Jegadesan
Subbiah
*a,
Akhil
Gupta
b,
David J.
Jones
*a and
Jingliang
Li
*b
aSchool of Chemistry, Bio21 Institute, The University of Melbourne, Parkville, VIC 3010, Australia. E-mail: jsubbiah@unimelb.edu.au; djjones@unimelb.edu.au
bInstitute for Frontier Materials, Deakin University, Geelong, VIC 3216, Australia. E-mail: jingliang.li@deakin.edu.au
First published on 14th February 2025
Interface engineering of organic semiconductors is critical for efficient charge extraction from organic photoactive layers to inorganic electrodes, which is a key factor in optimising organic solar cell performance. Incorporating polar groups into electron transport layer (ETL) materials can reduce their work function by forming appropriate dipoles between the photoactive layer and the electrode. This study reports a promising ETL material, 2,9-bis(2-(2-(2-methoxyethoxy)ethoxy)ethyl)anthra[2,1,9-def:6,5,10-d′e′f′]diisoquinoline-1,3,8,10(2H,9H)-tetraone, coded PDIAO, based on a perylene diimide (PDI) core with tri(oxyethylene) chains at the imide positions. PDIAO exhibited efficient energy level alignment and good interface contact with the active layer, facilitating efficient electron extraction. Organic photovoltaic (OPV) devices with the PM6:IT-4F active layer, a PDIAO interlayer, demonstrated enhanced performance, achieving a power conversion efficiency (PCE) of 13% compared to the PCE of 10.9% for the OPV device with the PFN-Br interlayer. Various spectroscopic and electrical characterisation analyses of ETL materials and OPV device performance revealed that the PDIAO interlayer significantly reduces the work function of the active layer by forming interface dipole and enhanced charge transport for efficient electron extraction. These results suggest that tri(oxyethylene)-functionalised PDI derivatives are promising ETL materials for efficient electron extraction in OPV devices.
Interlayer materials play a crucial role in providing Ohmic contact between the organic active layer and metal electrode, thereby reducing the energy barrier and facilitating charge transport.18,19 In OPV devices, most interlayers are based on inorganic layers such as TiO2, ZnO, SnO2, etc.20,21 These materials require high-temperature treatment for efficient performance, limiting their use in flexible substrates. Polymer-based ETL layers such as PFN, PEIE, and PFN-Br are widely used in OPV devices for efficient electron extraction.22,23 However, the variability of these polymer materials in batch-to-batch and molecular weight control can hinder their use in OPV device fabrication. This highlights the urgent need for research and development in this area. Small molecule-based ETL materials such as PDIN, PDINO, PDINN, and PFN-2TNDI offer advantages over polymer-based materials.12,24,25 They exhibit good repeatability in synthesis, ensuring high purity and leading to superior device performance in non-fullerene-based OPV devices. These materials can form interfacial dipoles, providing ohmic contact and facilitating efficient electron extraction.12,24–26
As mentioned above, and given that PDI-based materials offer excellent electron transport properties, we prepared a tri(oxyethylene)-functionalised PDI derivative by directly attaching tri(ethylene glycol) methyl ether amine units to the perylene unit at the imide positions to generate PDIAO. This was done to provide good Ohmic contact for efficient electron transport.27,28 It is notable that this target material has been reported previously in the literature, where it was studied for its selectivity toward G-rich DNA capable of forming quadruplex structures29 and used as an efficient electron shuttle for reactions with O2.30 Our motivation for using such amine units is based on the proven fact that these units can help improve surface morphology and, consequently, the overall performance of OPV devices.31 The multiple oxygen groups in the tri(oxyethylene) chain enhance the dipole moment, improving the ability to modify the work function for an effective electron interface layer.28,32 To compare the performance of PDI with tri(oxyethylene) side chain ETL materials, we also synthesised the ETL materials with aliphatic group- and aliphatic amine group-functionalised PDI molecules. All three materials were synthesised and used as ETL materials in OPV devices to evaluate their performance. Using the tri(oxyethylene) sidechain-based ETL materials as a cathode interlayer, the device with PM6:IT-4F active layer exhibited enhanced performance with an average PCE of 13%. These results suggest that the polar-rich side chain functionalised PDI materials are a good candidate for ETL materials for future large-area applications of OPV devices.
