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Correction: Structural, electrical, and optical properties of NiO films for surface-enhanced Raman spectroscopy applications

Long Nguyen Hoangab, Le Huu Baoab and Tran Le*ab
aFaculty of Physics & Engineering Physics, University of Science, VNU-HCM, Ho Chi Minh City, Vietnam. E-mail: ltran@hcmus.edu.vn
bVietnam National University Ho Chi Minh City, Ho Chi Minh City, Vietnam

Received 12th June 2025 , Accepted 12th June 2025

First published on 30th June 2025


Abstract

Correction for ‘Structural, electrical, and optical properties of NiO films for surface-enhanced Raman spectroscopy applications’ by Long Nguyen Hoang et al., RSC Adv., 2025, 15, 17365–17376, https://doi.org/10.1039/D5RA02866C.


The authors regret that the affiliations were incorrectly shown in the original manuscript. The corrected list of affiliations is as shown herein.

The Royal Society of Chemistry apologises for these errors and any consequent inconvenience to authors and readers.


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