Structural and compositional properties of Er-doped silicon nanoclusters/oxides for multilayered photonic devices studied by STEM-EELS†
Abstract
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* Corresponding authors
a
MIND-IN2UB, Departament d'Electrònica, Universitat de Barcelona, c/Martí i Franqués 1, 08028 Barcelona, Spain
E-mail:
aeljarrat@el.ub.edu
b Laboratorio de Microscopías Avanzadas (LMA) – Instituto de Nanociencia de Aragón (INA) and Departamento de Física de la Materia Condensada, Universidad de Zaragoza, 50018 Zaragoza, Spain
c Fundación ARAID, 50018 Zaragoza, Spain
d TEM-MAT, Centres Científics i Tecnològics (CCiT), Universitat de Barcelona, Solís i Sabaría 1, Barcelona, Spain
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A. Eljarrat, L. López-Conesa, J. M. Rebled, Y. Berencén, J. M. Ramírez, B. Garrido, C. Magén, S. Estradé and F. Peiró, Nanoscale, 2013, 5, 9963 DOI: 10.1039/C3NR02754F
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