Yubing
Sun
*ab,
Xiangxue
Wang
ac,
Wencheng
Song
b,
Songhua
Lu
a,
Changlun
Chen
a and
Xiangke
Wang
bcd
aInstitute of Plasma Physics, Chinese Academy of Sciences, P.O. Box 1126, Hefei, 230031, Anhui, P.R. China. E-mail: sunyb@ipp.ac.cn; Fax: +86 551 65591310; Tel: +86 551 65593308
bSchool of Environment and Chemical Engineering, North China Electric Power University, Beijing 102206, P.R. China
cSchool for Radiological and Interdisciplinary Sciences, Soochow University and Collaborative Innovation Center of Radiation Medicine of Jiangsu Higher Education Institutions, 215123, Suzhou, P.R. China
dNAAM Research Group, Faculty of Science, King Abdulaziz University, Jeddah 21589, Saudi Arabia
First published on 23rd April 2020
Retraction of ‘Mechanistic insights into the decontamination of Th(IV) on graphene oxide-based composites by EXAFS and modeling techniques’ by Yubing Sun et al., Environ. Sci.: Nano, 2017, 4, 222–232.
There are unexpected similarities in the baselines of the two XPS spectra presented in Fig. 4D, which indicate that data has been duplicated to represent different materials.
Given the significance of the concerns about the validity of the data, the findings presented in this paper are no longer reliable.
Signed: Yubing Sun, Xiangxue Wang and Xiangke Wang
Date: 27th March 2020
Wencheng Song, Songhua Lu and Changlun Chen were contacted but did not respond.
Retraction endorsed by Sam Keltie, Executive Editor, Environmental Science: Nano
This journal is © The Royal Society of Chemistry 2020 |