Open Access Article
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Expression of concern: A hysteresis-free perovskite transistor with exceptional stability through molecular cross-linking and amine-based surface passivation
Hyeong Pil
Kim
a,
Maria
Vasilopoulou
*b,
Habib
Ullah
c,
Salma
Bibi
c,
Anderson Emanuel Ximim
Gavim
d,
Andreia Gerniski
Macedo
d,
Wilson Jose
da Silva
d,
Fabio Kurt
Schneider
d,
Asif Ali
Tahir
c,
Mohd Asri Mat
Teridi
e,
Peng
Gao
f,
Abd. Rashid bin Mohd
Yusoff
*g and
Mohammad Khaja
Nazeeruddin
*h
aAdvanced Display Research Center, Department of Information Display, Kyung Hee University, Dongdaemoon-gu, Seoul 130-701, South Korea
bInstitute of Nanoscience and Nanotechnology, National Center for Scientific Research “Demokritos”, 15341 Agia Paraskevi, Attica, Greece. E-mail: m.vasilopoulou@inn.demokritos.gr
cEnvironment and Sustainability Institute, University of Exeter, Penryn Campus, Penryn, Cornwall TR10 9FE, UK
dUniversidade Tecnológica Federal do Parana–Av. Sete de Setembro, 3165-CEP 80230-901, Curitiba, Parana, Brazil
eSolar Energy Research Institute, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor, Malaysia
fCAS Key Laboratory of Design and Assembly of Functional Nanostructures, and Fujian Provincial Key Laboratory of Nanomaterials, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fuzhou, Fujian 350002, China. E-mail: peng.gao@fjirsm.ac.cn
gDepartment of Physics, Swansea University, Vivian Tower, Singleton Park, SA2 8PP, Swansea, UK. E-mail: a.r.mohdyusoff@swansea.ac.uk
hInstitute of Chemical Sciences and Engineering, École Polytechnique Fédérale de Lausanne (EPFL), Rue de l'Industrie 17, CH-1951 Sion, Switzerland. E-mail: mdkhaja.nazeeruddin@epfl.ch
First published on 2nd April 2025
Abstract
Expression of concern for ‘A hysteresis-free perovskite transistor with exceptional stability through molecular cross-linking and amine-based surface passivation’ by Hyeong Pil Kim et al., Nanoscale, 2020, 12, 7641–7650, https://doi.org/10.1039/C9NR10745B.
Nanoscale is publishing this expression of concern in order to alert readers that concerns have been raised regarding the integrity of the XRD data in Fig. 4, which the authors have said has been performed by a third party. We have asked the relevant affiliated institutions to investigate this matter fully. An expression of concern will continue to be associated with the article until we receive conclusive evidence regarding the reliability of the reported data.
Heather Montgomery
26th March 2025
Managing Editor, Nanoscale
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