Yadu Ram
Panthi
ab,
Jiří
Pfleger
*a,
Drahomír
Výprachtický
a,
Ambika
Pandey
ab,
Muhammed Arshad
Thottappali
ab,
Ivana
Šeděnková
a,
Magdalena
Konefał
a and
Stephen H.
Foulger
cd
aInstitute of Macromolecular Chemistry, Czech Academy of Sciences, Heyrovského nám. 2, 16206, Prague 6, Czech Republic. E-mail: pfleger@imc.cas.cz
bFaculty of Mathematics and Physics, Charles University, Ke Karlovu 3, Prague 2, Czech Republic
cCenter for Optical Materials Science and Engineering Technology (COMSET), Department of Materials Science and Engineering, Clemson University, Clemson, SC 29634, USA
dDepartment of Bioengineering, Clemson University, Clemson, SC 29634, USA
First published on 28th November 2023
The synthesis of poly[N-(3-(9H-carbazol-9-yl)propyl)methacrylamide] (PCaPMA) is presented, along with its physical, photophysical, and electrical properties, revealing its promising potential for the application in bistable memory devices. The incorporation of the carbazole heterocycle, as a functional charge carrier transporting unit attached to a saturated polymethacryalamide backbone by a flexible alkyl chain, facilitates resistive switching by the applied voltage. Thin films of the polymer, sandwiched between Al or Au and ITO electrodes, exhibit rewriteable flash memory behavior with bistable conductivity with a setting voltage ranging from 2 to 4.5 V, achieving a current ON/OFF ratio exceeding 100. The device demonstrates a remarkable lifetime and remains persistent for more than 104 seconds under a static voltage of 0.5 V. The main physical mechanisms driving the resistive switching have been attributed to the electric field-induced reorientation of heterocycles, which modulates charge transport, and trapping/detrapping of charges in localized states within the bulk of the polymer. Memory persistence is strengthened by the physical crosslinking caused by hydrogen bonds between amide and carbonyl groups in the aliphatic side chains. This physical network further enhances the thermal and mechanical stability of the PCaPMA in comparison to similar polymers highlighting its potential as a suitable material for organic memory devices.
Depending on the material used for the active layer, various mechanisms have been proposed for the transition between different conduction states of the ReRAM. They mainly include redox reactions influenced by ion migration, phase or conformational transitions, thermophoresis, conducting filament formation, electron tunnelling, or charge trapping in localized states.16 In polymers, the introduction of different π-conjugated or electron-donating/accepting substituents, or a modification of the chain length between the polymer backbone and the electronically active group can influence these effects.17 In carbazole-based polymers, the resistance switching is mainly attributed to the voltage-induced conformational changes and/or charge trapping/detrapping processes.7,17–20 The carbazole π-electron moieties in the polymer act as electron donor and hole-transporting units.21,22 When the positive bias is applied to the anode, holes get injected into the organic layer and move in the bulk of the polymer via hopping through the carbazole groups. A sufficiently long flexible spacer in the sidechain can provide these groups with sufficient degrees of freedom, facilitating the reorientation with respect to the direction of the applied electric field. Such reorientation has an impact on the transfer integrals between the molecular orbitals of the adjacent molecules and, hence, can influence the charge carrier transport.17,23
Poly(N-vinyl carbazole) (PVCa), a polymer discovered already in the thirties of the last century, played an important role in organic electronics due to the photosensitivity and charge transport properties of the carbazole group. It was the first polymer in which the photoconductivity was observed. It has been studied intensively due to its capability to photogenerate and transport charges, and having good insulation and charge acceptance properties at the same time, which made the polymer applicable in electrophotography. Later, PVCa and polymers incorporating carbazole units showed promising properties for application in photonics, such as the photorefractive materials for holography, and materials for photonic crystals and light-emitting diodes.24,25 Highly polarizable carbazole groups also yield a very large value of the third-order susceptibility and the polymers containing carbazole groups are promising for application in non-linear optics,26 particularly those with conjugated polymer backbone.27 Later, PVCa and other polymers incorporating carbazole units have demonstrated hysteretic behaviour suitable for volatile or nonvolatile rewritable resistive memory7,28,29 or only write-once-read-many times memory (WORM).17,30 Yanmei et al.18 showed that PVCa can act as an active layer in the rewritable and WORM memory devices, depending on the thickness of the active layer. However, carbazole based rewritable memory devices that exhibit also non-volatile characteristics have not been fully explored yet.
