Issue 47, 2024

Ultra-low noise measurements of ionic transport within individual single-walled carbon nanotubes

Abstract

Despite 15 years of extensive investigation, the fabrication and study of nanofluidic devices that incorporate a single carbon nanotube (CNT) still represents a remarkable experimental challenge. In this study, we present the fabrication of nanofluidic devices that integrate an individual single-walled CNT (SWCNT), showcasing a notable reduction in noise by 1–3 orders of magnitude compared to conventional devices. This achievement was made possible by employing high dielectric constant materials for both the substrate and the CNT-covering layer. Furthermore, we provide a detailed account of the crucial factors contributing to the successful fabrication of SWCNT-based nanofluidic devices that are reliably leak-free, plug-free, and long-lived. Key considerations include the quality of the substrate-layer interface, the nanotube opening, and the effective removal of photoresist residues and trapped microbubbles. We demonstrate that these devices, characterized by a high signal-to-noise ratio, enable spectral noise analysis of ionic transport through an individual SWCNT, thus showing that SWCNTs obey Hooge's law in 1/f at low frequencies. Beyond advancing our fundamental understanding of ion transport in SWCNTs, these ultralow-noise measurements open avenues for leveraging SWCNTs in nanopore sensing applications for single-molecule detection, offering high sensitivity and identification capabilities.

Graphical abstract: Ultra-low noise measurements of ionic transport within individual single-walled carbon nanotubes

Supplementary files

Article information

Article type
Paper
Submitted
15 Jul 2024
Accepted
28 Oct 2024
First published
08 Nov 2024

Nanoscale, 2024,16, 21970-21978

Ultra-low noise measurements of ionic transport within individual single-walled carbon nanotubes

L. Bsawmaii, C. Delacou, V. Kotok, S. Méance, K. Saada, M. A. Kribeche, S. Tahir, C. Roblin, A. Louiset, H. Okuno, M. Manghi, J. Palmeri, F. Henn, A. Noury and V. Jourdain, Nanoscale, 2024, 16, 21970 DOI: 10.1039/D4NR02941K

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