Janardan Dagar*a,
Priyanka Tyagiab,
Razi Ahmada,
Rashmi Singhc,
O. P. Sinhac,
C. K. Sumana and
Ritu Srivastava*a
aCSIR-Network of institute for solar energy (NISE), Physics of Energy Harvesting Division, CSIR-National Physical Laboratory, Dr K.S.Krishnan Road, New Delhi-110012, India. E-mail: ritu@mail.nplindia.org; j.dagarcct@gmail.com; Fax: +91-11-45609310; Tel: +91-11-45608644
bCenter for Applied Research in Electronics, Indian Institute of Technology Delhi, New Delhi-110016, India
cAmity Institutte of Nanotechnology, Amity University, Noida, U.P., India
First published on 15th December 2014
The current work demonstrates efficient utilization of 2D-MoO3 nano-flakes as a hole injection layer (HIL) in organic light emitting diodes (OLEDs). Nano-flakes are synthesized using an organic solvent-assisted grinding and sonication method of liquid exfoliation for MoO3, and 8–16 nm thick flakes are obtained. The effect of solar illumination on the hole injection properties of these nano-flakes is then studied by exposing the nano-flakes for 0, 15, 30, 45, 60 and 120 min and using them as HIL in green OLED. The device results are then compared with the OLED having bulk MoO3 as HIL. OLEDs with nano-flakes as the HIL have shown better performance than the OLED with bulk MoO3 as the HIL due to the better semiconducting properties in the nano-flake phase. The luminous intensity is increased by increasing the duration of irradiation and was found to be optimum in case of nano-flakes irradiated for 30 or 45 min and then started to decrease with the increase of duration of irradiation. The current density in the OLEDs with nano-flakes as the HIL shows a switching from high resistance to low resistance; however, the sequential pattern of switching voltage was missing with the duration of irradiation. The current density also decreased for nano-flakes with 60 and 120 min of irradiation. Transition from the semiconducting to metal nature of nano-flakes by solar irradiation is suggested to be the reason behind this decrease in current density and luminous intensity with a longer duration of illumination.
MoO3 2D nano-flakes are found to be of particular interest due to their potential applications. MoO3 nano-flakes have been used for hydrogen gas (H2) sensing, photoluminescence and field emission.24–26 Recently, Alsaif et al.27 demonstrated tunable plasmon resonances from 2D MoO3 nano-flakes. These reports have shown the potential of MoO3 nano-flakes; however, their application in devices is required to further prove their potential. Bulk MoO3 has been successfully used in organic electronic devices such as organic light emitting diodes (OLEDs) and organic photovoltaics as a hole injection and extraction layer, where the semiconducting properties of MoO3 has improved the efficiencies of these devices significantly.28–34 Moving from bulk to 2D nano-flakes is expected to improve the crystalline structure of MoO3, which thereby is expected to improve the semiconducting properties. This has motivated us to utilize the 2D MoO3 nano-flakes as the hole injection layer (HIL) in OLEDs.
Several methods for the synthesis and fabrication of 2D MoO3 nano-flakes have been reported in recent years. The most successful methods are the modified hot plate method,25 the plasma assisted paste sublimation process,35 the organic solvent assisted grinding and sonication method,26,27 etc. Here, we adapted the organic solvent-assisted grinding and sonication method of liquid exfoliation to bulk MoO3 to obtain 2D nano-flakes. Alsaif et al.27 observed that the controlled solar illumination of a 2D MoO3 nano-flake suspension alters its properties drastically, according to characterizations by Raman, X-ray diffraction, and X-ray photoelectron spectroscopy (XPS). They observed that the solar illumination of these nano-flakes decreases the semiconducting properties and induces metallic properties as the duration of exposure is increased. Here, to observe the effect of solar illumination on the properties of 2D MoO3 nano-flakes, OLEDs with nano-flakes as the HIL exposed for different durations have been fabricated and their effects on device characteristics are discussed.
