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Correction: High resolution multielement XRF spectroscopy of extended and diffused sources with a graphite mosaic crystal based Von Hamos spectrometer
A.
Scordo
*a,
L.
Breschi
bca,
C.
Curceanu
a,
M.
Miliucci
a,
F.
Sirghi
ad and
J.
Zmeskal
e
aLaboratori Nazionali di Frascati INFN, Via E. Fermi 40, 00044 Frascati, Rome, Italy. E-mail: alessandro.scordo@lnf.infn.it
bFondazione Policlinico Universitario A. Gemelli IRCCS, Rome, Italy
cUniversità Cattolica del Sacro Cuore, Rome, Italy
dHoria Hulubei National Institute of Physics and Nuclear Engineering (IFIN-HH), Magurele, Romania
eStefan-Meyer-Institut für Subatomare Physik, Vienna, Austria
First published on 22nd September 2022
Abstract
Correction for ‘High resolution multielement XRF spectroscopy of extended and diffused sources with a graphite mosaic crystal based Von Hamos spectrometer’ by A. Scordo et al., J. Anal. At. Spectrom., 2020, 35, 155–168, https://doi.org/10.1039/C9JA00269C.
On page 157, in section 2.1.1, the mosaicity of one of the crystals is reported as 0.8°, the correct value is 0.08°.
The Royal Society of Chemistry apologises for these errors and any consequent inconvenience to authors and readers.
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