Chuan Qianab,
Jia Sun*ab,
Junliang Yangab and
Yongli Gaoabc
aInstitute of Super-microstructure and Ultrafast Process in Advanced Materials (ISUPAM), School of Physics and Electronics, Central South University, Changsha, Hunan 410083, China. E-mail: jiasun@csu.edu.cn
bHunan Key Laboratory for Super-microstructure and Ultrafast Process, School of Physics and Electronics, Central South University, Changsha, Hunan 410083, China
cDepartment of Physics and Astronomy, University of Rochester, Rochester, NY 14627, USA
First published on 22nd January 2015
Reusable and renewable electronics is an emerging field aimed at the development of environmentally safe, disposable and biocompatible devices. Here, we demonstrate the fabrication of flexible poly(3-hexylthiophene) (P3HT) field-effect transistors (FETs) on cellulose paper with biopolymer chitosan smoothing layers and efficient reusable ion gel gate dielectrics. The high specific capacitance of ion gels led to the formation of an electric-double-layer (EDL) at the channel/dielectric interface that plays a critical role in modulating the currents of the devices. Reasonable electrical characteristics and mechanical flexibility were observed. Transistors with an operating voltage as low as 2 V, a source drain current of up to ∼1 mA, a current on/off ratio of 3–4 orders of magnitude and a large field-effect mobility of ∼0.97 cm2 V−1 s−1 have been obtained. Especially, the laminated ion gels can be in situ peeled off and reused in other FETs and the device performance is not degenerated obviously with repeated use. The unique flexibility of the FETs on paper with reusable ion gel dielectrics manifests their applications as the next generation of throwaway electronics.
By virtue of the abundance, renewable and biodegradable properties of cellulose, paper is an excellent alternative with exceptional technological attributes and commercial perspectives for many substrates available.18 Functional electronic components, including solar cells,19 sensors,20 biomedical devices,21 conductive circuits,22 and FET,23 have recently been produced on paper substrates. However, most of organic electronic devices usually require smooth interfaces, and the large surface roughness and porous structure of paper are intrinsic barriers to hosting electronic devices on this material.23 On the other hand, another crucial issue of the FETs based on paper is the operating voltage, which is of particular importance for distributed or single-use portable applications.24 To be compatible with paper devices, the gate dielectric should not only reproduce the advantageous properties of the paper, e.g., low-cost and flexibility, but should also be deposited near ambient conditions, yet processing a high gate capacitance. The gelation of ionic liquids with polymers is a promising approach for achieving high specific capacitance due to formation of electric-double-layer (EDL), widely used in fabricating flexible FETs.25–27 However, most of ionic liquids used to date are toxic in nature and far away from being “green” electronics.28 Thus, the reusability of ion gels is important for disposable paper devices. A kind of electrolyte-gated FET with in-plane-gate device structure was developed,29,30 which alleviate technical issues arising from complicated electrode alignment and top-gate electrode deposition and is very convenient for device fabrications.31,32
In this article, we report on the demonstration of flexible poly(3-hexylthiophene) (P3HT) FETs fabricated on biodegradable cellulose paper with an in-plane-gate device structure where biocompatible chitosan is used as the smoothening layer and laminated ion gel is used as high capacitance dielectrics. The fabricated FETs were measured in ambient conditions and showed a field-effect mobility of up to 0.97 cm2 V−1 s−1, a current on/off ratio of approach to 104, a narrow voltage range of 2 V, and a mechanical flexibility. Being a direct-lamination method, the ion gel dielectrics can be easily reused in other devices by in situ peeling the films off from FETs. The device performance of the cellulose-paper-based FETs with reused ion gel dielectrics is not degenerated obviously with the times of repeated use. These combined technologies for the fabrication of flexible OFETs on low-cost and environmental-friendly paper hold great promises for portable and disposable electronics.