In this study, a carbazole-based non-conjugated polymer, poly[N-(3-(9H-carbazol-9-yl)propyl)methacrylamide] (PCaPMA) was synthesized, and its memristive behaviour was investigated. Sandwiching this polymer between indium–tin oxide (ITO) and aluminium or gold electrodes revealed bistable resistive switching and a non-volatile memory effect. The polymer properties were characterized and compared to the commercially available PVCa, enabling a better understanding of the role of the side groups in the memristive behaviour of the new polymer.
Scheme 1 Synthesis of the N-(3-(9H-carbazol-9-yl)propyl)methacrylamide (CaPMA) and its radical polymerisation. |
1H NMR (300.13 MHz, CDCl3, δ): 8.07 (d, J = 7.8 Hz, 2H, carbazole), 7.49–7.43 (m, 2H, carbazole), 7.36 (d, J = 8.1 Hz, 2H, carbazole), 7.27–7.23 (m, 2H, carbazole), 4.59 (t, J = 7.20 Hz, 2H, N–CH2), 2.78 (t, J = 7.20 Hz, 2H, N–C–CH2).
FT IR: 3050, 2952, 1592, 1483, 1452, 1351, 1325, 1259, 1224, 1197, 1151, 1123, 1065, 1019, 928, 808, 744, 723, 617, 560, 541, 528 cm−1.
Yield: 55.0 g (72%). M.p. 47–48 °C (lit.1 47–48 °C). Anal. calcd for C15H16N2 (224.30): 80.32% C, 7.19% H, 12.49% N; found: 80.34% C, 7.22% H, 12.29% N. 1H NMR (300.13 MHz, CDCl3, δ): 8.09–8.06 (m, 2H, carbazole), 7.47–7.37 (m, 4H, carbazole), 7.26–7.11 (m, 2H, carbazole), 4.38 (t, J = 6.90 Hz, 2H, N–CH2), 2.71 (t, J = 6.90 Hz, 2H, N–C–C–CH2), 2.07–1.83 (m, 2H, N–C–CH2), 1.07 (br s, 2H, −NH2). 13C NMR (75.45 MHz, CDCl3, δ): 140.5, 125.7, 122.9, 120.4, 118.9, 108.7 (12C carbazole), 40.5, 39.7, 32.7 (3C aliphatic).
Yield: 6.95 g (67%). Anal. calcd for C19H2ON2O (292.37): 78.05% C, 6.89% H, 9.58% N; found: 78.0% C, 6.70% H, 9.61% N. 1H NMR (300.13 MHz, CDCl3, δ): 8.06 (d, J = 7.50 Hz, 2H, carbazole), 7.45–7.09 (m, 6H, carbazole), 5.64 (br s, 1H, NH), 5.42 (s, 1H, CH2), 5.17 (t, J = 1.50 Hz, 1H, CH2), 4.34 (t, J = 6.75 Hz, 2H, carbN–CH2), 3.26 (q, J = 6.60 Hz, 2H, carbN–C–C–CH2), 2.10 (pent, 2H, J = 6.75 Hz, carbN–C–CH2), 1.74 (s, 3H, CH3). 13C NMR (75.45 MHz, CDCl3, δ): 168.5 (CO), 140.2 (CCH2), 139.7, 125.9, 123.0, 120.5, 119.6, 108.6 (12C carbazole), 119.2 (CCH2), 40.9, 37.9, 28.7 (3C aliphatic), 18.5 (CH3).
Yield: 1.4133 g (78%); Mw = 6000, Mn = 4000, Đ = 1.50, glass transition temperature Tg = 160 °C as determined from the DSC measurements. 1H NMR (600.27 MHz, DMSO, δ): 8.20–6.80 (m, 9H, carbazole 8H + NH), 4.06 (br s, 2H, carbN–CH2), 2.86 (br s, 2H, carbN–C–C–CH2), 1.73 (br s, 2H, carbN–C–CH2), 1.60-0.50 (m, 5H, backbone CH2 + CH3). 13C NMR (150.96 MHz, DMSO, δ): 176.8 (CO), 139.7, 125.6, 122.0, 120.2, 118.6, 109.0 (6 × 2C carbazole), 54.8, 44.6, 37.4, 27.8, 17.8, 16.2 (6C aliphatic).
