in CQDs, providing further opportunities to enhance device performance.23–26
In this work, we developed a hybrid-ligand exchange strategy combining EDT and zinc iodide (ZnI2) to simultaneously suppress surface defects and modulate the doping characteristics of PbSe CQD films. The incorporation of ZnI2 plays a critical role by providing robust chemical passivation through the incorporation of Zn2+ and I− ions onto the CQD surfaces, effectively reducing trap-state density. Ultraviolet photoelectron spectroscopy (UPS) measurement reveals that ZnI2 treatment significantly modulates the Fermi levels of PbSe CQD films, promoting a shift from n-type to near-intrinsic behavior and enhancing carrier collection. As a result, the responsivity of the PbSe CQD photodetector increases from 0.04 A W−1 to 0.40 A W−1, and the specific detectivity (D*) improves from 3.4 × 1010 to 2.8 × 1011 Jones at 500 Hz under zero bias. Additionally, the device demonstrates a wide linear dynamic range (LDR) exceeding 114 dB and a fast response time of 7.3 μs. Finally, the imaging capability of the PbSe CQD photodetectors was successfully demonstrated.
PbSe CQD films with EDT and EDT/ZnI2 treatment (denoted as PbSe-EDT and PbSe-EDT/ZnI2) were fabricated via a layer-by-layer method (see the Experimental section for details). The scanning electron microscopy (SEM) images of PbSe-EDT films exhibit noticeable cracking, while that of PbSe-EDT/ZnI2 films present a uniform, crack-free morphology (Fig. 1C). This stark contrast is primarily attributed to the distinct effects of the two ligand treatments on film stress relaxation and microstructural evolution, with the hybrid passivation approach providing improved interparticle connectivity.27
Fourier transform infrared spectroscopy (FTIR) was performed to analyze the surface chemistry before and after ligand exchange. As shown in Fig. 1D, the intensities of C–Hx vibrations (2852–3011 cm−1) and COO− vibrations (1410–1512 cm−1) are significantly reduced after ligand exchange,28,29 indicating that most of the original oleic acid (OA) ligands were successfully replaced by the EDT or EDT/ZnI2.
The absorption spectra before and after ligand exchange were recorded (Fig. 1E). Compared to the original OA-capped CQD solution (Fig. S3, ESI†), the excitonic absorption peaks of the PbSe-EDT and PbSe-EDT/ZnI2 films show a redshift of 28 nm and 2 nm, respectively. This spectral shift primarily results from two concurrent phenomena occurring during ligand exchange: (1) enhanced inter-dot electronic coupling due to reduced inter-particle distances, and (2) partial inter-dot fusion.30–33 The significantly smaller redshift observed in PbSe-EDT/ZnI2 films indicates that the hybrid ligand treatment enables a more stable ligand exchange process, effectively inhibiting inter-dot fusion. Furthermore, as shown in Fig. S4 (ESI†), thermal treatment at 90 °C in nitrogen for 1 hour causes significant broadening and redshift of the excitonic peak in the PbSe-EDT film, while the PbSe-EDT/ZnI2 film remains nearly unchanged. This stability improvement may be attributed to the synergistic effect of ZnI2: the ZnI2 facilitates deprotonation of the EDT molecules,34 thereby strengthening their coordination to the CQD surface, while ZnI2 itself also contributes additional surface coordination.