ETL | Optical absorption (λmax, λonset) (nm) | Band gap (Eg) eV | Cyclic voltammetry (eV) | |||
---|---|---|---|---|---|---|
Solution | Film | HOMO | LUMO | E g | ||
PDIN | 530![]() |
500![]() |
1.94 | −6.10 | −3.80 | 2.3 |
PDIA | 525![]() |
580![]() |
2.00 | −5.90 | −3.90 | 2.0 |
PDIAO | 525![]() |
570![]() |
2.06 | −5.95 | −3.95 | 2.0 |
Compared to the PDIN film, the PDIAO film exhibits blue-shifted absorption with an absorption edge of 600 nm, suggesting strong aggregation properties due to the polar oxygen functionalised sidechain. This observation is consistent with previous reports on the influence of polar side chains on the aggregation behavior of PDI-based materials33 To determine the highest occupied molecular orbital (HOMO) and the lowest unoccupied molecular orbital (LUMO) energy levels of ETL materials, cyclic voltammetry measurements were carried out. The energy level values are given in Table 1. Fig. S3 (ESI†) showed the onset oxidation (ϕox) and reduction potentials (ϕred) of ETL materials. The energy levels (HOMO and LUMO) of all the materials were calculated using the equation EHOMO/LUMO = −e(ϕox/red − ϕFc+/Fc + 4.8) eV. The HOMO energy values of PDIN, PDIA and PDIAO are calculated as 6.10 eV, 5.90 eV and 5.95 eV, respectively. The deep HOMO values effectively block the holes at the cathode. The LUMO values of PDIN, PDIA, and PDIAO were calculated as 3.80 eV, 3.90 eV, and 3.95 eV, respectively. Notably, the LUMO value of PDIAO is very close to the acceptor LUMO level, and it provides improved energy level alignment at the cathode interface and facilitates efficient electron extraction.
To investigate the effect of ETL materials on electron collection efficiency, we have fabricated OPV devices with the conventional device geometry, ITO/PEDOT:PSS/PM6:IT-4F/ETL/Ag, as is shown in Fig. 1a. The energy levels of all the materials used in device fabrication are shown in Fig. 1b, and the molecular structures of polymer PM6, NFAs IT-4F and Y6 are shown in Fig. 2a. The J–V curves of the OPV devices with the ETL of PFN-Br, PDIN, PDIA and PDIAO are shown in Fig. 2b, and the corresponding device characteristics parameters are given in Table 2. Here, the control device with a PFN-Br interlayer shows a PCE of 12.1% (with a Jsc of 20.3 mA cm−2, Voc of 0.80 V and fill factor (FF) of 73%), whereas the device with a PDIN interlayer exhibits a PCE of 12.25% (with Jsc of 20.7 mA cm−2, Voc of 0.82 V and FF of 74%). These results indicate that the PDIN interlayer has a significant advantage over the PFN-Br interlayer in improving the device performance of NFA-based OPV devices. The OPV device with the PDIA interlayer shows lower performance with a PCE of 9.9%, which might be attributed to a lack of functional groups in the sidechain groups. The device with a 10 nm PDIAO layer delivers superior performance with the best PCE of 13.3% (average PCE of 13%), compared to the device with other ETLs such as PFN-Br, PDIN and PDIA. The enhanced performance is primarily due to increased FF, Jsc and Voc values. Here, the maximum thickness for the spin-coated ETL layer is 10 nm; further increase in ETL thickness reduces the device performance.
![]() | ||
Fig. 2 (a) Molecular structures of the donor polymer PM6 and non-fullerene acceptors IT-4F and Y6, (b) J–V plot and (c) EQE of the OPV devices with various cathode interlayers. |
ETL | J sc (mA cm−2) | V oc (V) | FF (%) | PCE (%)a (best cell) |
---|---|---|---|---|
a PCE values are calculated using 12 devices for each active layer. | ||||
PFN-Br | 20.3 ± 0.25 | 0.80 ± 0.02 | 73 ± 2 | 11.8 ± 0.25 (12.10) |
PDIN | 20.7 ± 0.20 | 0.82 ± 0.02 | 74 ± 3 | 11.9 ± 0.30 (12.25) |
PDIA | 18.9 ± 0.30 | 0.76 ± 0.03 | 65 ± 3 | 9.8 ± 0.35 (9.90) |
PDIAO | 20.9 ± 0.25 | 0.84 ± 0.02 | 76 ± 2 | 13.0 ± 0.25 (13.30) |
The external quantum efficiency plot (Fig. 2c) of OPV devices with PDIN, PDIA and PDIAO interlayers confirms the reliability of measured Jsc values. The integrated Jsc values, which are calculated from EQE plot of the OPV devices based on PFN-Br, PDIN, PDIA and PDIAO ETL layers, are 18.9, 19.2, 18.0 and 20.1 mA cm−2, respectively, which are in good agreement with the measured Jsc values within 5% error. To further evaluate the performance of PDIAO interlayer, we investigated its use in OPV devices with PM6:Y6 active layers. The device performances are given in Fig. S4 (ESI†). As summarised in Table S1 (ESI†), the OPV device with a PM6:Y6 active layer and PDIAO interlayer exhibits the best performance of 16.1%, compared to the 15.2% PCE of the device with the PFN-Br interlayer. These results suggest that the PDIAO ETL layer is a promising candidate for use in various NFA-based OPV devices as an efficient cathode interlayer.
