Ştefan-Bogdan
Ivan
a,
Ionel
Popescu
a,
Ioana
Fechete
*b,
François
Garin
b,
Vasile I.
Pârvulescu
a and
Ioan-Cezar
Marcu
*a
aLaboratory of Chemical Technology and Catalysis, Department of Organic Chemistry, Biochemistry and Catalysis, Faculty of Chemistry, University of Bucharest, 4-12, Blv. Regina Elisabeta, 030018 Bucharest, Romania. E-mail: ioancezar.marcu@chimie.unibuc.ro
bInstitut de Chimie et Procédés pour l'Energie, l'Environnement et la Santé ICPEES, UMR 7515 CNRS, Université de Strasbourg, 25 rue Becquerel, 67087 Strasbourg Cedex 2, France. E-mail: ifechete@unistra.fr
First published on 25th July 2016
Surface-phosphated NiO catalysts with different phosphorus contents were prepared and used for ethane oxidative dehydrogenation (ODH) in the temperature range from 300 to 425 °C. The catalysts were characterized by nitrogen adsorption at −196 °C, XRD, ICP-OES, XPS, TEM, and Raman spectroscopy. They were also characterized by in situ electrical conductivity measurements at various temperatures and oxygen partial pressures, and the temporal response of the electrical conductivity to sequential exposure to air, an ethane–air mixture (reaction mixture) and pure ethane was recorded under conditions similar to those employed in the catalytic experiments. Adding increasing amounts of phosphorus to NiO changes its physicochemical characteristics; specifically, both the concentration and mobility of the surface lattice O− species in the NiO material decrease considerably, affecting its catalytic performance in ethane ODH. Thus, increasing the P content in NiO leads to a decrease in its catalytic activity with an increase in its ODH selectivity at the expense of total oxidation selectivity in the temperature range studied.
In this work, the effect of adding phosphorus to bulk NiO surfaces on the catalytic performance of NiO in ethane ODH was investigated and the role of surface phosphorus was unambiguously explained.
![]() | (1) |
To compare the electrical conductivities of the samples, the solids must have similar textures and surface states. Indeed, the electrical conductivity of a semiconducting oxide powder can be expressed by the following equation:
σ = An | (2) |
The common reference states for determining σ were chosen to be at temperatures of 350 and 400 °C under air at atmospheric pressure. At these temperatures, which are in the range used in the catalytic reactions, most of the ionically adsorbed species, such as H3O+, HO−, etc., that contribute to the surface conductivity were removed from the surface. The solid was initially heated from room temperature to the desired temperature at a heating rate of 5 °C min−1.
Sample | P content (% wt) | BET surface area (m2 g−1) | P/Ni | Surface coverage (%) | Pore volume (cm3 g−1) | Average pore size (nm) | Particle size (nm) | ||
---|---|---|---|---|---|---|---|---|---|
ICP | XPS | ICP | XPS | ||||||
a n.d.: not determined. | |||||||||
NiO | 0 | 35.1 | 0 | 0 | 0 | 0 | 0.49 | 35.4 | 21.1 |
0.05P@NiO | 0.5 | 67.3 | 0.011 | n.d.a | 4 | n.d. | 0.57 | 27.6 | 18.9 |
0.5P@NiO | 3.0 | 45.1 | 0.073 | 0.153 | 35 | 61 | 0.33 | 23.1 | 18.5 |
1.0P@NiO | 5.7 | 43.0 | 0.146 | 0.227 | 70 | 89 | 0.29 | 20.4 | 19.2 |
The textural properties of the pure NiO and phosphated NiO samples are also presented in Table 1. The surface area increases from 35 to 67 m2 g−1 when P is added to pure NiO to produce 0.05P@NiO. Further increases in the P content lead to a decrease in the surface area, which is consistent with previously reported results;40,41 however, the surface areas of all the phosphated NiO catalysts are higher than that of the pure NiO sample. All the materials exhibit type IV nitrogen adsorption/desorption isotherms, according to the BDDT classification,44 with a type H3 hysteresis loop, which is characteristic of materials with interparticle mesoporosity (Fig. S1†). These results are consistent with the average mesoporous pore sizes obtained from desorption branches of the isotherms by the BJH method (Table 1). Additionally, the average pore size decreases with increasing phosphorus content in the NiO catalyst. Ni2P2O7 has a surface area of 2 m2 g−1.