The microstructures and morphologies of each layer in an OFET impact its electrical properties and hence affect the device's performance. SEM was performed on the cellulose paper with and without chitosan coating, as shown in Fig. 2(a) and (b). In general, the surface of the bare paper is remarkable roughness, with micron-size pores and defects being observed, as seen in Fig. 2(a). Previous studies suggest that a smooth surface is necessary for high performance OFETs mainly due to the formation of high-quality semiconducting films with fewer defect states.34 The relatively smooth morphology shown in Fig. 2(b) suggests that the bare paper was well covered by the chitosan layer after the spin-coating of chitosan. The inset of Fig. 2(b) shows the fracture cross-sectional SEM image of the chitosan coated onto bare paper. Because of the large surface roughness and porosity of the paper, the chitosan was somewhat penetrated into the substrate and the boundary between the chitosan and bare paper is not clear. Fig. 3 shows the AFM morphology and height image (scan area: 1 μm × 1 μm) of the paper substrates with various coating layers. As expected from the observation through SEM, the surface characteristic of the bare paper substrate shown in Fig. 3(a) is very poor. From the line scan of the surface height image, the maximum roughness depth of 25 nm and root mean square roughness (RMS) of 11.3 nm is observed in bare paper. Its rough surface requires the addition of a smooth layer. The AFM image of chitosan coated paper substrate is displayed in Fig. 3(b). Compared to the bare paper, the surface of chitosan is relatively smooth with the RMS of 2.01 nm and the surface height is less than 5 nm. Therefore, the RMS roughness has been considerably reduced after the coating of chitosan. To investigate the microstructure of the P3HT on chitosan/paper, we examined an AFM morphology image of the film. As shown in Fig. 3(c), the P3HT surface is composed of homogeneously distributed nanoaggregates. The height variation and the RMS roughness (2.45 nm) of the spin-coated P3HT film are comparable to the chitosan/paper.
Fig. 3 AFM morphologies and height images of (a) bare paper substrate, (b) chitosan coated onto bare paper and (c) P3HT and chitosan coated onto bare paper. |
We examined the capacitive behavior of the ion gels through impedance spectroscopy measurements on MIM capacitor test structure. The device structure is illustrated in Fig. 4(a). The effective electrode area that was in contact with the electrolyte is about 0.17 cm2. The relationship between capacitance and frequency can be extracted from the electrochemical impedance spectroscopy. Fig. 4(b) shows the specific capacitance as a function of frequency in the range between 1 Hz and 0.1 MHz. The specific gate capacitance is as high as 33 μF cm−2 at 1 Hz. The obtained capacitance value is about 3 orders of magnitude larger than that of a thermal grown 100 nm-thick SiO2 dielectric. The large capacitance of the ion gels is attributed to the polarization of the ionic liquid and the formation of EDLs at the ion gel/Au interfaces. Especially, the specific capacitance is still above 1 μF cm−2 at 10 kHz, which indicates that the ions within the gel are high mobile and can form EDL quickly. The formation of EDLs can provide a strong capacitive coupling effect, which can effectively tune the conductance of channel at very low voltage range.
Fig. 4 (a) The MIM capacitor test structure for impedance spectroscopy measurements. (b) Frequency dependence of the specific capacitance of the ion gels. |
The electrical characteristics of the OFETs with laminated ion gels (P(VDF-HFP):[EMI][TSFA] = 1:4) on paper substrates are presented in Fig. 5. The device shows the expected gate modulation of drain current (Ids) in both the linear and saturation regimes, as shown Fig. 5(a). Owing to high gating efficiency of ion gels as a gate dielectric, high-current output and low-voltage operation can be achieved by the formation of the EDL on the channel of OFETs. Notably, large saturation currents Ids of ∼1 mA is obtained at low gate voltage (Vg) of −2 V and drain voltage (Vds) of −1 V. From the transfer characteristic curve, it can be seen that the OFETs performs as a typical p-channel device with an on/off ratio approach to 104. We have measured tens of FETs and the current on/off ratio is range from 103 to 104. The threshold voltage (Vth) of the device is calculated to be 0.67 V. The subthreshold slope (S), which is defined as the gate voltage that is necessary to alter the Ids by one order of magnitude, is found to be 270 mV per decade. Fig. 5(b) shows the output characteristic curve of the device with Vg varied between 2 V to −2 V and the Vds swept from 0 to −1 V. This curve reveals quite decent current saturation at high Vds and an excellent linear behavior at low Vds indicating good ohmic contacts formed at HT/Au interfaces. The transistor transfer curve in the linear regime and the leakage current Ig–Vg curve are shown in Fig. 5(c) and (d), which were obtained at the same sweep rate of ∼0.2 V s−1. Because of the high ionic conductance of ion gels, the gate leakage currents of these devices are within a range of 10−7 to 10−6 A and changed with the sweep rate.
