Nanoscale mapping of edge-state conductivity and charge-trap activity in topological insulators

Abstract

We report the nanoscale mapping of topological edge-state conductivity and the effects of charge-traps on conductivity in a Bi₂Se₃ multilayer film under ambient conditions. In this strategy, we applied an electric field perpendicular to the surface plane of Bi₂Se₃via a conducting probe to directly map the charge-trap densities and conductivities with a nanoscale resolution. The results showed that edge regions had one-dimensional characteristics with higher conductivities (two orders) and lower charge-trap densities (four orders) than those of flat surface regions where their conductivities and charge-traps were dominated by bulk effects. Additionally, edges showed an enhanced conductivity with an elevated electric field, possibly due to the creation of new topological states by stronger spin-Hall effects. Importantly, we observed ultra-high photoconductivity predominantly on edge regions compared with that of flat surface regions, which was attributed to the excitation of edge-state carriers by light. Since our method provides an important insight into the charge transport in topological insulators, it could be a significant advancement in the development of error-tolerant topotronic devices.