Besides the polymer prepared according to the procedure described above, two other batches of PCaPMA were synthesized using different reaction times and temperatures during the radical polymerisation (see Procedures 1 and 2 in (ESI,† Section A)) but all of them had lower Mw and Mn than that one used for the study described in this paper (Procedure 3 in (ESI,† Section A)). However, no differences in the UV-vis and fluorescence spectra were observed between solutions of these batches (ESI,† Fig. S3).
Polymer thin films were deposited by spin-casting using chlorobenzene solution of the respective polymer, with a concentration in the range of 10–110 mg mL−1 and with a rotation speed of 2000–4000 rpm, according to the required thickness. Before casting, the PCaPMA and PVCa solutions were filtered through PTFE membrane syringe filters subsequently with pore sizes of 220 nm and 100 nm. Depending on the solvent, solution concentration and rotation speed, films of various thicknesses were prepared, with the thickness in the range between 30 and 500 nm. Some more detailed examples of various film casting conditions are listed in Table S1, ESI.† For the solvent removal, the deposited layers were thermally cured in a vacuum (pressure 100 mbar) at 120 °C for 4 hours. Finally, a 100 nm thick Al or Au top electrode (TE) was deposited by physical vapour deposition (PVD) through a shadow mask using MiniLab 60 (Moorfield, UK) in a vacuum (10−7 mbar) with a deposition rate of 5–10 Å s−1. The active area between the electrodes was about 2 mm2. Some samples were prepared with a smaller area of 0.15 mm2 for checking the dependence of electrical characteristics on the current density.
Three different types of memory devices were fabricated. Type I and type II devices comprised of a PCaPMA active layer sandwiched between ITO and Al electrodes (ITO/PCaPMA/Al), or Au electrode (ITO/PCaPMA/Au), respectively. Type III devices had a PVCa active layer sandwiched between ITO and Al (ITO/PVCa/Al).
Differential scanning calorimetry (DSC) and cyclic voltammetry (CV) measurements were carried out on DSC Instruments Q2000 (Haverhill, USA) and PerkinElmer 8000 and AMEL Potentiostat (AMEL s.r.l., Milano, Italy).
X-Ray Diffraction (XRD) patterns were collected using a high-resolution Explorer diffractometer (GNR, Italy) with a Mythen 1K strip detector, operated at 40 kV and 30 mA. The measurements were performed under the CuKα radiation (wavelength = 1.54 Å) using Bragg–Brentano geometry, in a 2θ range of 2–80°, with a 0.05° step and a step time of 10 s. The peak deconvolution was carried out using the Fityk 1.3.1 program.32
Broadband dielectric spectroscopy (BDS) measurements were performed using Novocontrol Alpha A High-performance frequency analyser in combination with a QUATRO temperature controller and ZGS active sample cell (Novocontrol Technologies, Montabaur, Germany) in the frequency range 10−2–106 Hz and in the temperature range −100 °C to 170 °C for PCaPMA and −100 °C to 250 °C for PVCa, respectively, with 1 VAC applied. About 20 μm thick layers were prepared by drop-casting on a gold-plated brass disc. A second gold-coated brass disc, placed at the layer surface by heating and pressing, was used as the TE.
UV-vis absorption and photoluminescence spectra of solutions and solid-state thin films were recorded on PerkinElmer Lambda 950 spectrophotometer (Shelton, USA) and an FS5 spectrofluorometer (Edinburg Instruments, UK), respectively. The thickness and roughness of the prepared layers were observed on the KLA TENCOR P-10 surface profilometer (KLA-Tencorp, Milpitas, USA).
Keithley 2602 sourcemeter (Keithley Instruments, Solon, USA) was used for the electrical characterization of memory devices. Electrical measurements were performed either on air or inside a vacuum chamber (turbomolecular pump, Pfeiffer Vacuum GmbH, Germany) tempered using a HAAKE F6 thermostat (Thermo Haake, Karlsruhe, Germany). The devices were biased through the ITO BE, while the TE was grounded. The temperature dependences of the current–voltage characteristics were measured in the range 20–100 °C and 100–125 °C with 15 °C or 5 °C steps, respectively, allowing the sample to thermally stabilize for 15 min at each step.