The detailed surface properties of the PbSe CQD films were investigated by X-ray photoelectron spectroscopy (XPS) measurement. No signals of Zn and I elements can be found in the PbSe-EDT film (Fig. 2A and B). The two distinct peaks appear at 1022.31 and 1045.41 eV in the EDT/ZnI2 film, corresponding to the Zn2+ 2p3/2 and 2p1/2 orbitals, suggesting the possible incorporation of Zn2+ ions on the CQD surface.35,36 Similarly, two clear peaks at 619.41 and 630.91 eV in the PbSe-EDT/ZnI2 film are assigned to the I− 3d5/2 and 3d3/2 orbitals, indicating the potential incorporation of I− ions on the CQD surface.35,37 The Pb 4f peaks of the PbSe-EDT/ZnI2 film shift to higher binding energies compared to those of the PbS-EDT film (Fig. 2C), suggesting that I− ligands effectively coordinate with Pb sites due to the higher binding energy of Pb–I compared to Pb–Se and Pb–S.37–39 Additionally, as shown in Fig. 2D, the Se 3d peaks show an obvious shift toward higher binding energy, further confirming the passivation of exposed Se atom sites on the PbSe (200) facets by Zn2+ cations.35,36,40
To verify the passivation effect of ZnI2, the density of trap states of PbSe-EDT and PbSe-EDT/ZnI2 films was studied using the space-charge-limited current (SCLC) measurements. For this purpose, a hole-only device structure with indium-doped tin oxide (ITO)/PbS-EDT CQDs/PbSe CQDs/PbS-EDT CQDs/ZnTe/ITO was fabricated. The trap density (ntrap) was estimated from the SCLC curves (Fig. 2E and F) based on the expression.41
ntrap = 2ε0εCQDVTFL/qL2 | (1) |
To evaluate the band structure of PbSe CQD films, the Fermi level (EF) and the valence band maximum (EVBM) of PbS-EDT and PbSe-EDT/ZnI2 films were determined by using UPS characterization. As shown in Fig. 2G and H, the EF and EV of the PbSe-EDT film are −4.68 and −5.20 eV, suggesting a slight n-doping for PbSe CQDs with a bandgap of ∼0.77 eV. In contrast, the EF and EV of the PbSe-EDT film are −4.80 and −5.19 eV, indicating quasi-intrinsic doping for PbSe CQDs with a bandgap of ∼0.79 eV. This result suggests that the ZnI2 ligands significantly alter the doping characteristics, effectively adjusting the CQDs from n-type to a more intrinsic behavior (Fig. 2I). Such band alignment modifications are crucial for optimizing the performance of PbSe CQD photodetectors. Fig. S5 and S6, ESI† show the energy level information for the ZnO electron transport layer (ETL) obtained by transmission spectrum and UPS measurements. The results indicate that compared to the PbSe-EDT layer, the PbSe-EDT/ZnI2 layer exhibits an enhanced built-in field at the heterojunction interface with the ETL and an improved carrier transport efficiency (Fig. S7, ESI†).
To demonstrate the advantages of the hybrid ligand exchange strategy, SWIR photodetectors were fabricated using a top-illuminated architecture, featuring an ITO/ZnO/PbSe CQDs/PbS-EDT CQDs/ZnTe/ITO.34,42 Notably, the ZnTe film shows a high transmittance of 93.4% at 1560 nm, suggesting exceptional optical properties of the hole transport layer in SWIR photodetectors (Fig. S8, ESI†). As shown in Fig. 3A, the cross-sectional SEM image shows that the thickness of the ZnO, PbSe CQDs, PbS-EDT CQDs and ZnTe functional layers is approximately 60 nm, 400 nm, 45 nm, and 40 nm, respectively, with well-defined interfaces. The typical current density–voltage (J–V) curves of photodetectors based on PbSe-EDT and PbSe-EDT/ZnI2 absorption layers are shown in Fig. 3B. For the photoresponse measurement, a 1550 nm LED with an illumination intensity of about 0.4 mW cm−2 was employed. The PbSe-EDT/ZnI2 device exhibits significantly higher photocurrent compared to the PbSe-EDT device, highlighting the superior charge extraction enabled by hybrid ligands. The improvement is further supported by the broadband external quantum efficiency (EQE) and responsivity from 400 to 2000 nm (Fig. 3C and Fig. S9, ESI†). Notably, the EQE of the PbSe-EDT/ZnI2 device reaches 31.4%, which is far higher than 2.8% achieved by the PbSe-EDT device. The enhanced EQE is attributed to the incorporation of ZnI2, which reduces the trap state density and improves the carrier transport. The performances of devices with different ZnI2 concentrations were recorded (Fig. S10A, ESI†). The device with 10 mM ZnI2 exhibited the lowest dark current and highest EQE (Fig. S10B and Table S1, ESI†), which may be attributed to insufficient passivation of CQDs at low ZnI2 concentrations, while excessive ZnI2 could form an insulating matrix that hinders charge carrier transport.
We found that the integration of EDT ligands is crucial for achieving high-performance photodetectors. The PbSe CQD photodetector based on pure ZnI2 ligands (denoted as PbSe–ZnI2) was fabricated, and its performance was systematically evaluated. As shown in Fig. S11 (ESI†), compared to the PbSe–ZnI2 device, the dark current density in the PbSe-EDT/ZnI2 device is reduced by more than an order of magnitude, primarily due to the effective passivation provided by EDT ligands. This significant reduction in dark current also translates into a suppressed noise current, as evidenced by the frequency-dependent noise current spectra in Fig. S12 (ESI†). Moreover, the PbSe-EDT/ZnI2 device exhibits considerably enhanced photocurrent extraction under zero bias, along with an improved EQE (Fig. S13, ESI†). These results clearly demonstrate that EDT ligands play a crucial role in passivating the surface trap states of PbSe CQDs, working synergistically with ZnI2 to protect CQD surfaces from defects.
