Long Nguyen Hoangab,
Le Huu Baoab and
Tran Le*ab
aFaculty of Physics & Engineering Physics, University of Science, VNU-HCM, Ho Chi Minh City, Vietnam. E-mail: ltran@hcmus.edu.vn
bVietnam National University Ho Chi Minh City, Ho Chi Minh City, Vietnam
First published on 30th June 2025
Correction for ‘Structural, electrical, and optical properties of NiO films for surface-enhanced Raman spectroscopy applications’ by Long Nguyen Hoang et al., RSC Adv., 2025, 15, 17365–17376, https://doi.org/10.1039/D5RA02866C.
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