To explore the effect of ETL layers on the device performance, we studied the electronic properties, such as work function and the HOMO energy level, to understand the energy level alignment of the photoactive layer with various ETL layer materials using ultraviolet photoelectron spectroscopy (UPS).12 The secondary electron cut-off edge of the UPS spectrum provides the work function of the materials, as shown in Fig. 3a. The electronic parameter characteristics are given in Table 3. Fig. 3a demonstrates that the work function of the PM6:IT-4F blend film is 4.52 eV. When coating the ETL layer on top of the active layer, the work function value decreases to 4.27, 4.37 and 4.17 eV for the PDIN, PDIA and PDIAO based layers, respectively. Here, PDIAO exhibited a more substantial work function reduction ability compared to other ETL layers, suggesting the formation of an appropriate interface dipole between the active layer and metal contact to provide Ohmic contact. This reduced energy barrier facilitates efficient charge extraction, leading to improved Jsc, Voc and FF in OPV devices.
PM6:IT-4F/ETL | Secondary electron cut-off (eV) | Fermi level (eV) | Valence band edge (eV) | HOMO level (eV) |
---|---|---|---|---|
Without ETL | 16.70 | −4.52 | 0.6 | −5.12 |
PDIN | 16.85 | −4.27 | 1.6 | −5.87 |
PDIA | 16.90 | −4.37 | 0.7 | −5.07 |
PDIAO | 17.05 | −4.17 | 1.7 | −5.87 |
The HOMO level of the active layer film with and without ETL layers was calculated from the low-binding energy edge of the UPS spectrum using the formula, EHOMO = hν − (Ecutoff − Eonset), where hν is the incident He I photon energy (21.22 eV), Ecutoff is the secondary electron cut-off energy and Eonset is HOMO level onset energy. As shown in Table 3, the HOMO level of the PDIAO layer is 5.87 eV, which is deeper than that of other ETL layers. The higher HOMO value provides efficient hole-blocking ability at the cathode interface. These UPS studies support the favourable energy level alignment of ETL layers for efficient ohmic contact with a reduced energy barrier at the cathode interface.
To investigate the effect of ETL layers on device performance, we studied the surface morphology of PM6:IT-4F blend films with and without the ETL layers using tapping mode AFM.34Fig. 4a shows the height and phase images of PM6:IT-4F blend film, revealing a nanoscale phase-separated morphology with a surface roughness of 1.46 nm. Upon coating the ETL layer on top of the active layer film, the phase-separated morphology was retained, but the surface roughness increased to 1.65, 1.76 and 2.1 nm for PDIN, PDIA and PDIAO interlayers, respectively. As shown in Fig. 4d, the PDIAO interlayer exhibited increased aggregation, confirming its interaction with the active layer. The polar groups of PDIAO likely interact with the active layer, causing aggregation and enhancing interface energetics, which can contribute to efficient charge extraction.32 To further confirm this interaction, we investigated the pristine film IT-4F film, PDIAO, and blend film of IT-4F and PDIAO using Fourier transform infrared spectroscopy. Fig. 3c shows that the broad C–O–C vibration band of the PDIAO ETL layer at 1100 cm−1 is suppressed in the blend film, indicating an interaction between the polar groups of PDIAO and the IT-4F acceptor. Additionally, the C–F vibration peak at 1390 cm−1 for IT-4F shifted to 1396 cm−1 in the IT-4F and PDIAO blend film, suggesting an interaction between the ETL layer and the active layer, leading to aggregation and favourable energy level alignment at the cathode interface.32
![]() | ||
Fig. 4 AFM height (top) and phase (bottom) images of (a) PM6:IT-4F blend film, (b) PM6:IT-4F/PDIN, (c) PM6:IT-4F/PDIA, and (d) PM6:IT-4F/PDIAO film surfaces. |
To evaluate the conductivity of the ETL layer, the I–V characteristics were measured by constructing a device composed of ITO/ETL film (10 nm)/Ag (100 nm), as shown in Fig. S5 (ESI†).35 The conductivity of ETL materials was determined from the slope of the J–V plot (Fig. 3d) using the equation σ = (Id/VA), where A is the area and d is the thickness of the ETL film. The conductivities of ETL layers, PDIN, PDIA, and PDIAO, were calculated as 3.82, 2.72, and 4.65 (×10−6 S cm−1), respectively. The conductivity of the PDIAO ETL layer is higher than that of the PDIN layer, which contributes to enhanced charge extraction and higher fill factor, leading to improved device performance. We also investigated the stability of OPV devices with PFN-Br and PDIAO interlayer without encapsulation and stored them in a glove box between J–V measurements. As shown in the ESI,† Fig. S6, the T80 lifetime was observed as 240 h for a control device with PFN-Br ETL, whereas the device based on the PDIAO layer shows 220 hours. These stability studies indicate that the PDIAO interlayer device possesses slightly lower stability performance than the state-of-the-art device with the PFN-Br interlayer device.36
Footnote |
† Electronic supplementary information (ESI) available: Synthetic details, spectroscopic, optical and electrochemical characterisation, and OPV and conductivity device diagrams. See DOI: https://doi.org/10.1039/d5ma00032g |
This journal is © The Royal Society of Chemistry 2025 |