Understanding crystallization processes of NiO/Ce0.9Gd0.1O2−δ sol–gel processed thin films for the design of efficient electrodes: an in situ thermal ellipsometry analysis†
Abstract
We describe a simple, non-destructive method, in situ thermal
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* Corresponding authors
a
Laboratoire de Chimie de La Matière Condensée de Paris, UMR UPMC-CNRS-Collège de France 7574, Université Pierre et Marie Curie, Paris 6, Collège de France, 11 Place Marcellin Berthelot, Paris, France
E-mail:
christel.laberty@upmc.fr
Fax: +33 1 44 27 15 04
Tel: +33 1 44 27 15 28
b
Laboratoire d'Electrochimie, Chimie des Interfaces et Modélisation pour l'Energie, UMR ENSCP-CNRS 7575, Chimie Paristech, 11 Rue Pierre et Marie Curie, 75231 Paris, France
E-mail:
armelle-ringuede@chimie-paristech.fr
Fax: +33 1 44 27 67 50
Tel: +33 1 55 42 12 35
We describe a simple, non-destructive method, in situ thermal
G. Müller, C. Boissière, D. Grosso, A. Ringuedé, C. Laberty-Robert and C. Sanchez, J. Mater. Chem., 2012, 22, 9368 DOI: 10.1039/C2JM16550C
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