The surface coverage (Table 1) was calculated as the ratio between the area occupied by all the phosphate groups on the surface of 1 g of the sample and its BET surface area. By virtue of the method of preparation used for adding P to NiO, i.e. impregnation, it was assumed that all the phosphorus is on the catalyst surface as phosphate groups. The area occupied by the phosphate groups was calculated based on the P content determined by ICP-OES analysis (Table 1) and assuming that they have a regular tetrahedral geometry with P–O bond length of 1.536 Å.45 The surface coverage increases from 4% for 0.05P@NiO sample to 70% for 1.0P@NiO and the bulk P/Ni atomic ratios are 0.011, 0.073 and 0.146 for 0.05P@NiO, 0.5P@NiO and 1.0P@NiO, respectively. The surface coverage and the P/Ni atomic ratios calculated from XPS results are larger than those calculated based on the bulk P content determined by ICP-OES, clearly showing that P is concentrated at the catalyst surface.
The XRD patterns of the pure NiO and surface-phosphated NiO samples are presented in Fig. 1. For all the samples, only reflections corresponding to the well-crystallized NiO phase (PDF 47-1049) are observed (peaks corresponding to P-containing phases are not detected), indicating a high degree of phosphorous dispersion on the NiO surface. The Ni metal reflection peaks at 44.6° and 51.9° are not observed. The particle size was estimated by applying the Scherrer formula to all the diffraction lines in the 2θ range of 10–85° (Table 1). The pure NiO particle size is larger than the phosphated NiO particle sizes, which is consistent with the measured surface areas. Nevertheless, the phosphated NiO particle size does not exhibit a clear dependence on the surface area, suggesting that the NiO particles agglomerate to different degrees in the presence of phosphorous. Ni2P2O7 is a highly crystalline pure phase (PDF 72-8424) (Fig. S2†).
The Raman spectra of both pure NiO and phosphated NiO samples were recorded to identify the surface phosphorus species. The results are presented in Fig. 2. A broad, intense band near 500 cm−1 and a weak band near 1000 cm−1 are observed in the pure NiO Raman spectrum and are attributed to the Ni–O stretching mode.46,47 Notably, the shoulder of the 500 cm−1 band clearly indicates the non-stoichiometry of nickel oxide.47 These peaks are also observed in all the phosphated NiO samples, but the intensity of the 500 cm−1 peak, which is assigned to the NiO6 octahedra stretching mode, decreases with increasing P content in the NiO catalyst. This result clearly indicates that P interacts with NiO. The 1000 cm−1 band intensity increases with increasing P content in the phosphated samples, suggesting the presence of PO43− groups on the NiO surface. Indeed, the symmetric and asymmetric P–O stretching modes of the free PO43− oxoanion are located at 938 and 1027 cm−1, respectively, and the stretching modes of the surface PO43− groups are expected to have similar frequencies.48 The weak peaks at 435 and 585 cm−1 observed in the 1.0P@NiO spectrum can be assigned to O–P–O symmetric and antisymmetric bending modes, respectively, with a small P vibrational contribution.46 A new band near 770 cm−1 is observed in the 0.5P@NiO and 1.0P@NiO spectra and is more intense in the latter spectrum. This band is attributed to the symmetric stretching mode of P–O–P bridges, which is the fingerprint of P2O74− oxoanions formed from connected PO43− groups.49,50 This result clearly suggests that pyrophosphate groups are present on the NiO surface at higher P contents.
HRTEM images of the catalysts are presented in Fig. 3. NiO lattice fringes are visible on all the grains of bare NiO sample. The TEM images of the P@NiO samples are similar, no phosphate clusters being evidenced even at high P content. This clearly suggests that P is well dispersed on the NiO surface, in line with Raman and XRD data. The NiO lattice fringes are not visible on all the particles in phosphated samples, probably due to the surface coverage with phosphate groups which determine the delimitation of surface NiO domains.
