Enhancement of the anomalous Hall effect via interfacial scattering in thick Fe nanocluster-assembled thin films

Abstract

Fe nanocluster-assembled thin films with thicknesses ranging from 1000 to 1400 nm were fabricated using the plasma-gas-condensation technique. The study reveals that the films composed of Fe nanoclusters have an average grain size of approximately 7.7 nm, and throughout the temperature span of 5 to 300 K, the films exhibit an anomalous Hall coefficient (Rs) reaching approximately 1.0–2.5 × 10−8 Ω cm G−1, which is nearly 4 orders of magnitude greater than that of bulk Fe, showing a significant giant Hall effect (GHE). Additionally, the longitudinal resistivity (ρxx) decreases gradually with increasing film thickness, while the saturated anomalous Hall resistivity (ρAxy) demonstrates a corresponding gradual increase. In particular, in a double logarithmic coordinate system, log ρAxy increases as log ρxx decreases, exhibiting adherence to a new scaling relation expressed as log(ρAxy/ρxx) = a + b log ρxx.

Graphical abstract: Enhancement of the anomalous Hall effect via interfacial scattering in thick Fe nanocluster-assembled thin films

Supplementary files

Article information

Article type
Paper
Submitted
16 May 2025
Accepted
01 Jul 2025
First published
11 Jul 2025

Phys. Chem. Chem. Phys., 2025, Advance Article

Enhancement of the anomalous Hall effect via interfacial scattering in thick Fe nanocluster-assembled thin films

J. Wang, L. Liang, J. Gao, J. Li and X. Tian, Phys. Chem. Chem. Phys., 2025, Advance Article , DOI: 10.1039/D5CP01845E

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