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Correction: Mitigating substrate effects of van der Waals semiconductors using perfluoropolyether self-assembled monolayers
Dae Young
Park
a,
Hyeong Chan
Suh
a,
Seungho
Bang
a,
Ju Chan
Lee
b,
Jaekak
Yoo
a,
Hayoung
Ko
b,
Soo Ho
Choi
b,
Ki Kang
Kim
b,
Seung Mi
Lee
c,
Seong Chu
Lim
b,
Tschang-Uh
Nahm
a and
Mun Seok
Jeong
*a
aDepartment of Physics, Hanyang University, Seoul 04763, Republic of Korea. E-mail: mjeong@hanyang.ac.kr
bDepartment of Energy Science, Sungkyunkwan University, Suwon 16419, Republic of Korea
cKorea Research Institute of Standards and Science, Daejeon 34114, Republic of Korea
First published on 13th June 2025
Abstract
Correction for ‘Mitigating substrate effects of van der Waals semiconductors using perfluoropolyether self-assembled monolayers’ by Dae Young Park et al., Nanoscale, 2024, 16, 10779–10788, https://doi.org/10.1039/D4NR00061G.
The authors regret that a project funder number was incorrectly listed in the Acknowledgements section in the published article. The corrected Acknowledgements section should read as follows.
This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (No. RS-2023-00260527 and 2022R1A2C2091945). This work was also supported by Material Parts Technology Development Program (‘20017100’, Performance evaluation of UV Lens module mounted for semiconductor defects (less than 10 nm) inspection system) funded by the Ministry of Trade, Industry & Energy (MOTIE, Korea). D. Y. Park acknowledges support from the National Research Foundation of Korea (NRF) under grant no. NRF-2021R1I1A1A01060493. This work was partially supported (SMLee) by a National Research Council of Science & Technology (NST) grant by the Korean Government (MSIT) (no. CAP-18-04-KRISS and no. CPS23111-110).
The Royal Society of Chemistry apologises for these errors and any consequent inconvenience to authors and readers.
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