The bare NiO, 0.5P@NiO and 1P@NiO catalysts were analyzed by photoelectron spectroscopy. For each sample, the C 1s, O 1s, Ni 2p and P 2p internal electronic levels were measured. The characteristic Ni 2p3/2 spectra of the catalysts are presented in Fig. 4. Due to the presence of several crystalline domains with different surface charge effects, the XPS peaks of all the samples exhibit complex behavior. The corresponding Ni 2p3/2 binding energies (BEs) are compiled in Table 2. For all the catalysts, two Ni 2p3/2 core-level binding energies are observed, and these energies are very similar, regardless of the P loading. The Ni 2p3/2 binding energies of the 0.5P@NiO and 1.0P@NiO samples are higher than those of the NiO sample. The first BE is approximately 853.2 eV for NiO and 853.6 eV for 0.5P@NiO and 1.0P@NiO, and the second BE is 854.9 eV for NiO and 855.6 eV for 0.5P@NiO and 1.0P@NiO. The observed binding energies can be attributed to Ni2+ (NiO)32,51,52 and Ni2+/Ni3+ (Ni2O3) ions.53–55 These results indicate that two nickel species coexist on the surfaces of the three samples. The Ni2+ peaks of NiO and 0.5P@NiO are more intense than that of 1.0P@NiO. It is interesting to note that the origin of the signal corresponding to Ni3+ can be associated with the Ni atoms with pyramidal Ni symmetries.25,56–58 In same time this peak can be attributed to the Ni2+ species59 or to lattice distortions induced by the presence of Ni2+ vacancies,60,61 or due to Ni2+−OH species.53 However, the controversies remain about the attribution of this peak.62–64 For all the samples, a shake-up satellite peak that is ca. 9–10 eV higher in energy than the main peak is observed at around 863.0 eV. This peak due of multielectron excitation is characteristic of Ni2+ ions in a network of Ni(OH)2,65,66 and its shape (distribution of final molecular states) depends on the P loading, indicating different types of surface interactions. It is interesting to note that the Ni3+ content is higher in the phosphate samples, compared to bare NiO, and increases with P content.
NiO | 0.5P@NiO | 1.0P@NiO | ||
---|---|---|---|---|
B. E. (eV) | B. E. (eV) | B. E. (eV) | ||
Ni 2p3/2 | Ni2+ | 853.2 (80%) | 853.6 (54%) | 853.6 (23%) |
Ni3+ | 854.8 (20%) | 855.5 (46%) | 855.6 (77%) | |
P 2p3/2 | (PO4)3−/(P2O7)4− | — | 133.2 | 133.2 |
O 1s | NiO | 528.8 (74%) | 529.0 (41%) | 529.0 (33%) |
Ni2O3 | 530.6 (26%) | 530.8 (52%) | 531.0 (59%) | |
H2O | — | 532.7 (7%) | 532.7 (8%) | |
C 1s | C–C/C–H | 284.6 (70%) | 284.6 (47%) | 284.6 (59%) |
C–O | — | 286.1 (37%) | 286.8 (24%) | |
COOH/carbonate | 288.1 (30%) | 289.0 (16%) | 289.5 (17%) |
The characteristic O 1s XPS spectra of the catalysts are shown in Fig. 5.
For all the samples, the NiO O 1s spectrum exhibits two peaks, an intense peak at around 529 eV and a weak peak at around 530 eV (Table 2). The lower binding energy, is attributed to the O2− lattice oxygen bounded to Ni2+ in NiO particles.62,67,68 The higher binding energy is assigned to O2− lattice oxygen bounded to Ni3+ but can be ascribed to oxygen from hydroxyl group bounded to nickel or phosphorous62,69 or oxygen from carbonates as observed in the C 1s XPS spectra at around 288 eV. The intensity of the oxygen bounded to Ni2+ peak decreases, and the intensity of the oxygen bounded to Ni3+ peak increases with increasing P content. For the samples containing P, a small peak corresponding to adsorbed water molecules appears at ca. 532.7 eV.
The P 2p XPS spectra are presented in Fig. 6. A P 2p peak is observed for the two phosphated catalysts, providing evidence that they contain surface P. The P 2p peak intensity increases with the P loading. For the two phosphated catalysts, the main P 2p binding energy is 133.2 eV. This peak is attributed to phosphate/pyrophosphate groups, revealing the phosphorus binding state.70
The XPS analysis of the catalysts also provides deeper insight into the type of carbon deposited on the surface. The C 1s core-level spectra of the calcined catalysts are shown in Fig. 7. The main C 1s peaks were deconvoluted into two subpeaks for the NiO catalyst (284.6 and 288.1 eV) and three subpeaks for the 0.5P@NiO (284.6, 286.1, 289.0 eV) and 1P@NiO (284.6, 286.8, 289.5 eV) catalysts to reveal the carbon chemical states on the catalyst surfaces. For all the catalysts, the main C 1s peak is centered at 284.6 eV and can be attributed to graphitized sp2 carbon or adventitious carbon.70 The C 1s peak at 284.6 eV can also be attributed to aliphatic C–H species. The 286.1 and 286.8 eV BEs are assigned to carbon atoms bound to phosphate groups,71 although these peaks can also be attributed to the C 1s BEs of organic species.72 The C 1s peaks at 288.1, 289 and 289.5 eV can be assigned to C–O bonds,73i.e., these peaks are associated with the presence of carbonate groups on the catalyst surfaces. However, the concentration of these species is lower than those of other species.