The amid I (1650 cm−1) and amide II (1594 cm−1) bands, related to the HN–CO group complex vibration, originate from the stretching and deformation vibrations of the CO and C–NH groups, respectively. The amide I peak shifts to 1653 cm−1 upon heating to 100 °C and remains at this frequency during further temperature variations. The amide II band moves to 1592 cm−1 when heated to 150 °C, and returns to 1594 cm−1 after cooling down to room temperature.
Both bands I and II are sensitive to hydrogen bonding as described, for example, in the proteins secondary structures stabilized by H-bonds, where the amid I range for β-sheet is within 1625–1640 cm−1 but for α-helix it is shifted to 1648–1660 cm−1. Similarly, in the infrared spectrum of N-methyl acetamide, there is an amide I band found at 1718 cm−1 for the glass phase, at 1653 cm−1 for the H-bonding network, and 1630 cm−1 for the aqueous solution.36 The H-bond depletes the electron density on the CO group and, consequently, decreases the amide I frequency. On the other hand, when the bending vibration of the N–H group is restricted by the hydrogen bridge, by increasing the force constant the frequency of the amide II band increases.36
The stretching vibration of the H-bonded N–H group demonstrated the most significant shift with increased temperature with the blue shift towards higher frequencies. This can be explained by the increase in the N–H bond force constant as the H-bonds disappear. This aligns with the red shift of the Amide II band at higher temperatures. Conversely, the presence of the hydrogen bridge results in a smaller force constant of the N–H bond, leading to lower frequencies of the NH band in the infrared spectrum. The carbazole out-of-plane C–H vibration related to the bands at 745 cm−1 and 720 cm−1, remains virtually unchanged throughout the heating-cooling cycle.
It is known from the literature cited above that the Amide I band frequency can vary as much as 90 cm−1 depending on the strength of the hydrogen bonds. The changes in the FTIR spectra during heating observed in PCaPMA are small, on the edge of the spectral resolution. However, the position of IR bands typical for the presence of hydrogen bonds and the shift of these bands with temperature, which was reproducible and occurred at temperatures already below 100 °C, suggest that the structure of the polymer is influenced by hydrogen bonds. The more pronounced changes reported in literature36 are due to the nature of those studied materials, and the high amount of carbonyl groups involved in their H-bonds, which are highly disturbed upon the thermal transition. The small changes observed in PCaPMA point only to their weakening at elevated temperatures due to the release in molecular motion.
Fig. 3 UV-vis absorption (red lines) and emission spectra (blue lines) of (a) PCaPMA and (b) PVCa in thin films (solid lines) and solutions in DMSO, concentration 10−5 M (dashed lines). |
In the solid state, there is an increased Stokes shift and the 0–1 band becomes more intense, indicating considerable structural changes in the excited state compared to the ground state. Conversely, PVCa in DMSO solution exhibited a more intense monomeric emission peak around 373 nm and a small broad shoulder around 414 nm pointing to a weak mutual interaction between chromophores in solution. This band increased significantly in a solid state, suggesting the sandwich-type of mutual interactions between carbazole groups, resulting from the overlap of adjacent π-orbitals from intra-chain excimer formation.23,40,41,43,44 Notably, PCaPMA spectra lack this excimer emission, in good agreement with its less ordered structure compared to PVCa, as observed in XRD diffractograms (Fig. 2).
It is known from the literature that, in addition to the mutual interaction of neighbouring molecules in solid state, the positions of the optical bands of carbazole groups depend on their chemical substitution. However, in our case the differences in the optical spectra between PCaPMA and PVCa observed in thin layers are relatively large compared to solution, and therefore we attributed this effect to a different packing of the carbazole molecules in the layer, rather than to the electronic effect observed by other authors on carbazoles substituted with alkyl groups.27 In PCaPMA, besides a higher flexibility of the side groups, the bulky side chains decrease the concentration of chromophores, which also contributes to a lower probability of the excimer formation.42
The absorption and emission spectra were found to be insensitive to the polymerisation conditions within the range of reaction conditions used in our study. All three molecular weights of PCaPMA exhibit identical spectra (ESI,† Fig. S3). For further investigation, we exclusively used the polymer with the highest molecular weight, which also provided the best pinhole-free thin films by spin-casting deposition (ESI,† Fig. S4).
