Probing interfacial mobility profiles via the impact of nanoscopic confinement on the strength of the dynamic glass transition
Abstract
Dielectric measurements of ultrathin
* Corresponding authors
a
Katholieke Universiteit Leuven, Laboratory of Acoustic and Thermal Physics, Department of Physics and Astronomy, Celestijnenlaan 200D, Leuven, Belgium
E-mail:
simone.napolitano@fys.kuleuven.be
Dielectric measurements of ultrathin
C. Rotella, M. Wübbenhorst and S. Napolitano, Soft Matter, 2011, 7, 5260 DOI: 10.1039/C1SM05430A
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