Moreover, taking into consideration that before each activity test the reactor was heated to the desired temperature in the reaction mixture flow and the system was allowed to equilibrate for ca. 1 h before the first product analysis was performed, these C-containing surface contaminants are obviously removed from the catalyst surface and, therefore, they have no influence on the catalytic performances.
![]() | ||
Fig. 8 Ethane conversion and ethylene selectivity vs. reaction temperature in ethane ODH over bare NiO and phosphated NiO catalysts. |
For all the catalysts, the ethane conversion increases with increasing reaction temperature. At the same time, the ethylene selectivities of the 1.0P@NiO and 0.5P@NiO catalysts decrease to the benefit of carbon oxide selectivities. In contrast, the opposite trends in the selectivities are observed with increasing reaction temperature for the NiO and 0.05P@NiO catalysts. The increase in the ethylene selectivity with increasing reaction temperature was previously observed for bulk NiO (ref. 3, 4, 28) and high surface area MgO-supported NiO catalysts32 and might be due to the higher ethylene formation rate compared to its oxidation rate4,32 on these catalysts. The similar behavior of bare NiO and 0.05P@NiO catalysts is obviously due to the low surface coverage with phosphate groups of the latter (Table 1), 96% of its surface being that of NiO. On the other hand, increasing the phosphorus content in the NiO catalyst leads to a decrease in its catalytic activity both in terms of conversion and intrinsic ethane transformation rate (Table 2). Moreover, the bare NiO and 0.05P@NiO catalysts are active from 300 °C, but the temperature at which the reaction proceeds over the phosphated NiO catalysts increases with increasing P content. At the same time, the ethylene selectivity increases, whereas the total oxidation selectivity decreases when the phosphorus content in the NiO catalyst is increased up to 3.0 wt%. Above this P content, the selectivities reach a plateau. Thus, for the 0.5P@NiO and 1.0P@NiO catalysts, the ethylene selectivity is nearly identical over the entire reaction temperature range studied and is much higher than that of pure NiO. These results clearly suggest that phosphorus lowers the surface density of non-selective active sites on the NiO catalysts.
Notably, over pure Ni2P2O7 the reaction proceeds at temperatures higher than 550 °C (Table S1†) with only very low conversion levels. This clearly suggests that surface phosphate and pyrophosphate species in the phosphated NiO catalysts are inactive in the low-temperature ethane ODH, their role being indeed to diminish the density of non-selective active sites.
According to these catalytic data, most of non-selective active sites are eliminated from the catalyst surface at a coverage with phosphate groups of ca. 35% corresponding to 0.5P@NiO catalyst. Further increasing of surface coverage to 70% for 1.0P@NiO catalyst leads to the formation of pyrophosphate groups, in line with Raman data, and probably decreases the area of surface NiO domains evidenced by TEM, with, therefore, a decrease of the catalytic activity. It is worth noting that the formation of these surface NiO domains by adding P to NiO and by increasing its content is similar to the catalytic site isolation responsible for lower catalytic activity with concomitant increased selectivity.74
The apparent activation energies for ethane transformation over the phosphated NiO catalysts were calculated based on the Arrhenius equation using conversions lower than ca. 10%. For NiO, the linear part of the Arrhenius plot in Fig. S3† was considered to avoid diffusion limitations. The calculated activation energies are listed in Table 3. The apparent activation energy for ethane conversion over the NiO catalysts increases with increasing phosphorus content, indicating that the catalytic sites are less reactive in the presence of phosphorus.