EHOMO = −[(EOX(onset) – EOX(onset),FER) + 4.8] eV | (1) |
From these measurements, the energy position of the HOMO level of PCaPMA was determined as EHOMO = −5.23 eV, slightly higher than PVCa, where the value EHOMO = −5.34 eV was obtained, consistent with previous literature reports.29,45,46
Both polymers displayed CV curves that were not fully reversible and exhibited only weak reduction peaks. The bandgap, Eg, was therefore determined from the Tauc plot of the optical absorption spectra. The bandgap for PCaPMA was found to be 3.51 eV, which is only 0.02 eV, i.e. less than the kT value, smaller than that of PVCa. Using the above values, the energy of the lowest-unoccupied molecular-orbital (LUMO) levels were calculated as −1.72 eV and −1.81 eV for PCaPMA and PVCa, respectively. The energy diagram is shown in Fig. 4b.
Material | Glass transition temperature, Tg | Activation energy, Ea | |||||
---|---|---|---|---|---|---|---|
α- relaxation | β- relaxation | γ-relaxation | |||||
(°C) | (kJ mol−1) | (eV) | (kJ mol−1) | (eV) | (kJ mol−1) | (eV) | |
PVCa | 220 | 99.4 | 1.03 | 90.7 | 0.94 | — | |
PCaPMA | 151 | 93.1 | 0.96 | 128.4 | 1.33 | 51.2 | 0.53 |
As the temperature increased, all relaxation maxima shifted towards higher frequencies. The γ-relaxation in PCaPMA occurred at a higher temperature compared to PPrMA (polymer with the same length of the side chain but missing the amide group), where the γ relaxation was observed in the temperature interval between −150 °C and −70 °C, with Eγ = 45.3 kJ mol−1. This difference can be attributed to the formation of hydrogen bonds in the side chain48 and it is in accord with the similar finding in IR spectroscopy. However, a decrease in the activation energy of the β-transition (Eβ = 128.4 kJ mol−1) for PCaPMA compared to PPrMA (Eβ = 152.6 kJ mol−1) is not fully understood. At higher temperatures, above 120 °C, the α-transition merges with β-relaxation as observed by R. Bergman et al. in polymethylmethacrylates with longer side chains.50
Besides the temperature dependences of the loss modulus (M′′) that best illustrate the relaxation modes of the polymer, we also measured the temperature dependence of the spectra of the dielectric constant, ε′ (see ESI,† Fig. S5). The value ε′ = 3.1 (1 kHz) was found from these measurements at room temperature.
To elucidate the phenomena responsible for resistance switching invoked by the applied voltage, we measured the real and imaginary part of the impedance on a fresh sample (ITO/PCaPMA 80 nm/Al) and the same sample after applying the DC voltage sweep from 0 V to +5 V. The impedance data were analysed using the Nyquist plot (Fig. 5c) and an equivalent electronic circuit model consisting of parallel R2C combination in a serial connection with a resistor R1 (see inset of Fig. 5c). As can be seen from the fitted parameters, only the real part of the impedance has been changed after switching between two conducting states of the device. For both conducting states, an identical value for the capacitance C was obtained as well as for the serial resistance R1. It shows that the interface electrode effects or changes in the injection barrier, possibly formed by Al2O3,51,52 do not play a role in the switching mechanism. Similarly, the unchanged value of capacitance in the pristine and in the voltage-loaded sample suggests that no dielectric breakdown occurred in the active layer.53
As shown in Fig. 6a, the device I exhibited a repeatable bistable switching behaviour between a high resistance (HR) state and a low resistance (LR) state, with the difference in the resistance exceeding two orders of magnitude. During the positive voltage sweep, when the applied voltage reached a threshold value, VT, the current increased from the HR to the LR state, which could be switched back to the HR state by reversing the voltage polarity. In the first positive bias sweep, 0 → +4 V, the current abruptly increased from HR (OFF state) current ∼10−8 A to ∼10−5 A at about +3.6 V. The LR (ON state) state current was at least 100 times higher than at the OFF state, and in some samples, the ON/OFF current ratio exceeded 104. Such current ON/OFF ratios, 102–104, exceptionally even 105, have been reported for rewritable memories made of similar polymer materials but they mostly compromise their rewritable ability or nonvolatility.7,17,18 During the reverse sweep (4 → 0 V), the device remained ON. However, in the subsequent sweep to the negative applied voltage (0 → − 4 V), the device resets back to the HRS with a resetting voltage of about −2.3 V.