2D-MoO3 nano-flakes were implemented as the HIL in OLEDs. Green OLEDs were fabricated with MoO3 nano-flakes prepared using different irradiation times (tirr). Devices were designated as device 1, 2, 3, 4, 5 and 6 for tirr = 0, 15, 30, 45, 60 and 120 min, respectively, and for comparison, a device with bulk MoO3 as the injection layer was also prepared. Fig. 2 shows the images of the biased OLEDs without HIL, reference device, and devices 1–6. All of the devices were found to be bright and efficient. The luminous intensity of the devices at a current density of 1000 A m−2 is also mentioned in the figure. It can be seen that the devices with nano-flakes exhibit superior luminous intensity than the device without a HIL and the device with bulk MoO3 as the HIL. The EL spectrum of OLEDs was found to be unaffected by the use of nano-flakes as the HIL (Fig. S3†).38
Fig. 3 depicts the V–L characteristics for these devices. The device with the bulk MoO3 interface layer and Device 1 have nearly same values of luminous intensity over the entire voltage range. This indicates that the device with 2D-MoO3 nano-flakes has the same effect on the luminescence as bulk MoO3. As the 2D-MoO3 nano-flakes were irradiated and used in device 2, the luminous intensity has increased significantly. The increase in luminescence is nearly 1.3–1.4 times that of device 1. Further, device 3 with 2D-MoO3 nano-flakes with tirr = 30 min as the HIL has a higher luminous intensity in comparison to device 2, and the increase in luminous intensity is about 1.6–1.7 times that for device 1 over the entire region of voltage. The luminous intensity is then saturated with 2D-MoO3 nano-flakes with tirr = 45 min for device 4. 2D-MoO3 nano-flakes with increased tirr to 60 and 120 min led to a decrease in luminous intensity in devices 5 and 6 and the luminous intensity became almost equal to that of the device with a bulk MoO3 layer. These results indicate that the device characteristics with 2D-MoO3 nano-flakes as the interface layer strongly depend on the duration of irradiation.
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Fig. 3 Luminescence–voltage characteristics for OLEDs with 2D-MoO3 nano-flakes as the hole injection layer with different durations of irradiation. Data for OLED with bulk MoO3 are also included. |
For the complete analysis of device characteristics, J–V characteristics were also measured for these devices and are depicted in Fig. 4. Unlike the L–V characteristics, the device with bulk MoO3 layer possesses a higher current density in comparison to the other devices. Also, as the bulk MoO3 is replaced by the 2D-MoO3 nano-flakes without irradiation, the current density is decreased by almost one order of magnitude in the high voltage region (V > 15 V). For V < 11 V, the current density is almost equal to the current density of the device with bulk MoO3. This indicates that the total resistance of the device is lower in the low voltage region and increased in the high voltage region.
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Fig. 4 Current density–voltage characteristics for OLEDs with 2D-MoO3 nano-flakes as the hole injection layer with different durations of irradiation. Data for OLED with bulk MoO3 are also included. |
One interesting fact to be noted is that this increase in resistance has no effect on the luminous intensity, as can be seen from Fig. 3. A similar pattern has also been observed in device 2, where the total resistance of the device switched from a high value to a low value after 9 V. Similar to that for device 1, this switching has not affected the luminous intensity of the device. Device 2 has a higher ratio of high resistance to low resistance values. As the tirr is increased to 30 and 45 min in devices 3 and 4, this switching from the high resistance to low resistance region disappears, and also the current density values are highest for these two devices for voltages higher than 15 V. Further increases in the tirr in devices 5 and 6 decreased the current density significantly. It is evident from the luminous intensity data that even the total device resistance varies among devices 1–6, and all the devices have similar or better luminous intensities in comparison to the reference device with bulk MoO3 as the interface layer. This strongly suggests the improved hole injection properties of nano-flakes in comparison to bulk MoO3.
