Book review

Principles and Application of Ion Scattering Spectrometry—Surface Chemistry and Structural Analysis

By J. Wayne Rabalais. Pp. 306. New York. John Wiley. 2002. Price: £60.14 (hardcover). ISBN 0471202770

Not another new book on surface science! Not yet another new technique! Yes, and what an excellent technique it is, one that is expertly introduced in this book by an acknowledged leader in the field. Ion scattering at surfaces and by things adsorbed on surfaces can reveal wonderful new insights into the structure of surfaces, the way in which atoms and molecules can be arranged on surfaces, be bound to surfaces and react at surfaces. It is a technique which has rapidly developed over the past ten to fifteen years and in many ways very nicely complements the results that can be obtained from more conventional methods, XPS, UPS, FTIR, LEED, etc. It is therefore timely for a book that will introduce ion scattering spectrometry to the uninitiated, will outline what it can do and how it does it, will critically review its successes and will indicate the potential for future developments.

The first chapters are devoted to a historical introduction and the theory of atomic collisions (for not all the collisions involve ions, despite the name: neutralization will often intervene). Theory is dealt with rapidly and yet thoroughly, a good chapter to refer back to, if you know it already, but not to learn from. By contrast the section on the experimental methods that are used in the production of ion beams and the detection of charged and neutral species is both detailed and informative. It is well illustrated with carefully chosen examples and with clear, well-drawn diagrams. Special attention is given to the subtleties of the time-of-flight (TOF) spectrometer and how it can be used to extract an impressive amount of data. Since the TOF spectrometer is so compact it can be used to view the surface from almost any angle. This enables a detailed structural and chemical analysis of the surface and its overlayers to be made. Subsequent chapters describe how ion scattering can be used to elucidate ‘surface crystallography’ and to build up real images of surfaces. The enthusiasm of the author for his subject comes shining through and brings his clear exposition wonderfully to life. Examples have been chosen with great care so that there is time and space for a few really significant results to be discussed in detail.

The impact of an ion with a surface will not only cause the ion to be deflected, scattered, in a significant way, but its energy will also be imparted to surface and/or adsorbed atoms so that they recoil from the collision. The trajectories and identities of both species can be studied and the results of many experiments involving hydrogen, oxygen and organics on different surfaces, as well as investigations of semiconductor and oxide surfaces, are described in detail. In all cases the results are critically discussed with the advantages and limitations of the technique being described. The final chapters concentrate on more complex collision processes and collisions involving quite low energy species. These sections show that ion-scattering spectrometry has a long way to go before its potential is exhausted. There are references for each chapter but an invaluable bibliography, running to fifty pages or so, is at the end of the book.

This is such a well produced, well written and carefully researched book that no surface science practitioner can afford to be without it. It will prove invaluable for the experienced and the neophyte alike.

D. S. Urch

New York University in London, UK

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