Catalyst | Reaction temperature (°C) | Intrinsic rate (108 mol m−2 s−1) | Activation energy (kJ mol−1) |
---|---|---|---|
NiO | 350 | 9.1 | 72 |
400 | 14.6 | ||
0.05P@NiO | 350 | 2.2 | 100 |
400 | 6.5 | ||
0.5P@NiO | 350 | 0.9 | 110 |
400 | 3.2 | ||
1.0P@NiO | 350 | 0.4 | 122 |
400 | 2.5 |
The effects of the conversion on the ODH selectivities of the 0.5P@NiO and 1.0P@NiO catalysts, the most selective in the series, were investigated by varying the W/F ratio from 0.18 to 1.09 g s cm−3. The reactions were performed at 400 °C using an oxygen-to-ethane molar ratio of 1, and the results are shown in Fig. 9. For both catalysts, the ODH selectivity decreases with increasing conversion. This effect is more pronounced for the 0.5P@NiO catalyst; thus, at conversions below ca. 20%, it is slightly more selective than the 1.0P@NiO catalyst, whereas at higher conversions, it becomes less selective than 1.0P@NiO. Extrapolation to zero conversion gives ODH selectivities of ca. 78 and 72% for the 0.5P@NiO and 1.0P@NiO catalysts, respectively, indicating that the carbon dioxide selectivities are non-zero. This result suggests that in addition to ethylene, carbon dioxide is a primary product that forms via parallel ethane combustion reactions over both phosphated NiO catalysts. This means that the non-selective active sites still exist in the surface NiO domains responsible for the catalytic activity of phosphated catalysts.
![]() | ||
Fig. 9 Effect of ethane conversion on the ODH selectivity in the oxidative dehydrogenation of ethane over 0.5P@NiO and 1.0P@NiO catalysts at 400 °C (oxygen-to-ethane molar ratio = 1). |
The effect of the oxygen-to-ethane molar ratio on ethane oxidative dehydrogenation over the 0.5P@NiO catalyst was investigated at 400 °C and a W/F ratio of 0.54 g s cm−3, and the results are presented in Fig. 10. The ethane conversion increases from 8.6 to 17.2% when the oxygen-to-ethane molar ratio is increased from 0.5 to 3. At the same time, the ethylene selectivity decreases from 77.8 to 63.3% as the carbon dioxide selectivity increases, which is typical for ODH reactions. These results can be explained by an increase in the available oxygen when the oxygen-to-ethane molar ratio is increased.
![]() | ||
Fig. 10 Effect of oxygen-to-ethane molar ratio on the oxidative dehydrogenation of ethane over 0.5P@NiO catalyst at 400 °C (W/F = 0.54 g s cm−3). |
To evaluate the stability of the phosphated catalysts, the 0.5P@NiO system was monitored during ethane ODH at 400 °C with an oxygen-to-ethane molar ratio of 1 and W/F ratio of 0.54 g s cm−3 for ca. 42 h on stream. As shown by the evolution of the conversion and ODH selectivity in Fig. 11, the 0.5P@NiO catalytic performance is maintained under the reaction conditions studied for 42 h on stream.
![]() | ||
Fig. 11 Catalytic performance of 0.5P@NiO system within ca. 42 h of on-stream reaction at 400 °C, oxygen-to-ethane molar ratio = 1 and W/F of 0.54 g s cm−3. |
![]() | (3) |
![]() | ||
Fig. 12 Arrhenius plots for the electrical conductivity σ of NiO and phosphated NiO catalysts under air in the temperature range from 290 to 440 °C (σ in ohm−1 cm−1). |
The data in Fig. 12 also show that in the reaction temperature range studied, the electrical conductivity decreases with increasing phosphorus content as follows: NiO > 0.05P@NiO > 0.5P@NiO > 1.0P@NiO. Therefore, according to eqn (2), the charge carrier concentration and/or mobility decrease with increasing phosphorus content. As shown by the plot of the electrical conductivity at 400 °C as a function of the P content in Fig. 13, the electrical conductivities of NiO and 0.05P@NiO differ markedly. Notably, the intrinsic ethane conversion rate at 400 °C as a function of the P content follows the same trend (Fig. 13), clearly suggesting that the charge carriers are involved in the ethane conversion.
![]() | ||
Fig. 13 Plots of the electrical conductivity and the intrinsic rate of ethane conversion measured at 400 °C as a function of the P content in the solid. |
The Ec values listed in Table 4 were calculated from the slopes of the semi-log plots in Fig. 12. The activation energy of conduction increases with increasing phosphorus content as follows: NiO < 0.05P@NiO < 0.5P@NiO < 1.0P@NiO.