Fig. 5 depicts the J–L characteristics for these devices in order to provide a clearer picture of the device results. It is evident from the figure that all devices with 2D-MoO3 nano-flakes have a higher ratio of luminous intensity–current density in comparison to the device with bulk MoO3 interface layer. The slope of J–L characteristics represent the current efficiency of the device, and it can be seen from the figure that it has increased in the case of device 1 in comparison to the reference device. However, the efficiency started to decrease in the high current density region, where the luminous intensity is almost invariant with the increase in voltage. Device 2 possesses a higher efficiency in comparison to device 1 in the low current density region, while it follows the same pattern in the high voltage region. Devices 3 and 4 have a slightly lower efficiency in comparison to devices 1 and 2; however, the efficiency remains invariant in these devices with changes in current density. Devices 5 and 6 have shown relatively lower efficiency in comparison to devices 1–4 in the whole current density region. The highest efficiency has been achieved in the cases of device s1, 2, 3 and 4. Combining the results for the V–L, J–V and J–L characteristics, it can be concluded that devices with 2D-MoO3 nano-flakes show superior performance in comparison to the device with bulk MoO3, and the device efficiency is dependent on the irradiation time. Device 4 can be considered optimum in terms of current density and luminous intensity.
For further quantification of the device performance, the current efficiency is plotted as a function of voltage in Fig. 6. It can be seen from the figure that devices with nano-flakes exhibit better performance than the device with bulk MoO3 as the HIL. At 15 V, the current efficiency has increased with nano-flakes in comparison to the bulk MoO3, and it further increases with the duration of irradiation of up to 45 min when it starts to decrease. The current efficiency is highest for the 45 min duration of irradiation.
These observations can be explained on the basis of the reported transition of 2D-MoO3 nano-flakes from semiconductor to metal phase upon increasing the duration of irradiation.27 The starting material in the preparation of nano-flakes is α-MoO3, which is an n-type semiconductor and thus acts as an efficient HIL at the ITO/HTL interface. 2D-MoO3 nano-flakes possess a more crystalline form of α-MoO3 in comparison to bulk MoO3.25,27 Therefore, it serves as a better HIL in comparison to bulk MoO3. As the chemically synthesized nano-flakes are irradiated, the injection properties increase, which is indicative of the better semiconductor behavior of α-MoO3. To confirm this, we have measured the Raman spectra of 2D-MoO3 nano-flakes without irradiation and with tirr = 15 min. Fig. 7 shows the Raman spectra for these nano-flakes coated on Si substrates. Raman peaks of Si have been filtered in this figure for better observation. It can be seen from the figure that Raman peaks have higher intensities (at 304, 427, 617 and 671 cm−1) for irradiated nano-flakes. Fig. 7 also shows the Raman spectra of MoO3 nano-flakes with tirr = 120 min and clearly shows that all the peak intensities are reduced significantly in this film. This may be the reason behind the decrease in efficiency for devices 5 and 6, for which increased irradiation reduced the semiconducting properties of nano-flakes. It has been observed by Alsaif et al.26 that the irradiation of α-MoO3 causes formation of the Mo5+ oxidation state by a possible reduction of MoO3 to Mo4O11. Mo5+ has a lower binding energy in comparison Mo6+ (formed in case of MoO3) and therefore represents the metallic state. It was also been observed by the authors by X-ray photoelectron spectroscopy (XPS) that the intensity of Mo5+ increases and that of Mo6+ decreases with an increase in the duration of irradiation. The metallic state of 2D-MoO3 nano-flakes will therefore act as charge trapping center at the ITO/HTL interface, similar to the case reported for gold nano-particles used in polymer OLEDs.36,37 This trapping and de-trapping of charge carrier may be the reason for switching from low to high resistance regions in devices with nano-flakes. However, the switching has not been found to follow any specific pattern in our devices, which could be due to the low coverage of 2D-MoO3 nano-flakes.