In subsequent I–V cycles, the setting voltage decreased slightly, which could be attributed to easier conformational changes in the sidechains after the 1st cycle, similar as described by the Ling group.10 The setting and resetting processes were not abrupt but continuous in some cells, leading to a negative differential resistance (NDR), which was dominant at fast scan rates, above 10 V s−1. VT ranged from 2 to 4.5 V among devices but most devices with ∼80 nm thick layers switched around 2.7 V. Additionally, some variations in other electrical parameters, such as the current in the HRS and LRS, ON/OFF current ratio, resetting voltage, and device performance were observed from sample to sample. Around 30% of the samples failed to show reproducible characteristics; as they were either short-circuited or showed only a WORM behaviour. The limited reliability might be due to the electrical breakdown of the active layer caused by the substrate inhomogeneity or the formation of pinholes due to the very small thickness of the active layer.
Devices with Au top electrode (device II) also exhibited a hysteresis in the current–voltage characteristics, but the threshold voltage VT was noticeably lower, and the current was higher in both the LR and HR states compared to the device I (Fig. 6b). Setting the compliance limit ICL was necessary to prevent electrical breakdown, and setting it to values higher than 5 × 10−3 A mostly resulted in permanent electrical breakdown of the sample. The lower VT and higher current could be attributed to a lower Schottky barrier between the HOMO level of PCaPMA and the work function of gold, compared to ITO (see Fig. 4b). Moreover, a relatively high current was observed even in the OFF state and the electrical breakdown above ICL indicates the possibility of the gold diffusion into the bulk of the sample during the vacuum deposition of Au, forming filaments or nanoparticles that penetrate the polymer layer. As suggested by J. G. Simmons and R. R. Verderber,54 this diffusion can change the electrical characteristics of the device, mainly decreasing the bulk resistance.
In contrast to the devices made of PCaPMA, the device III, having the PVCa active layer, switched from HR to LR state after the threshold voltage had been reached, and it remained permanently in the ON state during further cycling. Even when higher voltages were applied with both polarities, no recovery of the OFF state was observed. Hence, device III behaves as a write-once-read-many times (WORM) memory, which has been previously reported in the literature for pure PVCa17,30 or PVCa composites.55
To assess the stability or persistence of the device, current measurements in both states were conducted also at the permanently applied +0.5 V (Fig. 7b). The current was found to remain stable for up to 2 h, maintaining the current ON/OFF ratio higher than 100. Both the dynamic WRER and the persistence tests were carried out in the dark and under ambient conditions.
In addition to the persistence, a volatility test was conducted, too. In this test, device I was initially set to the ON state at + 5 V, and then the current was measured at +0.5 V every 10 minutes, with the applied voltage turned off between measurements (Fig. 7c). The test was first performed under vacuum conditions (pressure < 10−4 mbar). After setting the device to the LR state, the current initially decreased, being reduced to about one-half of the current measured immediately after setting the device to the ON state. However, over a longer duration only a small decrease, less than 5%, was observed, indicating a promising retention ability of the device.
The device was also tested under ambient conditions. During this test, several cycles with the voltage sweep 0 → +4 V were recorded with an increasing period between cycles (ESI,† Fig. S6). After the first sweep that switched the device to the ON state at about +3.5 V, the sample was left to relax without the applied voltage for the increasing period between subsequent cycles. During the following sweep after a minute, the I–V characteristics followed the ON state current with only a negligible decrease. However, after 10 minutes of relaxation, the subsequent sweep showed a decrease in current almost an order of magnitude, but the ON state was recovered at about +1.2 V. This markedly smaller value of the voltage setting the device back to the ON state can be understood since the device was not fully reset to the HR state (OFF state) between these cycles. As the time delay between the sweeps increased, the current at a smaller applied voltage decreased, reaching only one hundredth of the ON value after 14 hours of relaxation. The retention capability of the memory device is thus markedly worse in ambient conditions compared to vacuum. However, the ON/OFF ratio of around 50 observed after 14 hours is still quite convincing, indicating that the device retains its memory state to a significant period of time even under ambient conditions.
We further compared the I–V characteristics for two samples with different electrode active areas, namely 2 mm2 and 0.15 mm2. The same ON state current density was obtained in both cases (ESI,† Fig. S7), indicating the absence of any localized conducting filament and electrical breakdown that could be responsible for the higher current in the LR state.