The log–log plots of σ as a function of the oxygen pressure at 350 °C are shown in Fig. S4.† All the samples are p-type oxides under oxygen because ∂σ/∂PO2 > 0. It is generally assumed that the electrical conductivity σ of p-type oxides varies as a function of the oxygen partial pressure PO2 and temperature T according to the equation:
![]() | (4) |
To study the redox behavior of the catalysts under conditions closely resembling the catalytic reaction conditions, electrical conductivity measurements were performed sequentially under air, an ethane–air mixture (reaction mixture) and pure ethane at 400 °C, which is within the reaction temperature range. The results are presented in Fig. 14. The solids were heated from room temperature to 400 °C at a rate of 5 °C min−1 in air at atmospheric pressure. After steady state was achieved under air flow, an ethane–air mixture was passed over the samples.
For all the catalysts, the electrical conductivity under the ethane–air flow is lower than that in air, and the difference between these electrical conductivities depends on the P content. Thus, based on the p-type criterion for oxide semiconductors, i.e. ∂σ/∂PO2 > 0 or, assuming that ethane is a reductant, ∂σ/∂PC2H6 < 0, p-type semiconductor behavior is observed in all these systems. When air is subsequently flowed over the samples, the electrical conductivity immediately increases and reaches a plateau at the initial σ value, showing that the reduced solid can be completely reoxidized. After steady state was again reached under air flow, pure ethane was flowed over the samples. Under a pure ethane flow, the electrical conductivity decreases considerably and reaches a plateau when steady state is achieved. This result confirms the p-type character of all the samples in the presence of ethane. Finally, air was again flowed over the samples to verify the reversibility of the observed phenomena. Indeed, the electrical conductivity increases and reaches a plateau at the initial σ value under air, showing that the solids reduced under pure ethane can be completely reoxidized. The observed decrease in the electrical conductivity of the catalysts in the presence of the ethane–air mixture clearly suggests that ethane is transformed by consuming the positive holes in the p-type oxide catalyst. From a chemical viewpoint, a positive hole corresponds to an electron vacancy in the lattice O×O anion valence band, i.e. the “chemical site” of a positive hole is a lattice O˙O anion75,76 according to the reaction:
O×O + h˙⇄O˙O | (5) |
In the initial ethane activation step over the pure NiO and phosphated NiO catalysts, a surface lattice O− species (i.e., O˙O) attacks a C–H bond and cleaves it. This mechanism was previously proposed for other NiO-based catalysts.7,16 The reversible redox processes observed for all the solids under different gas flows are consistent with a Mars-van Krevelen-type mechanism.77 Notably, during reduction under the ethane–air mixture, the absolute value of the slope dσ/dt decreases in the following order: NiO > 0.05P@NiO > 0.5P@NiO > 1.0P@NiO (Fig. 14), indicating that the catalyst reduction rate decreases with increasing phosphorus content. This result is consistent with the observed decrease in the ethane ODH catalytic activity.
The difference between the steady-state electrical conductivities in air (for the fully oxidized solid) and under the reaction mixture (ethane–air mixture) was considered in terms of lg(σ) (denoted Δ[lg(σ)]). The electrical conductivity decreases when the reaction mixture is flowed over the sample, showing that the solid is reduced, and therefore, Δ[lg(σ)] can be considered a measure of the number of lattice oxygen species removed from the solid under the reaction mixture flow relative to that under air flow. As shown in Table 4, Δ[lg(σ)] decreases, and consequently, the number of available oxygen species decreases with increasing phosphorus content. Because the surface lattice O− species are involved in the ethane transformation and are quite active in alkane oxidation, ethane combustion is promoted over oxidative dehydrogenation when a high number of these species is available.75,78 Therefore, the ethylene selectivity increases, and the CO2 selectivity decreases when the phosphorus content in the NiO catalyst is increased. Indeed, at 400 °C, the Δ[lg(σ)] value clearly correlates with the ethylene selectivity as shown in Fig. 15, in which these parameters are plotted as a function of the catalyst phosphorus content.
![]() | ||
Fig. 15 Ethylene selectivity at 400 °C and the number of available oxygen species in the catalyst expressed as Δ[lg(σ)] as a function of the P content in the solid. |
Footnote |
† Electronic supplementary information (ESI) available. See DOI: 10.1039/c6cy00946h |
This journal is © The Royal Society of Chemistry 2016 |