For the ion gel gated devices, it is necessary to understand the doping mode in the transistor channel. The primary distinction between the electrostatic and electrochemical doping is whether the ions from ion gels mange to penetrate the semiconductor.35 In order to distinguish the doping model of the ion gels gated FETs, X-ray photoemission spectroscopy (XPS) was used to analyze the composition change of the P3HT channel on Si/SiO2 substrate before and after ion gel gating. First, the gate voltage (Vg) of the device was swept from 2 V to −2 V, and then the ion gel was peeled off from the FETs after gating. The sample was washed by deionized water to remove the physical adsorbed ionic liquids. Fig. 6(a) shows the chemical structures of the P3HT and ionic liquid ([EMI][TFSA]). The black and red curves of the Fig. 6(b) are the XPS scans of the as prepared P3HT films and after ion gel gating, respectively. Both survey scans present the S, O and C spectra, which exhibit S2p, S2s, C1s and O1s peaks at around 164 eV, 228 eV, 284 eV and 532 eV. The presents of the O peak is possibly due to the incorporation of oxygen and water molecules in the P3HT layer, which is consistent with the previously published results.36,37 It can be clearly observed from Fig. 6(c) and (d) (both are enlarged spectra) that the F1s (688 eV) and N1s (398 eV) peaks are raised in the P3HT film after ion gel gating, which can be attributed to the [TFSA]− from the ionic liquid penetrate into the semiconductor. Some research groups have also demonstrated the ions doping of the electrolyte-gated FETs.35,38 Therefore, the operating mechanism of our devices is electrochemical doping.
In order to obtain the mobility, the gate capacitance of the ion gels was required. However, the effective capacitance of the ion gel depends on the applied gate voltage and the nature of the interface and penetration of ions into the semiconductor. Hence, the specific capacitance obtained by impedance spectroscopy can not be used for the mobility calculation. According to the previous methods,39,40 the hole mobility in the linear regime was obtained from:
To demonstrate the flexibility of the FETs on paper, the devices were bended with a bending radius of 17 mm (along the channel transport axis) and the electrical characterization was carried out in air during bending. Fig. 7 shows the transfer curves of the FETs without bending, with outward bending and after the outward bending and then inward bending of the substrate. Under outward bending stress the performance of the FETs degrades somewhat. The Ids (Vg = −2 V and Vds = −1 V) is decrease from 2.1 mA to 0.68 mA. After the outward bending and then inward bending of the FETs, the Ids is slightly changed. In general, outward bending induces tensile strain to a device, which can alter the Ids of the FETs.44 The off-current and the leakage current through the ion gels remain the same. In addition, the bending induced any changes or damage to ion gels was not observed. These results suggest that the lamination of ion gels is suitable for the fabrication of flexible FETs. We have also compared the device performance of the ion gel gated P3HT in ambient and in vaccum. Compared with the device measured in air ambient, the device performance (data not shown) of the FETs measured in vaccum is greatly improved. It indicates that the oxygen and water absorption on the device would influence its electrical properties and degrade the electrical performance. Thus further work on device encapsulation should be done for practical applications.
Fig. 7 Transfer characteristic curves of an OFET on paper without bending, with outward bending and after the outward bending and then inward bending of the substrate. |
Because of the solubility of ionic liquids in water and toxicity of ionic liquids to aquatic organisms, the reusability of the ion gels should be considered for the environmental friendly electronic applications.28 Efficient reuse of the ion gel gated OFET on cellulose paper is presented in Fig. 8(a). The major advantage of the film-transfer lamination procedure is that the ion gels can be delaminated by in situ peeling the films off from OFETs and easy to be reused in other device. Fig. 8(b) and (c) shows the current on/off ratio and Vth values of four OFETs on paper substrates gated by reused ion gels with different concentrations. The black lines indicate average values. All of these devices can be switched between “on” and “off” by the reused ion gels. The current on/off ratio and Vth values of all the devices gated with the reused ion gels is not degenerated obviously with the times of repeated use, which indicates that the ion gels peeled off by tweezers can be reused in OFETs. After peeling off ion gels, the paper based devices can be discarded with daily paper waste. We also performed burning test of the paper based devices after the delamination of ion gels. Paper based OFETs can be burned out by fire within several seconds. The main residua are Au and ash and the reuse of Au can be performed by recovery technologies for the secondary supply of Au.45 A small content of sulfur in P3HT may have slight negative impact on our environment, future works will be focused on the development of truly “green” electronics by using biocompatible semiconductors, such as, ZnO, biodegradable organic materials and carbon-based semiconductors.
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