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Fig. 7 Raman spectra for 2D-MoO3 nano-flakes irradiated for 0, 15 and 120 min duration and deposited on Si substrates. For clear observation, the peak due to Si is filtered. |
It has also been observed by Alsaif et al.27 that upon irradiation, MoO3 nano-flakes start to possess localized surface plasmon resonance (LSPR) identified as an absorption peak in near infra-red (NIR) region. This peak was found to be dependent on the duration of irradiation. Therefore, the UV-Vis spectra were measured for the 2D MoO3 nano-flakes with different tirr in solution form as depicted in Fig. 8. The inset of this figure shows the magnified view of the NIR region (the region of interest). It is evident from this figure that for the 60 and 120 min durations of exposure, the 2D MoO3 nano-flakes start to show the LSPR peaks in the NIR region. This supports our device results in which the current density decreases for the 2D MoO3 nano-flakes having a tirr of 60 and 120 min. However, our UV-Vis spectra were found to be a little different from those observed by Alsaif et al.27 In their results, they started to see LSPR with 5 min exposure of nano-flakes. The reason behind this discrepancy may be the different experimental conditions and different size of nano-flakes.
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Fig. 8 UV-Vis spectra recorded for 2D MoO3 nano-flakes irradiated for 0, 15, 30, 45, 60 and 120 min. Inset shows the magnified view of the NIR region. |
Further, we have also measured the work function of 2D-MoO3 nano-flakes (tirr = 120 min) deposited on ITO coated glass substrates by surface Kelvin probe microscopy using a gold tip, and the observed signals are shown in Fig. S2(a) and (b).†38 The work function has decreased upon deposition of nano-flakes with tirr = 120 min, which further explains the device results and justifies the decrease in current in the case of device 6. Generally, semiconducting MoO3 increased the work function of ITO; however, for higher irradiation times, MoO3 nano-flakes have acquired a metallic state, which could lead to a reduction of work function because the metallic form of Mo has lower value of surface potential in comparison to ITO. The decrease in work function was found to be nearly 160 MeV, which resulted in a higher interface resistance for nano-flakes with a higher duration of irradiation. When nano-flakes are used in place of bulk MoO3, the current efficiency of the device is increased from 0.6 to 1.22 Cd A−1 at 15 V, which is expected due to the improved semiconducting nature in the nano-phase. As the irradiated nano-flakes are used, the current efficiency is further increased to 2.36, 3.05 and 4.3 Cd A−1 for 15, 30 and 45 min of irradiation, respectively. The increasing pattern of current efficiency with duration of irradiation is a signature of the improved semiconducting nature of nano-flakes with irradiation as already discussed with the help of Raman spectra. A further increase in the irradiation duration to 60 and 120 min transforms the nano-flakes into metallic form as depicted from the LSPR peaks observed in Fig. 8. The metallic nature of nano-flakes reduces the work function of ITO as measured by Kelvin probe and therefore deteriorates the injection properties. This leads to a decrease in current efficiency to 3.42 and 2 Cd A−1 for 60 and 120 min irradiated nano-flakes, respectively. Therefore, the effect of transition from semiconducting to metallic nature of nano-flakes is clearly observed in the devices.
In conclusion, the current work demonstrates the use of 2D MoO3 nano-flakes as an efficient HIL for OLEDs. Nano-flakes irradiated for 0, 15, 30, 45, 60 and 120 min with solar power were used for this study, and the device results with nano-flakes as the HIL were compared with that with bulk MoO3 as the HIL. OLEDs with nano-flakes irradiated for 0, 15, 30 and 45 min were found to be superior in terms of current density and luminescence, and those with nano-flakes irradiated for 60 and 120 min were inferior. Nano-flakes possess better semiconducting properties than bulk MoO3, which is demonstrated also by the Raman spectra of irradiated nano-flakes. It has been observed that the semiconducting properties of nano-flakes is increased by irradiation up to 45 min, and then nano-flakes start to possess more metallic properties. This has also been identified by a LSPR peak, which started to appear for nano-flakes with 60 min irradiation time and became stronger when nano-flakes were irradiated for 120 min. The work function of ITO modified by nano-flakes irradiated for 120 min was measured using Kelvin probe microscopy, and it was found to be lower by 0.16 eV in comparison to that of bare ITO. This decrease in work function by MoO3 nano-flakes irradiated for 60 and 120 min leads to a decrease in current density.
Footnote |
† Electronic supplementary information (ESI) available. See DOI: 10.1039/c4ra12430h |
This journal is © The Royal Society of Chemistry 2015 |