To expectantly realize efficient light utilization, we fabricated PbSe-EDT/ZnI2 photodetectors with varying absorption layer thicknesses, ranging from 200 to 600 nm, via controlling the spin-coating processes. Interestingly, the photocurrent density and EQE of the devices did not increase monotonically with the thickness of the absorption layer, as illustrated in Fig. S14 and S15 (ESI†). When the absorption layer thickness increases from 200 to 400 nm, the EQE significantly improves from 21.0% to 31.4% at zero bias, indicating enhanced light harvesting and more efficient charge collection. However, further increasing the thickness to 600 nm results in a reduced EQE of 19%. At the same time, we conducted EQE spectral measurements of these detectors under varying bias voltages. We found that as the thickness increases, the EQE becomes more dependent on the applied bias (Fig. S16, ESI†).
Additionally, the dark current density of these devices follows a non-monotonic trend with increasing absorption layer thickness. For instance, when the PbSe-EDT/ZnI2 CQD layer thickness is only 200 nm, the device exhibits a high dark current density of 2.26 μA cm−2 at −0.5 V, which drops to 0.92 μA cm−2 for a 400 nm absorption layer, before increasing again at 600 nm (Fig. S13, ESI†). This suggests that an optimal absorption layer thickness exists, balancing efficient light absorption, carrier transport, and reduced noise, resulting in the highest signal-to-noise ratio at 400 nm.
The performances of PbSe CQD photodetectors were further evaluated by D*, calculated using the following expression:43–45
D* = R(AΔf)1/2/in | (2) |
Meanwhile, the J–V curves of the optimized photodetector were measured under different incident light power densities using a 1550 nm LED as the light source (Fig. S18, ESI†). As the light power density received by the device ranges from 16 nW cm−2 to 7.65 mW cm−2, the photocurrent exhibits a linear dependence on the light intensity, resulting in a wide LDR exceeding 114 dB at zero bias (Fig. 3E). In addition, the response speed of the device with an active area of 0.04 cm2 was tested at zero bias by a 1550 nm LED as a light source. The rise and fall times are determined to be 7.3 and 22.5 μs (Fig. 3F), suggesting a relative fast response of the photodetectors.
To investigate the infrared imaging capability of the PbSe CQD photodetectors, a single-point imaging system was constructed, as illustrated in Fig. 4A. This imaging system consists of several key components: a tungsten filament lamp as the infrared light source, a scanning lens for precise object imaging, and a PbSe CQD photodetector operated at zero bias. The scanning lens is controlled by dedicated software, allowing coordinated movement of both the lens and the target image to ensure accurate focus. When the scanned image reaches the active area of the photodetector, the optical signal is converted into an electrical signal. This signal, along with the corresponding displacement data from the scanning system, is captured by an acquisition card. Finally, the imaging software processes the collected data, generating the imaging results.
The imaging capability of the PbSe CQD photodetector was first evaluated using a mask engraved with the letters “BIT” as the imaging object. As shown in Fig. 4B, the PbSe CQD photodetector clearly captures the pattern, demonstrating its imaging performance in comparison to visual observation. Furthermore, a demonstrative experiment was conducted to assess the detector's potential for chemical solvent discrimination. Water (H2O) and tetrachloroethylene (TCE) were selected as representative samples. While both solvents appear visually transparent when imaged using a conventional silicon imager under natural light (Fig. 4C), they exhibit distinct infrared absorption characteristics. H2O has a significantly higher absorption coefficient for infrared light compared to TCE. As a result, the PbSe CQD photodetector shows a darker image when capturing H2O, while TCE appears brighter. This contrast highlights the potential of the PbSe CQD photodetector for substance screening applications. To further evaluate the material penetration imaging capability of the PbSe CQD photodetector, we placed a Si wafer as the screen on the glass bottles for H2O and TCE. Due to the strong absorption of natural light by the Si wafer, a conventional silicon imager is unable to capture the image of the underlying glass bottles (Fig. 4D). In contrast, the PbSe CQD photodetector, using an infrared light source, successfully penetrates the Si wafer and clearly reveals the contours of the concealed glass bottles. This result demonstrates the PbSe CQD photodetector's ability for effective material penetration imaging, highlighting its potential for advanced imaging applications.
Footnotes |
† Electronic supplementary information (ESI) available: Size distributions, XRD patterns, absorption spectrum of PbSe CQDs; J–V curves, broadband responsivity, and noise spectral density of PbSe CQD photodetectors. See DOI: https://doi.org/10.1039/d5tc02115d |
‡ Ya Wang and Min Chen contributed equally to this work. |
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