Issue 7, 2012
From the journal:

Journal of Analytical Atomic Spectrometry

SIMS imaging of the nanoworld: applications in science and technology

Mathias Senonera  and  Wolfgang E. S. Unger*a  

* Corresponding authors

a BAM Bundesanstalt für Materialforschung und –prüfung, 12200 Berlin, Germany
E-mail: wolfgang.unger@bam.de

Abstract

Secondary Ion Mass Spectrometry (SIMS) enables surface chemical analysis of nano-scaled objects and chemical imaging of nano-scaled details of natural or artificial objects. This review presents the state of the art in nanoscale SIMS analysis. At first a short introduction into recent instrumentation for high resolution SIMS imaging and the limiting factors of lateral resolution is given. The next section covers the chemical analysis of nanoparticles. Recent applications of nanoscale imaging SIMS in geology, cosmochemistry, materials research, cellular biology, ecology and medical research are summarized and illustrated by examples.

Graphical abstract: SIMS imaging of the nanoworld: applications in science and technology

  • This article is part of the themed collection: Nanoanalysis
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Article information

DOI
https://doi.org/10.1039/C2JA30015J
Article type
Critical Review
Submitted
19 Jan 2012
Accepted
01 Jun 2012
First published
01 Jun 2012

J. Anal. At. Spectrom., 2012,27, 1050-1068

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SIMS imaging of the nanoworld: applications in science and technology

M. Senoner and W. E. S. Unger, J. Anal. At. Spectrom., 2012, 27, 1050 DOI: 10.1039/C2JA30015J

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