To confirm the space charge limited nature of the charge transport, we plotted the first sweep of the I–V cycle measured on the device I in a double-logarithmic scale. The data presented in Fig. 8a show several different linear regions that can be fitted with different slopes, pointing to different current regimes. In the OFF state, between 0 and 0.6 V, a typical Ohmic conduction I ∝ Vm with m = 1 dominates.16,57 In the voltage range 0.7–3 V, below the setting voltage, the slope increased to m ∼ 2 suggesting the trap-controlled SCL current.59 At the setting voltage VT, the electric field shifts the quasi-Fermi level above the energy of traps and, consequently, to the trap-free SCLC conduction responsible for the LR (ON) state. The device remains in the trap-free SCLC regime as the voltage decreases but with an increasing contribution of Ohmic conduction below the VT value. It stays in this LR state until the voltage drops below the negative reset value.
Fig. 8 (a) Linear fitting of the first I–V cycle of the device I in log–log scale, (b) fitting of measured I–V curves (dots) of the device I in the OFF and ON state using eqn (2) and (3) (lines). |
The device kept its LR state even when the power was turned off, behaving as a nonvolatile memory device. The reverse bias was used to bring the device to its original OFF state by eliminating the previously formed space charge and emptying the filled trapping sites by neutralizing them with electrons.18
The above analysis was even better illustrated by the more accurate fitting of the I–V characteristics plotted in linear scales using analytical formulas for respective regions (Fig. 8b). The experimental data were fitted using several possible charge transport mechanisms, such as SCLC, or SCLC with field dependent mobility (SCLC-F), combined with Ohmic or Schottky contact behaviour. Since the field-dependent mobility was reported in the literature for similar carbazole-based polymers,60 obtained directly from the time-of-flight measurements, we adopted the SCLC-F model, typical for dispersive hopping transport,61 and the Ohmic dependence:28
(2) |
(3) |
Additional information about the charge carrier transport mechanism was obtained from the temperature dependence of the ON and OFF state currents. The temperature dependence was recorded on the device I, with the 80 nm thick polymer layer (ESI,† Fig. S8). First, we measured the OFF state at 1 V and then in the ON state at 5 V. The conductivity of the PCaPMA polymer in the ON state was almost temperature independent, similar to the observation made by Kondo et al.63 on the PVCa layer cast on a silver-modified ITO substrate. It shows that the localized states are mostly occupied and the hopping transport is less influenced by the energy barrier between hopping states. It is also in agreement with the above current–voltage characteristics with electric field independent mobility. In contrast, the device showed semiconducting behaviour in the OFF state, with the current increasing with temperature. The activation energy calculated from the Arrhenius plot of the temperature dependence of the current was determined to be Ea = 0.33 eV.
These measurements suggest that the resistive switching mechanism originates from the trapping/detrapping process. However, the observed non-volatility of the device cannot be explained solely by thermally activated detrapping from the trap with a depth of 0.33 eV. There must be some other mechanism stabilizing the LR state. This supporting mechanism is likely related to the reorientation of carbazole groups in the side chains induced by the applied voltage facilitating the charge transfer between adjacent chromophores.23,64,65 The LR state is then stabilized by the hydrogen bonds. The near Ohmic response with a slight SCLC contribution at higher applied voltage is consistent with this mechanism.
The small decrease in current over time observed in both the vacuum and ambient conditions could be attributed to the thermally activated release of carriers from shallow traps localized in the bulk or close to the polymer/electrode interface or changes in the carbazole conformation.10,17
It can be seen also from Fig. 9 that the discharge current did not change after the illumination had been interrupted for about two minutes but it continued at the same value. It shows that charges are trapped in deep levels with a low escape rate. The charging/light-induced discharging cycle has been found fully reversible. This experiment strongly supports the trapping/detrapping process as the underlying mechanism responsible for the resistive switching behaviour of the device with the long persistence of the resistive state.
Based on the experimental findings, it has been concluded that the resistive switching is caused by the bulk properties of the polymer and does not originate in electrode interface phenomena. The combination of several experiments, and particularly the photodischarge experiment performed in the low resistance state, points to trapping/detrapping of charges as the main switching mechanism with the involvement of the physical crosslinking via hydrogen bonds, which are likely to be responsible for the long persistence time of the memory state. The comprehensive understanding of these mechanisms opens up possibilities for the development of nonvolatile memory devices with enhanced performance and stability.
Footnote |
† Electronic supplementary information (ESI) available. See DOI: https://doi.org/10.1039/d3tc03394e |
This journal is © The Royal Society of Chemistry 2023 |