Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique

Lei Yu; Mingyang Zhang; Haijian Chen; Bohuai Xiao; Shuai Chang

doi:10.1039/D2NR06074D

You do not have JavaScript enabled. Please enable JavaScript to access the full features of the site or access our non-JavaScript page.

Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique†

Lei Yu,

‡*^ab Mingyang Zhang,‡^ab Haijian Chen,^ab Bohuai Xiao^ab and Shuai Chang

*^ab

Author affiliations

* Corresponding authors

^a The State Key Laboratory of Refractories and Metallurgy, Wuhan University of Science and Technology, Wuhan, Hubei 430081, China
E-mail: schang23@wust.edu.cn, yuleiest@163.com

^b The Institute of Advanced Materials and Nanotechnology, Wuhan University of Science and Technology, Wuhan, Hubei 430081, China

Abstract

A hybrid technique combining atomic force microscopy and the fixed-junction technique is developed to simultaneously probe the electrical and mechanical characteristics of a single-molecule junction.

This article is part of the themed collection: Nanoscale 2023 Emerging Investigators

Download options Please wait...

Supplementary files

Supplementary information PDF (465K)

Article information

DOI: https://doi.org/10.1039/D2NR06074D
Article type: Communication
Submitted: 31 Oct 2022
Accepted: 28 Dec 2022
First published: 12 Jan 2023

Download Citation

Nanoscale, 2023,15, 4277-4281

Permissions

Request permissions

Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique

L. Yu, M. Zhang, H. Chen, B. Xiao and S. Chang, Nanoscale, 2023, 15, 4277 DOI: 10.1039/D2NR06074D

To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.

If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.

If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.

Social activity

Fetching data from CrossRef.
This may take some time to load.

Nanoscale

Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique†

Abstract

Supplementary files

Article information

Download Citation

Permissions

Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique

Social activity

Search articles by author

Spotlight

Advertisements